A physical simulation approach for active photogrammetric 3D measurement systems
A physically based model of camera, sensor, light source, object geometry and surface characteristics in conjunction with the path tracing algorithm is suggested and enhanced to allow for accurate simulation of active photogrammetric 3d measurement systems. This allows for effects to be simulated wh...
Gespeichert in:
Hauptverfasser: | , , |
---|---|
Format: | Tagungsbericht |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 5 |
---|---|
container_issue | |
container_start_page | 1 |
container_title | |
container_volume | |
creator | von Enzberg, S. Lilienblum, E. Michaelis, B. |
description | A physically based model of camera, sensor, light source, object geometry and surface characteristics in conjunction with the path tracing algorithm is suggested and enhanced to allow for accurate simulation of active photogrammetric 3d measurement systems. This allows for effects to be simulated which are not inherent to common simulation approaches. The theory is based on the rendering and measurement equations which are solved using Monte Carlo methods. The minimal number of samples to achieve an accurate physical simulation can be adapted for each pixel by estimating the residual standard deviation of each calculated gray scale value. |
doi_str_mv | 10.1109/IMTC.2011.5944110 |
format | Conference Proceeding |
fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_5944110</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5944110</ieee_id><sourcerecordid>5944110</sourcerecordid><originalsourceid>FETCH-LOGICAL-i175t-32caa4122a594d48a2de9a5f462f301d5b013ed75ad4db3e01474ab49fa51e613</originalsourceid><addsrcrecordid>eNo1UMtOwzAQNAIkSukHIC7-gRSvvU7qY1VelYrgUM7VNtlQo7qJbBepf08kYC-j2Z0ZaVaIW1BTAOXul6_rxVQrgKl1iMPqTExcNQPUiJUziOfi-p8YdyFGgwkKq2dwJSYpfalhynK4lSPxPpf97pR8TXuZfDjuKfvuIKnvY0f1TrZdlFRn_82DrsvdZ6QQOEdfS_MgA1M6Rg58yDKdUuaQbsRlS_vEkz8ci4-nx_XipVi9PS8X81XhobK5MLomQtCahg4Nzkg37Mi2WOrWKGjsVoHhprLUYLM1rAArpC26lixwCWYs7n5zPTNv-ugDxdPm7yHmBxDxUto</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>A physical simulation approach for active photogrammetric 3D measurement systems</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>von Enzberg, S. ; Lilienblum, E. ; Michaelis, B.</creator><creatorcontrib>von Enzberg, S. ; Lilienblum, E. ; Michaelis, B.</creatorcontrib><description>A physically based model of camera, sensor, light source, object geometry and surface characteristics in conjunction with the path tracing algorithm is suggested and enhanced to allow for accurate simulation of active photogrammetric 3d measurement systems. This allows for effects to be simulated which are not inherent to common simulation approaches. The theory is based on the rendering and measurement equations which are solved using Monte Carlo methods. The minimal number of samples to achieve an accurate physical simulation can be adapted for each pixel by estimating the residual standard deviation of each calculated gray scale value.</description><identifier>ISSN: 1091-5281</identifier><identifier>ISBN: 1424479339</identifier><identifier>ISBN: 9781424479337</identifier><identifier>EISBN: 9781424479344</identifier><identifier>EISBN: 1424479355</identifier><identifier>EISBN: 1424479347</identifier><identifier>EISBN: 9781424479351</identifier><identifier>DOI: 10.1109/IMTC.2011.5944110</identifier><language>eng</language><publisher>IEEE</publisher><subject>Cameras ; Computational modeling ; Mathematical model ; Monte Carlo methods ; Noise ; Rendering (computer graphics) ; Three dimensional displays</subject><ispartof>2011 IEEE International Instrumentation and Measurement Technology Conference, 2011, p.1-5</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5944110$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,27902,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5944110$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>von Enzberg, S.</creatorcontrib><creatorcontrib>Lilienblum, E.</creatorcontrib><creatorcontrib>Michaelis, B.</creatorcontrib><title>A physical simulation approach for active photogrammetric 3D measurement systems</title><title>2011 IEEE International Instrumentation and Measurement Technology Conference</title><addtitle>IMTC</addtitle><description>A physically based model of camera, sensor, light source, object geometry and surface characteristics in conjunction with the path tracing algorithm is suggested and enhanced to allow for accurate simulation of active photogrammetric 3d measurement systems. This allows for effects to be simulated which are not inherent to common simulation approaches. The theory is based on the rendering and measurement equations which are solved using Monte Carlo methods. The minimal number of samples to achieve an accurate physical simulation can be adapted for each pixel by estimating the residual standard deviation of each calculated gray scale value.