Study on t-test method to find linear systematic error
The advantages and shortcomings of three methods to find linear systematic error were analyzed. Malikov criterion is the most common method, but it often produced wrong judgment in application. The invalidation reason of Malikov criterion was analyzed, and then the t-test method was developed to fin...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Tagungsbericht |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 2514 |
|---|---|
| container_issue | |
| container_start_page | 2511 |
| container_title | |
| container_volume | |
| creator | Hairong Zou |
| description | The advantages and shortcomings of three methods to find linear systematic error were analyzed. Malikov criterion is the most common method, but it often produced wrong judgment in application. The invalidation reason of Malikov criterion was analyzed, and then the t-test method was developed to find linear systematic error. The t test method can exactly judge whether there is linear systematic error in measure data list according to the consistency of the anterior and posterior half measure data. |
| doi_str_mv | 10.1109/MEC.2011.6026003 |
| format | Conference Proceeding |
| fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_6026003</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>6026003</ieee_id><sourcerecordid>6026003</sourcerecordid><originalsourceid>FETCH-LOGICAL-i90t-14cdf713826874bff754b0fe298f1a246555aeb8030da8c5a8c51f624251910c3</originalsourceid><addsrcrecordid>eNo9j8FKxDAURSMiqOPsBTf5gdb30iRNllJGRxhx4eyHtHnByLSVJC769yoOXrgc7ubAZewWoUYEe_-y6WoBiLUGoQGaM3aNGoWRrUBz_j_Q6ku2zvkDfqK1tWivmH4rX37h88RLVSgXPlJ5nz0vMw9x8vwYJ3KJ5yUXGl2JA6eU5nTDLoI7ZlqfuGL7x82-21a716fn7mFXRQulQjn40GJjhDat7ENolewhkLAmoBNSK6Uc9QYa8M4M6rcYtJBCoUUYmhW7-9NGIjp8pji6tBxON5tv7hhEsg</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Study on t-test method to find linear systematic error</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Hairong Zou</creator><creatorcontrib>Hairong Zou</creatorcontrib><description>The advantages and shortcomings of three methods to find linear systematic error were analyzed. Malikov criterion is the most common method, but it often produced wrong judgment in application. The invalidation reason of Malikov criterion was analyzed, and then the t-test method was developed to find linear systematic error. The t test method can exactly judge whether there is linear systematic error in measure data list according to the consistency of the anterior and posterior half measure data.</description><identifier>ISBN: 1612847196</identifier><identifier>ISBN: 9781612847191</identifier><identifier>EISBN: 1612847218</identifier><identifier>EISBN: 9781612847214</identifier><identifier>EISBN: 1612847226</identifier><identifier>EISBN: 9781612847221</identifier><identifier>DOI: 10.1109/MEC.2011.6026003</identifier><language>eng</language><publisher>IEEE</publisher><subject>consistency ; Data processing ; Educational institutions ; Equations ; linear systematic error ; Malikov criterion ; Measurement uncertainty ; Presses ; Systematics ; t-test method ; Time measurement</subject><ispartof>2011 International Conference on Mechatronic Science, Electric Engineering and Computer (MEC), 2011, p.2511-2514</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6026003$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6026003$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Hairong Zou</creatorcontrib><title>Study on t-test method to find linear systematic error</title><title>2011 International Conference on Mechatronic Science, Electric Engineering and Computer (MEC)</title><addtitle>MEC</addtitle><description>The advantages and shortcomings of three methods to find linear systematic error were analyzed. Malikov criterion is the most common method, but it often produced wrong judgment in application. The invalidation reason of Malikov criterion was analyzed, and then the t-test method was developed to find linear systematic error. The t test method can exactly judge whether there is linear systematic error in measure data list according to the consistency of the anterior and posterior half measure data.