Polarization dependence of facet reflectivity in rectangular submicron waveguides

Polarization dependence of facet reflectivity in rectangular submicron waveguides

We measure and theoretically describe the polarization anisotropy of the facet reflectivity in rectangular, subwavelength waveguides. This effect is increasingly impacting the performance of integrated optical devices as the lateral size scale shrinks.

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Bibliographische Detailangaben
Hauptverfasser: Stievater, T. H., Park, D., Pruessner, M. W., Rabinovich, W. S., Holmstrom, S. A., Kanakaraju, S., Richardson, C. J. K., Khurgin, J. B.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Laser modes
Optical waveguides
Semiconductor device measurement
Semiconductor waveguides
Silicon
Waveguide lasers
Wavelength measurement
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Beschreibung
Zusammenfassung:We measure and theoretically describe the polarization anisotropy of the facet reflectivity in rectangular, subwavelength waveguides. This effect is increasingly impacting the performance of integrated optical devices as the lateral size scale shrinks.
ISSN:2160-8989
2160-9004
DOI:10.1364/CLEO_AT.2011.JTuI27