Using the excitation surface plasma waves of Kretschmann configuration to the normal saline measurement
This study is using Optical Frustrated Total Internal Reflection method and Kretschmann configuration to excite surface plasma waves . When the Surface Plasma Wave measurement system to reaction of normal saline, We can find the corresponding point of the surface plasmon resonance and absorption dep...
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| creator | Cheng-Min Lee Chia-Hao Chang Shun-Wen Liu Pei-Wen Chou Yu-Si Jheng Tian-Fu Wu Jyun-Ming Lan Hung-Tze Wu |
| description | This study is using Optical Frustrated Total Internal Reflection method and Kretschmann configuration to excite surface plasma waves . When the Surface Plasma Wave measurement system to reaction of normal saline, We can find the corresponding point of the surface plasmon resonance and absorption depth and bandwidth. |
| doi_str_mv | 10.1109/ICECC.2011.6067634 |
| format | Conference Proceeding |
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When the Surface Plasma Wave measurement system to reaction of normal saline, We can find the corresponding point of the surface plasmon resonance and absorption depth and bandwidth.</description><subject>Kretschmann configuration</subject><subject>Metals</subject><subject>Optical Frustrated Total Internal Reflection method</subject><subject>Optical reflection</subject><subject>Optical surface waves</subject><subject>Plasma waves</subject><subject>Saline</subject><subject>Surface Plasma Waves(SPW)</subject><subject>Surface waves</subject><isbn>1457703203</isbn><isbn>9781457703201</isbn><isbn>9781457703218</isbn><isbn>145770319X</isbn><isbn>1457703211</isbn><isbn>9781457703195</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2011</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo1kM1OwzAQhI0QElDyAnDxC7TYceK1jygqtKISF3qutsm6NUqcKnb5eXsiWuYyGmnmOwxj91LMpBT2cVnNq2qWCylnWmjQqrhgmQUjixJAqFyaS3b7H4S6ZlmMH2KU1jYHuGG7dfRhx9OeOH3XPmHyfeDxODisiR9ajB3yL_ykyHvHXwdKsd53GAKv--D87jicFqn_Y4R-6LDlEVsfiHeEI4k6CumOXTlsI2Vnn7D18_y9WkxXby_L6mk19RLKNNW20KZxSA2q0oI1uYWtHIN2AE4p5YRxhQHdaGkavR3rjayt1PW2MBoKNWEPJ64nos1h8B0OP5vzN-oX92pZXg</recordid><startdate>201109</startdate><enddate>201109</enddate><creator>Cheng-Min Lee</creator><creator>Chia-Hao Chang</creator><creator>Shun-Wen Liu</creator><creator>Pei-Wen Chou</creator><creator>Yu-Si Jheng</creator><creator>Tian-Fu Wu</creator><creator>Jyun-Ming Lan</creator><creator>Hung-Tze Wu</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201109</creationdate><title>Using the excitation surface plasma waves of Kretschmann configuration to the normal saline measurement</title><author>Cheng-Min Lee ; Chia-Hao Chang ; Shun-Wen Liu ; Pei-Wen Chou ; Yu-Si Jheng ; Tian-Fu Wu ; Jyun-Ming Lan ; Hung-Tze Wu</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-69468dfaeda359798297b1da36f77f333f08f4876d618d6b946d1c916cb486743</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Kretschmann configuration</topic><topic>Metals</topic><topic>Optical Frustrated Total Internal Reflection method</topic><topic>Optical reflection</topic><topic>Optical surface waves</topic><topic>Plasma waves</topic><topic>Saline</topic><topic>Surface Plasma Waves(SPW)</topic><topic>Surface waves</topic><toplevel>online_resources</toplevel><creatorcontrib>Cheng-Min Lee</creatorcontrib><creatorcontrib>Chia-Hao Chang</creatorcontrib><creatorcontrib>Shun-Wen Liu</creatorcontrib><creatorcontrib>Pei-Wen Chou</creatorcontrib><creatorcontrib>Yu-Si Jheng</creatorcontrib><creatorcontrib>Tian-Fu Wu</creatorcontrib><creatorcontrib>Jyun-Ming Lan</creatorcontrib><creatorcontrib>Hung-Tze Wu</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Cheng-Min Lee</au><au>Chia-Hao Chang</au><au>Shun-Wen Liu</au><au>Pei-Wen Chou</au><au>Yu-Si Jheng</au><au>Tian-Fu Wu</au><au>Jyun-Ming Lan</au><au>Hung-Tze Wu</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Using the excitation surface plasma waves of Kretschmann configuration to the normal saline measurement</atitle><btitle>2011 International Conference on Electronics, Communications and Control (ICECC)</btitle><stitle>ICECC</stitle><date>2011-09</date><risdate>2011</risdate><spage>4062</spage><epage>4064</epage><pages>4062-4064</pages><isbn>1457703203</isbn><isbn>9781457703201</isbn><eisbn>9781457703218</eisbn><eisbn>145770319X</eisbn><eisbn>1457703211</eisbn><eisbn>9781457703195</eisbn><abstract>This study is using Optical Frustrated Total Internal Reflection method and Kretschmann configuration to excite surface plasma waves . 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| ispartof | 2011 International Conference on Electronics, Communications and Control (ICECC), 2011, p.4062-4064 |
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| language | eng |
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| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Kretschmann configuration Metals Optical Frustrated Total Internal Reflection method Optical reflection Optical surface waves Plasma waves Saline Surface Plasma Waves(SPW) Surface waves |
| title | Using the excitation surface plasma waves of Kretschmann configuration to the normal saline measurement |
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