</description><subject>consistency</subject><subject>Data processing</subject><subject>Educational institutions</subject><subject>Equations</subject><subject>linear systematic error</subject><subject>Malikov criterion</subject><subject>Measurement uncertainty</subject><subject>Presses</subject><subject>Systematics</subject><subject>t-test method</subject><subject>Time measurement</subject><isbn>1612847196</isbn><isbn>9781612847191</isbn><isbn>1612847218</isbn><isbn>9781612847214</isbn><isbn>1612847226</isbn><isbn>9781612847221</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2011</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo9j8FKxDAURSMiqOPsBTf5gdb30iRNllJGRxhx4eyHtHnByLSVJC769yoOXrgc7ubAZewWoUYEe_-y6WoBiLUGoQGaM3aNGoWRrUBz_j_Q6ku2zvkDfqK1tWivmH4rX37h88RLVSgXPlJ5nz0vMw9x8vwYJ3KJ5yUXGl2JA6eU5nTDLoI7ZlqfuGL7x82-21a716fn7mFXRQulQjn40GJjhDat7ENolewhkLAmoBNSK6Uc9QYa8M4M6rcYtJBCoUUYmhW7-9NGIjp8pji6tBxON5tv7hhEsg</recordid><startdate>201108</startdate><enddate>201108</enddate><creator>Hairong Zou</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201108</creationdate><title>Study on t-test method to find linear systematic error</title><author>Hairong Zou</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-14cdf713826874bff754b0fe298f1a246555aeb8030da8c5a8c51f624251910c3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2011</creationdate><topic>consistency</topic><topic>Data processing</topic><topic>Educational institutions</topic><topic>Equations</topic><topic>linear systematic error</topic><topic>Malikov criterion</topic><topic>Measurement uncertainty</topic><topic>Presses</topic><topic>Systematics</topic><topic>t-test method</topic><topic>Time measurement</topic><toplevel>online_resources</toplevel><creatorcontrib>Hairong Zou</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Hairong Zou</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Study on t-test method to find linear systematic error</atitle><btitle>2011 International Conference on Mechatronic Science, Electric Engineering and Computer (MEC)</btitle><stitle>MEC</stitle><date>2011-08</date><risdate>2011</risdate><spage>2511</spage><epage>2514</epage><pages>2511-2514</pages><isbn>1612847196</isbn><isbn>9781612847191</isbn><eisbn>1612847218</eisbn><eisbn>9781612847214</eisbn><eisbn>1612847226</eisbn><eisbn>9781612847221</eisbn><abstract>The advantages and shortcomings of three methods to find linear systematic error were analyzed. Malikov criterion is the most common method, but it often produced wrong judgment in application. The invalidation reason of Malikov criterion was analyzed, and then the t-test method was developed to find linear systematic error. The t test method can exactly judge whether there is linear systematic error in measure data list according to the consistency of the anterior and posterior half measure data.</abstract><pub>IEEE</pub><doi>10.1109/MEC.2011.6026003</doi><tpages>4</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISBN: 1612847196 |
| ispartof | 2011 International Conference on Mechatronic Science, Electric Engineering and Computer (MEC), 2011, p.2511-2514 |
| issn | |
| language | eng |
| recordid | cdi_ieee_primary_6026003 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | consistency Data processing Educational institutions Equations linear systematic error Malikov criterion Measurement uncertainty Presses Systematics t-test method Time measurement |
| title | Study on t-test method to find linear systematic error |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T17%3A33%3A12IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Study%20on%20t-test%20method%20to%20find%20linear%20systematic%20error&rft.btitle=2011%20International%20Conference%20on%20Mechatronic%20Science,%20Electric%20Engineering%20and%20Computer%20(MEC)&rft.au=Hairong%20Zou&rft.date=2011-08&rft.spage=2511&rft.epage=2514&rft.pages=2511-2514&rft.isbn=1612847196&rft.isbn_list=9781612847191&rft_id=info:doi/10.1109/MEC.2011.6026003&rft_dat=%3Cieee_6IE%3E6026003%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&rft.eisbn=1612847218&rft.eisbn_list=9781612847214&rft.eisbn_list=1612847226&rft.eisbn_list=9781612847221&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=6026003&rfr_iscdi=true |