Testability modeling and analysis based on rough set

Aiming at the limitation of dependency model in description and analysis of uncertain problem for testability analysis of complex circuit board, a testability modeling and analysis method is put forward based on fault simulation and rough set. Firstly, an information system is generated through faul...

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Hauptverfasser: Xuejun Su, Chenggang Wang, Shichuang Cai
Format: Tagungsbericht
Sprache:eng
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Zusammenfassung:Aiming at the limitation of dependency model in description and analysis of uncertain problem for testability analysis of complex circuit board, a testability modeling and analysis method is put forward based on fault simulation and rough set. Firstly, an information system is generated through fault simulation. Then, decision table matrix is provided by conditional attributes discretization and reduction. And moreover, the fault detection rate and fault isolation rate of circuit board can be calculated based on the matrix. Finally, an example proves that our method is feasible and effective.
DOI:10.1109/CSSS.2011.5974752