Polarization dependence of facet reflectivity in rectangular submicron waveguides

We measure and theoretically describe the polarization anisotropy of the facet reflectivity in rectangular, subwavelength waveguides. This effect is increasingly impacting the performance of integrated optical devices as the lateral size scale shrinks.

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Hauptverfasser: Stievater, T. H., Park, D., Pruessner, M. W., Rabinovich, W. S., Holmstrom, S. A., Kanakaraju, S., Richardson, C. J. K., Khurgin, J. B.
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creator Stievater, T. H.
Park, D.
Pruessner, M. W.
Rabinovich, W. S.
Holmstrom, S. A.
Kanakaraju, S.
Richardson, C. J. K.
Khurgin, J. B.
description We measure and theoretically describe the polarization anisotropy of the facet reflectivity in rectangular, subwavelength waveguides. This effect is increasingly impacting the performance of integrated optical devices as the lateral size scale shrinks.
doi_str_mv 10.1364/CLEO_AT.2011.JTuI27
format Conference Proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_5951055</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5951055</ieee_id><sourcerecordid>5951055</sourcerecordid><originalsourceid>FETCH-LOGICAL-i455t-675562ebda1b7d09590f3179063233e3e647b86e572969f52960b549204635323</originalsourceid><addsrcrecordid>eNotT9tqwkAU3N6g1voFvuQHku7Z3bOb8yhirUWwBfscNsmJbNEouVjs1zdQ52UY5gIjxBRkAtqal_l6sclm20RJgOR926-UuxETcikgOlQEYG7FSIGVMUlp7sQTGHQOlNLu_mqklNKjmLTttxxgLaUpjcTnx3Hvm_Dru3Cso5JPXJdcFxwdq6jyBXdRw9Weiy6cQ3eJQj3oovP1rh9qUdvnh1A0Q_PHn3nXh5LbZ_FQ-X3LkyuPxdfrYjt_i9eb5Wo-W8fBIHaxdYhWcV56yF0pCUlWGhxJq5XWrNkal6eW0SmyVA0nrczRkJLGahwyYzH93w3MnJ2acPDNJUNCkIj6Dy4aVNw</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Polarization dependence of facet reflectivity in rectangular submicron waveguides</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Stievater, T. H. ; Park, D. ; Pruessner, M. W. ; Rabinovich, W. S. ; Holmstrom, S. A. ; Kanakaraju, S. ; Richardson, C. J. K. ; Khurgin, J. B.</creator><creatorcontrib>Stievater, T. H. ; Park, D. ; Pruessner, M. W. ; Rabinovich, W. S. ; Holmstrom, S. A. ; Kanakaraju, S. ; Richardson, C. J. K. ; Khurgin, J. B.</creatorcontrib><description>We measure and theoretically describe the polarization anisotropy of the facet reflectivity in rectangular, subwavelength waveguides. This effect is increasingly impacting the performance of integrated optical devices as the lateral size scale shrinks.</description><identifier>ISSN: 2160-8989</identifier><identifier>ISBN: 1457712237</identifier><identifier>ISBN: 9781457712234</identifier><identifier>EISSN: 2160-9004</identifier><identifier>EISBN: 9781557529114</identifier><identifier>EISBN: 1557529108</identifier><identifier>EISBN: 1557529116</identifier><identifier>EISBN: 9781557529107</identifier><identifier>DOI: 10.1364/CLEO_AT.2011.JTuI27</identifier><language>eng</language><publisher>IEEE</publisher><subject>Laser modes ; Optical waveguides ; Semiconductor device measurement ; Semiconductor waveguides ; Silicon ; Waveguide lasers ; Wavelength measurement</subject><ispartof>CLEO: 2011 - Laser Science to Photonic Applications, 2011, p.1-2</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5951055$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>310,311,781,785,790,791,2059,27930,54925</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5951055$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Stievater, T. H.</creatorcontrib><creatorcontrib>Park, D.</creatorcontrib><creatorcontrib>Pruessner, M. W.</creatorcontrib><creatorcontrib>Rabinovich, W. S.</creatorcontrib><creatorcontrib>Holmstrom, S. A.</creatorcontrib><creatorcontrib>Kanakaraju, S.</creatorcontrib><creatorcontrib>Richardson, C. J. K.</creatorcontrib><creatorcontrib>Khurgin, J. B.</creatorcontrib><title>Polarization dependence of facet reflectivity in rectangular submicron waveguides</title><title>CLEO: 2011 - Laser Science to Photonic Applications</title><addtitle>CLEO</addtitle><description>We measure and theoretically describe the polarization anisotropy of the facet reflectivity in rectangular, subwavelength waveguides. This effect is increasingly impacting the performance of integrated optical devices as the lateral size scale shrinks.