</description><subject>Cameras</subject><subject>Computational modeling</subject><subject>Mathematical model</subject><subject>Monte Carlo methods</subject><subject>Noise</subject><subject>Rendering (computer graphics)</subject><subject>Three dimensional displays</subject><issn>1091-5281</issn><isbn>1424479339</isbn><isbn>9781424479337</isbn><isbn>9781424479344</isbn><isbn>1424479355</isbn><isbn>1424479347</isbn><isbn>9781424479351</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2011</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo1UMtOwzAQNAIkSukHIC7-gRSvvU7qY1VelYrgUM7VNtlQo7qJbBepf08kYC-j2Z0ZaVaIW1BTAOXul6_rxVQrgKl1iMPqTExcNQPUiJUziOfi-p8YdyFGgwkKq2dwJSYpfalhynK4lSPxPpf97pR8TXuZfDjuKfvuIKnvY0f1TrZdlFRn_82DrsvdZ6QQOEdfS_MgA1M6Rg58yDKdUuaQbsRlS_vEkz8ci4-nx_XipVi9PS8X81XhobK5MLomQtCahg4Nzkg37Mi2WOrWKGjsVoHhprLUYLM1rAArpC26lixwCWYs7n5zPTNv-ugDxdPm7yHmBxDxUto</recordid><startdate>201105</startdate><enddate>201105</enddate><creator>von Enzberg, S.</creator><creator>Lilienblum, E.</creator><creator>Michaelis, B.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>201105</creationdate><title>A physical simulation approach for active photogrammetric 3D measurement systems</title><author>von Enzberg, S. ; Lilienblum, E. ; Michaelis, B.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-32caa4122a594d48a2de9a5f462f301d5b013ed75ad4db3e01474ab49fa51e613</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Cameras</topic><topic>Computational modeling</topic><topic>Mathematical model</topic><topic>Monte Carlo methods</topic><topic>Noise</topic><topic>Rendering (computer graphics)</topic><topic>Three dimensional displays</topic><toplevel>online_resources</toplevel><creatorcontrib>von Enzberg, S.</creatorcontrib><creatorcontrib>Lilienblum, E.</creatorcontrib><creatorcontrib>Michaelis, B.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>von Enzberg, S.</au><au>Lilienblum, E.</au><au>Michaelis, B.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>A physical simulation approach for active photogrammetric 3D measurement systems</atitle><btitle>2011 IEEE International Instrumentation and Measurement Technology Conference</btitle><stitle>IMTC</stitle><date>2011-05</date><risdate>2011</risdate><spage>1</spage><epage>5</epage><pages>1-5</pages><issn>1091-5281</issn><isbn>1424479339</isbn><isbn>9781424479337</isbn><eisbn>9781424479344</eisbn><eisbn>1424479355</eisbn><eisbn>1424479347</eisbn><eisbn>9781424479351</eisbn><abstract>A physically based model of camera, sensor, light source, object geometry and surface characteristics in conjunction with the path tracing algorithm is suggested and enhanced to allow for accurate simulation of active photogrammetric 3d measurement systems. This allows for effects to be simulated which are not inherent to common simulation approaches. The theory is based on the rendering and measurement equations which are solved using Monte Carlo methods. The minimal number of samples to achieve an accurate physical simulation can be adapted for each pixel by estimating the residual standard deviation of each calculated gray scale value.</abstract><pub>IEEE</pub><doi>10.1109/IMTC.2011.5944110</doi><tpages>5</tpages></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 1091-5281 |
ispartof | 2011 IEEE International Instrumentation and Measurement Technology Conference, 2011, p.1-5 |
issn | 1091-5281 |
language | eng |
recordid | cdi_ieee_primary_5944110 |
source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Cameras Computational modeling Mathematical model Monte Carlo methods Noise Rendering (computer graphics) Three dimensional displays |
title | A physical simulation approach for active photogrammetric 3D measurement systems |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-15T06%3A21%3A06IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=A%20physical%20simulation%20approach%20for%20active%20photogrammetric%203D%20measurement%20systems&rft.btitle=2011%20IEEE%20International%20Instrumentation%20and%20Measurement%20Technology%20Conference&rft.au=von%20Enzberg,%20S.&rft.date=2011-05&rft.spage=1&rft.epage=5&rft.pages=1-5&rft.issn=1091-5281&rft.isbn=1424479339&rft.isbn_list=9781424479337&rft_id=info:doi/10.1109/IMTC.2011.5944110&rft_dat=%3Cieee_6IE%3E5944110%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&rft.eisbn=9781424479344&rft.eisbn_list=1424479355&rft.eisbn_list=1424479347&rft.eisbn_list=9781424479351&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=5944110&rfr_iscdi=true |