Study of EMP effects experiment on the solid state relay
An experiment of EMP effects on the solid state relay is described. In order to get the radiation interference threshold value of the relay, the length of the connection is cut as short as possible. The radiation interference threshold value is found to be superior to 75kV/m. By using capacitor coup...
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creator | Yanxin Li Qiwu Wang Lihua Shi Feng Lu Liyuan Su |
description | An experiment of EMP effects on the solid state relay is described. In order to get the radiation interference threshold value of the relay, the length of the connection is cut as short as possible. The radiation interference threshold value is found to be superior to 75kV/m. By using capacitor coupling, the conduction interference voltage threshold value 3850V is found. The experiment results also show that the EMP interference at the input port of the relay can induce transient switching on, which can cause misworking. |
doi_str_mv | 10.1109/MACE.2011.5987985 |
format | Conference Proceeding |
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In order to get the radiation interference threshold value of the relay, the length of the connection is cut as short as possible. The radiation interference threshold value is found to be superior to 75kV/m. By using capacitor coupling, the conduction interference voltage threshold value 3850V is found. The experiment results also show that the EMP interference at the input port of the relay can induce transient switching on, which can cause misworking.</description><identifier>ISBN: 1424494362</identifier><identifier>ISBN: 9781424494361</identifier><identifier>EISBN: 1424494389</identifier><identifier>EISBN: 9781424494385</identifier><identifier>EISBN: 1424494397</identifier><identifier>EISBN: 9781424494392</identifier><identifier>DOI: 10.1109/MACE.2011.5987985</identifier><language>chi ; eng</language><publisher>IEEE</publisher><subject>coupling ; Couplings ; EMP effects ; Fuses ; Interference ; Military standards ; Relays ; solid state relay ; Solids ; Threshold voltage</subject><ispartof>2011 Second International Conference on Mechanic Automation and Control Engineering, 2011, p.4418-4421</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5987985$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5987985$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Yanxin Li</creatorcontrib><creatorcontrib>Qiwu Wang</creatorcontrib><creatorcontrib>Lihua Shi</creatorcontrib><creatorcontrib>Feng Lu</creatorcontrib><creatorcontrib>Liyuan Su</creatorcontrib><title>Study of EMP effects experiment on the solid state relay</title><title>2011 Second International Conference on Mechanic Automation and Control Engineering</title><addtitle>MACE</addtitle><description>An experiment of EMP effects on the solid state relay is described. In order to get the radiation interference threshold value of the relay, the length of the connection is cut as short as possible. The radiation interference threshold value is found to be superior to 75kV/m. By using capacitor coupling, the conduction interference voltage threshold value 3850V is found. The experiment results also show that the EMP interference at the input port of the relay can induce transient switching on, which can cause misworking.</description><subject>coupling</subject><subject>Couplings</subject><subject>EMP effects</subject><subject>Fuses</subject><subject>Interference</subject><subject>Military standards</subject><subject>Relays</subject><subject>solid state relay</subject><subject>Solids</subject><subject>Threshold voltage</subject><isbn>1424494362</isbn><isbn>9781424494361</isbn><isbn>1424494389</isbn><isbn>9781424494385</isbn><isbn>1424494397</isbn><isbn>9781424494392</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2011</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpFj8FKw0AURUdEUNt-gLiZH0ic9ybJzFuWEK3QotDuy0zygpHYlMwI5u8NWPBuLmdzuFeIB1ApgKKn3bqsUlQAaU7WkM2vxD1kmGWUaUvX_1DgrViF8KnmFAUR2Dth9_G7meTQymr3LrltuY5B8s-Zx-6LT1EOJxk_WIah7xoZoossR-7dtBQ3resDry69EIfn6lBuku3by2u53iYdqZhY4rxB8og1eu8QDRnPRheUG4ctGGWNVxlpj9CoWgHW5LVFQAfM7PRCPP5puxmP53mUG6fj5aj-BaaURZw</recordid><startdate>201107</startdate><enddate>201107</enddate><creator>Yanxin Li</creator><creator>Qiwu Wang</creator><creator>Lihua Shi</creator><creator>Feng Lu</creator><creator>Liyuan Su</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201107</creationdate><title>Study of EMP effects experiment on the solid state relay</title><author>Yanxin Li ; Qiwu Wang ; Lihua Shi ; Feng Lu ; Liyuan Su</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-89e5d29b22c2bba22797be736957a2f17087b0493b21d0c012c9b38212a1eeea3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>chi ; eng</language><creationdate>2011</creationdate><topic>coupling</topic><topic>Couplings</topic><topic>EMP effects</topic><topic>Fuses</topic><topic>Interference</topic><topic>Military standards</topic><topic>Relays</topic><topic>solid state relay</topic><topic>Solids</topic><topic>Threshold voltage</topic><toplevel>online_resources</toplevel><creatorcontrib>Yanxin Li</creatorcontrib><creatorcontrib>Qiwu Wang</creatorcontrib><creatorcontrib>Lihua Shi</creatorcontrib><creatorcontrib>Feng Lu</creatorcontrib><creatorcontrib>Liyuan Su</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Yanxin Li</au><au>Qiwu Wang</au><au>Lihua Shi</au><au>Feng Lu</au><au>Liyuan Su</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Study of EMP effects experiment on the solid state relay</atitle><btitle>2011 Second International Conference on Mechanic Automation and Control Engineering</btitle><stitle>MACE</stitle><date>2011-07</date><risdate>2011</risdate><spage>4418</spage><epage>4421</epage><pages>4418-4421</pages><isbn>1424494362</isbn><isbn>9781424494361</isbn><eisbn>1424494389</eisbn><eisbn>9781424494385</eisbn><eisbn>1424494397</eisbn><eisbn>9781424494392</eisbn><abstract>An experiment of EMP effects on the solid state relay is described. In order to get the radiation interference threshold value of the relay, the length of the connection is cut as short as possible. The radiation interference threshold value is found to be superior to 75kV/m. By using capacitor coupling, the conduction interference voltage threshold value 3850V is found. The experiment results also show that the EMP interference at the input port of the relay can induce transient switching on, which can cause misworking.</abstract><pub>IEEE</pub><doi>10.1109/MACE.2011.5987985</doi><tpages>4</tpages></addata></record> |
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language | chi ; eng |
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subjects | coupling Couplings EMP effects Fuses Interference Military standards Relays solid state relay Solids Threshold voltage |
title | Study of EMP effects experiment on the solid state relay |
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