A sub-ns time-gated CMOS single photon avalanche diode detector for Raman spectroscopy

A time-gated single photon avalanche diode (SPAD) has been designed and fabricated in a standard high voltage 0.35 μm CMOS technology for Raman spectroscopy. The sub-ns time gating window is used to suppress the fluorescence background typical of Raman studies, and also to minimize the dark count ra...

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Hauptverfasser: Nissinen, I., Nissinen, J., Lansman, A., Hallman, L., Kilpela, A., Kostamovaara, J., Kogler, M., Aikio, M., Tenhunen, J.
Format: Tagungsbericht
Sprache:eng ; jpn
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Zusammenfassung:A time-gated single photon avalanche diode (SPAD) has been designed and fabricated in a standard high voltage 0.35 μm CMOS technology for Raman spectroscopy. The sub-ns time gating window is used to suppress the fluorescence background typical of Raman studies, and also to minimize the dark count rate in order to maximize the signal-to-noise ratio of the Raman signal. The proposed time-gating technique is applied for measuring the Raman spectra of olive oil with a gate window of 300 ps, and shows significant fluorescence suppression.
ISSN:1930-8876
DOI:10.1109/ESSDERC.2011.6044156