Effect of manganese and vanadium valences for the reliability of BaTiO3-based MLCCs
The valences of manganese and vanadium oxides in multi-layer ceramic capacitors (MLCCs), sintered under a reducing atmosphere, were investigated using electron paramagnetic resonance, the insulation resistance degradation was analyzed using impedance spectroscopy in highly accelerated life time test...
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| creator | Natsui, H. Shibahara, T. Kido, O. |
| description | The valences of manganese and vanadium oxides in multi-layer ceramic capacitors (MLCCs), sintered under a reducing atmosphere, were investigated using electron paramagnetic resonance, the insulation resistance degradation was analyzed using impedance spectroscopy in highly accelerated life time tests to clarify the manganese and vanadium influence on both the electrical properties and microstructure of MLCCs. The Mn 2+ was stable in the reducing-atmosphere-sintered MLCCs, and formed a grain boundary. Vanadium mitigated the IR degradation and increased the reliability of the MLCCs. Although V 4+ was detected in the 0.20 and 0.30 mol% vanadium-added MLCCs, the electrical properties were dependant upon the other ions, e.g., V 3+ or V 5+ . |
| doi_str_mv | 10.1109/ISAF.2011.6014101 |
| format | Conference Proceeding |
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The Mn 2+ was stable in the reducing-atmosphere-sintered MLCCs, and formed a grain boundary. Vanadium mitigated the IR degradation and increased the reliability of the MLCCs. 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The Mn 2+ was stable in the reducing-atmosphere-sintered MLCCs, and formed a grain boundary. Vanadium mitigated the IR degradation and increased the reliability of the MLCCs. Although V 4+ was detected in the 0.20 and 0.30 mol% vanadium-added MLCCs, the electrical properties were dependant upon the other ions, e.g., V 3+ or V 5+ .</description><subject>Ceramics</subject><subject>Degradation</subject><subject>EPR</subject><subject>Grain boundaries</subject><subject>Manganese</subject><subject>MLCCs</subject><subject>Reliability</subject><subject>Resistance</subject><subject>vanadium</subject><issn>1099-4734</issn><issn>2375-0448</issn><isbn>1457711621</isbn><isbn>9781457711626</isbn><isbn>1457711613</isbn><isbn>9781457711633</isbn><isbn>9781457711619</isbn><isbn>145771163X</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2011</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpFUNtKw0AUXG9gWv0A8WV_IPWcvWSTxxpaLVT60PpcTpqzupKmko1C_96IBWFgBoYZmBHiDmGCCMXDYj2dTxQgTjJAg4BnYoTGOoeYoT4XidLOpmBMfvFvKLwUyZAuUuO0uRajGD8AFEBmErGeec-7Xh683FP7Ri1HltTW8ptaqsPXfhANtzuO0h862b-z7LgJVIUm9Mff2CNtwkqnFUWu5cuyLOONuPLURL498Vi8zmeb8jldrp4W5XSZBgTbpyqvkawjb4dFznhd5JhXBEA2U47dLjeFNxVYM6DSnl1tVaaN1pWpiDI9Fvd_vYGZt59d2FN33J6e0T9Kj1Ff</recordid><startdate>201107</startdate><enddate>201107</enddate><creator>Natsui, H.</creator><creator>Shibahara, T.</creator><creator>Kido, O.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>201107</creationdate><title>Effect of manganese and vanadium valences for the reliability of BaTiO3-based MLCCs</title><author>Natsui, H. ; Shibahara, T. ; Kido, O.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i105t-28d1a57af520174f39818ba00a5627e7c849f4b054054b3fe7d5263433b4baa63</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Ceramics</topic><topic>Degradation</topic><topic>EPR</topic><topic>Grain boundaries</topic><topic>Manganese</topic><topic>MLCCs</topic><topic>Reliability</topic><topic>Resistance</topic><topic>vanadium</topic><toplevel>online_resources</toplevel><creatorcontrib>Natsui, H.</creatorcontrib><creatorcontrib>Shibahara, T.</creatorcontrib><creatorcontrib>Kido, O.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Natsui, H.</au><au>Shibahara, T.</au><au>Kido, O.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Effect of manganese and vanadium valences for the reliability of BaTiO3-based MLCCs</atitle><btitle>2011 International Symposium on Applications of Ferroelectrics (ISAF/PFM) and 2011 International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials</btitle><stitle>ISAF</stitle><date>2011-07</date><risdate>2011</risdate><spage>1</spage><epage>4</epage><pages>1-4</pages><issn>1099-4734</issn><eissn>2375-0448</eissn><isbn>1457711621</isbn><isbn>9781457711626</isbn><eisbn>1457711613</eisbn><eisbn>9781457711633</eisbn><eisbn>9781457711619</eisbn><eisbn>145771163X</eisbn><abstract>The valences of manganese and vanadium oxides in multi-layer ceramic capacitors (MLCCs), sintered under a reducing atmosphere, were investigated using electron paramagnetic resonance, the insulation resistance degradation was analyzed using impedance spectroscopy in highly accelerated life time tests to clarify the manganese and vanadium influence on both the electrical properties and microstructure of MLCCs. The Mn 2+ was stable in the reducing-atmosphere-sintered MLCCs, and formed a grain boundary. Vanadium mitigated the IR degradation and increased the reliability of the MLCCs. Although V 4+ was detected in the 0.20 and 0.30 mol% vanadium-added MLCCs, the electrical properties were dependant upon the other ions, e.g., V 3+ or V 5+ .</abstract><pub>IEEE</pub><doi>10.1109/ISAF.2011.6014101</doi><tpages>4</tpages></addata></record> |
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| identifier | ISSN: 1099-4734 |
| ispartof | 2011 International Symposium on Applications of Ferroelectrics (ISAF/PFM) and 2011 International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials, 2011, p.1-4 |
| issn | 1099-4734 2375-0448 |
| language | eng |
| recordid | cdi_ieee_primary_6014101 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Ceramics Degradation EPR Grain boundaries Manganese MLCCs Reliability Resistance vanadium |
| title | Effect of manganese and vanadium valences for the reliability of BaTiO3-based MLCCs |
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