Analyzing the Impact of Single-Event-Induced Charge Sharing in Complex Circuits
This paper proposes a soft error characterization methodology to analyze multiple faults caused by single-event-induced charge sharing in standard-cell based ASIC designs. Fault injection campaigns have been executed using data provided by placement analysis as well as a pulse width modeling through...
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| Veröffentlicht in: | IEEE transactions on nuclear science 2011-12, Vol.58 (6), p.2768-2775 |
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| container_issue | 6 |
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| container_title | IEEE transactions on nuclear science |
| container_volume | 58 |
| creator | Pagliarini, S. Kastensmidt, F. Entrena, L. Lindoso, A. Millan, E. S. |
| description | This paper proposes a soft error characterization methodology to analyze multiple faults caused by single-event-induced charge sharing in standard-cell based ASIC designs. Fault injection campaigns have been executed using data provided by placement analysis as well as a pulse width modeling through electrical simulation. Experimental results demonstrate that the error rate can be largely overestimated if placement is not considered. |
| doi_str_mv | 10.1109/TNS.2011.2168239 |
| format | Article |
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| language | eng |
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| source | IEEE Electronic Library (IEL) |
| subjects | Application specific integrated circuits Charge Circuit faults Circuits Computer simulation Design engineering Electric charge Error analysis Fault injection Faults Integrated circuit layout Integrated circuit modeling Logic gates Placement single-event-induced charge sharing soft error rate (SER) Soft errors Transient analysis |
| title | Analyzing the Impact of Single-Event-Induced Charge Sharing in Complex Circuits |
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