Aperture size effect on the susceptibility of a PCB inside an enclosure
In this paper susceptibility of a microstrip transmission line as a simple PCB inside an enclosure is studied using the Finite Integral Technique (FIT). Here, the magnitude of transmission coefficient of a two port network model of the system (|S 21 |) is defined as the susceptibility of the PCB. Th...
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| creator | Abadpour, S. Dehkhoda, P. Karami, H. R. Moini, R. |
| description | In this paper susceptibility of a microstrip transmission line as a simple PCB inside an enclosure is studied using the Finite Integral Technique (FIT). Here, the magnitude of transmission coefficient of a two port network model of the system (|S 21 |) is defined as the susceptibility of the PCB. The first port is the input port of a dipole antenna which propagates the interference wave and the second port is connected to a matched transmission line. The effect of different aperture size and numbers on |S 21 | is studied and it is shown that large apertures can even increase the disagreeable effects of the interfering wave on the PCB at resonance bandwidth of the perforated enclosure. To validate the results, measurements are performed inside an anechoic chamber. |
| doi_str_mv | 10.1109/ICEAA.2011.6046437 |
| format | Conference Proceeding |
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To validate the results, measurements are performed inside an anechoic chamber.</description><identifier>ISBN: 1612849768</identifier><identifier>ISBN: 9781612849768</identifier><identifier>EISBN: 9781612849782</identifier><identifier>EISBN: 1612849776</identifier><identifier>EISBN: 1612849784</identifier><identifier>EISBN: 9781612849775</identifier><identifier>DOI: 10.1109/ICEAA.2011.6046437</identifier><language>eng</language><publisher>IEEE</publisher><subject>Anechoic Chamber Measurement ; Apertures ; Bandwidth ; Electromagnetic compatibility ; FIT ; Interference ; PCB Susceptibility ; Resonant frequency ; Shielding enclosure ; Transmission line measurements</subject><ispartof>2011 International Conference on Electromagnetics in Advanced Applications, 2011, p.741-744</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6046437$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,27902,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6046437$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Abadpour, S.</creatorcontrib><creatorcontrib>Dehkhoda, P.</creatorcontrib><creatorcontrib>Karami, H. 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To validate the results, measurements are performed inside an anechoic chamber.</description><subject>Anechoic Chamber Measurement</subject><subject>Apertures</subject><subject>Bandwidth</subject><subject>Electromagnetic compatibility</subject><subject>FIT</subject><subject>Interference</subject><subject>PCB Susceptibility</subject><subject>Resonant frequency</subject><subject>Shielding enclosure</subject><subject>Transmission line measurements</subject><isbn>1612849768</isbn><isbn>9781612849768</isbn><isbn>9781612849782</isbn><isbn>1612849776</isbn><isbn>1612849784</isbn><isbn>9781612849775</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2011</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo1T0FOwzAQNEJIQMkH4OIPJOzawbGPISqlUiU49F5tkrUwCkkUp4fyeiLRnmZ2NDPaEeIRIUME97yt1mWZKUDMDOQm18WVSFxh0aCy-ULUtbi_HMbeiiTGb4DFD8YW9k5sypGn-TixjOGXJXvPzSyHXs5fi3SMDY9zqEMX5pMcvCT5Wb3K0MfQsqRect90Q1ziD-LGUxc5OeNK7N_W--o93X1stlW5S4ODOSVSViPWoLhFpsawBrKN8QWRRodaWZcvz1JOsJh8TaoF8I5dg8Twolfi6b82MPNhnMIPTafDebr-A99eTJU</recordid><startdate>201109</startdate><enddate>201109</enddate><creator>Abadpour, S.</creator><creator>Dehkhoda, P.</creator><creator>Karami, H. 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R.</creatorcontrib><creatorcontrib>Moini, R.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Abadpour, S.</au><au>Dehkhoda, P.</au><au>Karami, H. R.</au><au>Moini, R.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Aperture size effect on the susceptibility of a PCB inside an enclosure</atitle><btitle>2011 International Conference on Electromagnetics in Advanced Applications</btitle><stitle>ICEAA</stitle><date>2011-09</date><risdate>2011</risdate><spage>741</spage><epage>744</epage><pages>741-744</pages><isbn>1612849768</isbn><isbn>9781612849768</isbn><eisbn>9781612849782</eisbn><eisbn>1612849776</eisbn><eisbn>1612849784</eisbn><eisbn>9781612849775</eisbn><abstract>In this paper susceptibility of a microstrip transmission line as a simple PCB inside an enclosure is studied using the Finite Integral Technique (FIT). Here, the magnitude of transmission coefficient of a two port network model of the system (|S 21 |) is defined as the susceptibility of the PCB. The first port is the input port of a dipole antenna which propagates the interference wave and the second port is connected to a matched transmission line. The effect of different aperture size and numbers on |S 21 | is studied and it is shown that large apertures can even increase the disagreeable effects of the interfering wave on the PCB at resonance bandwidth of the perforated enclosure. To validate the results, measurements are performed inside an anechoic chamber.</abstract><pub>IEEE</pub><doi>10.1109/ICEAA.2011.6046437</doi><tpages>4</tpages></addata></record> |
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| language | eng |
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| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Anechoic Chamber Measurement Apertures Bandwidth Electromagnetic compatibility FIT Interference PCB Susceptibility Resonant frequency Shielding enclosure Transmission line measurements |
| title | Aperture size effect on the susceptibility of a PCB inside an enclosure |
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