Analyzing the Impact of Single-Event-Induced Charge Sharing in Complex Circuits

Analyzing the Impact of Single-Event-Induced Charge Sharing in Complex Circuits

This paper proposes a soft error characterization methodology to analyze multiple faults caused by single-event-induced charge sharing in standard-cell based ASIC designs. Fault injection campaigns have been executed using data provided by placement analysis as well as a pulse width modeling through...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on nuclear science 2011-12, Vol.58 (6), p.2768-2775
Hauptverfasser: Pagliarini, S., Kastensmidt, F., Entrena, L., Lindoso, A., Millan, E. S.
Format: Artikel
Sprache:eng
Schlagworte:
Application specific integrated circuits
Charge
Circuit faults
Circuits
Computer simulation
Design engineering
Electric charge
Error analysis
Fault injection
Faults
Integrated circuit layout
Integrated circuit modeling
Logic gates
Placement
single-event-induced charge sharing
soft error rate (SER)
Soft errors
Transient analysis
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:This paper proposes a soft error characterization methodology to analyze multiple faults caused by single-event-induced charge sharing in standard-cell based ASIC designs. Fault injection campaigns have been executed using data provided by placement analysis as well as a pulse width modeling through electrical simulation. Experimental results demonstrate that the error rate can be largely overestimated if placement is not considered.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2011.2168239