</description><subject>Laser modes</subject><subject>Optical waveguides</subject><subject>Semiconductor device measurement</subject><subject>Semiconductor waveguides</subject><subject>Silicon</subject><subject>Waveguide lasers</subject><subject>Wavelength measurement</subject><issn>2160-8989</issn><issn>2160-9004</issn><isbn>1457712237</isbn><isbn>9781457712234</isbn><isbn>9781557529114</isbn><isbn>1557529108</isbn><isbn>1557529116</isbn><isbn>9781557529107</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2011</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotT9tqwkAU3N6g1voFvuQHku7Z3bOb8yhirUWwBfscNsmJbNEouVjs1zdQ52UY5gIjxBRkAtqal_l6sclm20RJgOR926-UuxETcikgOlQEYG7FSIGVMUlp7sQTGHQOlNLu_mqklNKjmLTttxxgLaUpjcTnx3Hvm_Dru3Cso5JPXJdcFxwdq6jyBXdRw9Weiy6cQ3eJQj3oovP1rh9qUdvnh1A0Q_PHn3nXh5LbZ_FQ-X3LkyuPxdfrYjt_i9eb5Wo-W8fBIHaxdYhWcV56yF0pCUlWGhxJq5XWrNkal6eW0SmyVA0nrczRkJLGahwyYzH93w3MnJ2acPDNJUNCkIj6Dy4aVNw</recordid><startdate>201105</startdate><enddate>201105</enddate><creator>Stievater, T. H.</creator><creator>Park, D.</creator><creator>Pruessner, M. W.</creator><creator>Rabinovich, W. S.</creator><creator>Holmstrom, S. A.</creator><creator>Kanakaraju, S.</creator><creator>Richardson, C. J. K.</creator><creator>Khurgin, J. B.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>201105</creationdate><title>Polarization dependence of facet reflectivity in rectangular submicron waveguides</title><author>Stievater, T. H. ; Park, D. ; Pruessner, M. W. ; Rabinovich, W. S. ; Holmstrom, S. A. ; Kanakaraju, S. ; Richardson, C. J. K. ; Khurgin, J. B.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i455t-675562ebda1b7d09590f3179063233e3e647b86e572969f52960b549204635323</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Laser modes</topic><topic>Optical waveguides</topic><topic>Semiconductor device measurement</topic><topic>Semiconductor waveguides</topic><topic>Silicon</topic><topic>Waveguide lasers</topic><topic>Wavelength measurement</topic><toplevel>online_resources</toplevel><creatorcontrib>Stievater, T. H.</creatorcontrib><creatorcontrib>Park, D.</creatorcontrib><creatorcontrib>Pruessner, M. W.</creatorcontrib><creatorcontrib>Rabinovich, W. S.</creatorcontrib><creatorcontrib>Holmstrom, S. A.</creatorcontrib><creatorcontrib>Kanakaraju, S.</creatorcontrib><creatorcontrib>Richardson, C. J. K.</creatorcontrib><creatorcontrib>Khurgin, J. B.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Stievater, T. H.</au><au>Park, D.</au><au>Pruessner, M. W.</au><au>Rabinovich, W. S.</au><au>Holmstrom, S. A.</au><au>Kanakaraju, S.</au><au>Richardson, C. J. K.</au><au>Khurgin, J. B.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Polarization dependence of facet reflectivity in rectangular submicron waveguides</atitle><btitle>CLEO: 2011 - Laser Science to Photonic Applications</btitle><stitle>CLEO</stitle><date>2011-05</date><risdate>2011</risdate><spage>1</spage><epage>2</epage><pages>1-2</pages><issn>2160-8989</issn><eissn>2160-9004</eissn><isbn>1457712237</isbn><isbn>9781457712234</isbn><eisbn>9781557529114</eisbn><eisbn>1557529108</eisbn><eisbn>1557529116</eisbn><eisbn>9781557529107</eisbn><abstract>We measure and theoretically describe the polarization anisotropy of the facet reflectivity in rectangular, subwavelength waveguides. This effect is increasingly impacting the performance of integrated optical devices as the lateral size scale shrinks.</abstract><pub>IEEE</pub><doi>10.1364/CLEO_AT.2011.JTuI27</doi><tpages>2</tpages></addata></record>
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source IEEE Electronic Library (IEL) Conference Proceedings
subjects Laser modes
Optical waveguides
Semiconductor device measurement
Semiconductor waveguides
Silicon
Waveguide lasers
Wavelength measurement
title Polarization dependence of facet reflectivity in rectangular submicron waveguides
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-15T00%3A51%3A42IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Polarization%20dependence%20of%20facet%20reflectivity%20in%20rectangular%20submicron%20waveguides&rft.btitle=CLEO:%202011%20-%20Laser%20Science%20to%20Photonic%20Applications&rft.au=Stievater,%20T.%20H.&rft.date=2011-05&rft.spage=1&rft.epage=2&rft.pages=1-2&rft.issn=2160-8989&rft.eissn=2160-9004&rft.isbn=1457712237&rft.isbn_list=9781457712234&rft_id=info:doi/10.1364/CLEO_AT.2011.JTuI27&rft_dat=%3Cieee_6IE%3E5951055%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&rft.eisbn=9781557529114&rft.eisbn_list=1557529108&rft.eisbn_list=1557529116&rft.eisbn_list=9781557529107&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=5951055&rfr_iscdi=true