A study on the lifetime comparison for Electric Double Layer Capacitors using Accelerated Degradation Test

In this paper, we carried out the lifetime comparison for the products (rated voltage: 2.5V and 2.7V, capacitance: 100F) of 8 Electric Double Layer Capacitors (EDLC) makers using Accelerated Degradation Test (ADT) that is commonly used to predict lifetime of the components caused the degradation fai...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Dong-Hoon Hwang, Jung-Won Park, Jae-Han Jung
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	accelerated degradation test(ADT) accelerated model Capacitance Companies Data models Degradation electric double layer capacitors(EDLC) failure mode and mechanism Life estimation lifetime Mathematical model Resistance
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