Low Coverage Analysis using dynamic un-testability debug in ATPG

In this paper, we propose an automated technique to identify the reasons for un-testable faults and, an interactive Low Coverage Analysis flow to expedite the coverage analysis step, in scan ATPG. We seamlessly use an implication graph to keep track of the reasons that are responsible for each confl...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Chandrasekar, K, Bommu, S, Sengupta, S
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Algorithm design and analysis Automatic test pattern generation Circuit faults Cognition Fault diagnosis Logic gates Very large scale integration
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