The problem of diagnostics of electronics and plasma units

This is to propose a method for determining the heterogeneity emission based on the analysis of Schottky plot of saturation. It is shown that the problem of determining the emission heterogeneity is ill-posed problems and requires for its solution some prior information about the nature of the solut...

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Hauptverfasser:	Kovalenko, Y A, Korolev, D S
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Accuracy Convolution distribution emission Equations Fredholm equation Inverse problems Plasmas Probes Region 8 Shottky plot work function
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creator	Kovalenko, Y A Korolev, D S
description	This is to propose a method for determining the heterogeneity emission based on the analysis of Schottky plot of saturation. It is shown that the problem of determining the emission heterogeneity is ill-posed problems and requires for its solution some prior information about the nature of the solution. Since the current emission equation is described by the Fredholm-1st kind of convolution type, the solution of the inverse problem described by the Tikhonov functional, whose solution for a fixed regularization parameter can be found in closed form by Fourier transformation.
doi_str_mv	10.1109/IVEC.2011.5747068
format	Conference Proceeding
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It is shown that the problem of determining the emission heterogeneity is ill-posed problems and requires for its solution some prior information about the nature of the solution. 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Since the current emission equation is described by the Fredholm-1st kind of convolution type, the solution of the inverse problem described by the Tikhonov functional, whose solution for a fixed regularization parameter can be found in closed form by Fourier transformation.</description><subject>Accuracy</subject><subject>Convolution</subject><subject>distribution</subject><subject>emission</subject><subject>Equations</subject><subject>Fredholm equation</subject><subject>Inverse problems</subject><subject>Plasmas</subject><subject>Probes</subject><subject>Region 8</subject><subject>Shottky plot</subject><subject>work function</subject><isbn>9781424486625</isbn><isbn>1424486629</isbn><isbn>9781424486601</isbn><isbn>1424486602</isbn><isbn>9781424486618</isbn><isbn>1424486610</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2011</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpVj8tKxEAURFtEUMZ8gLjJD0y8t9_tTsKoAwNugtuhk77RlrxIx4V_bwZnY22Ks6iiirE7hAIR3MP-fVcWHBALZaQBbS9Y5oxFyaW0WgNe_mOurlmW0hes0toZoW7YY_VJ-TSPdUd9PrZ5iP5jGNMSm3RC6qhZ5nE4oR9CPnU-9T7_HuKSbtlV67tE2dk3rHreVeXr9vD2si-fDtvoYNnWujGhgdoGbpXHVlhQxol1jUZNEKzShCB8oEaaIMO6Ejmn4AwirhmxYfd_tZGIjtMcez__HM-HxS_6_UfX</recordid><startdate>201102</startdate><enddate>201102</enddate><creator>Kovalenko, Y A</creator><creator>Korolev, D S</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201102</creationdate><title>The problem of diagnostics of electronics and plasma units</title><author>Kovalenko, Y A ; Korolev, D S</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-b6c7dc0b8d285a1f3805793662616e0d856e103adec47d4d625122ed97111d283</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Accuracy</topic><topic>Convolution</topic><topic>distribution</topic><topic>emission</topic><topic>Equations</topic><topic>Fredholm equation</topic><topic>Inverse problems</topic><topic>Plasmas</topic><topic>Probes</topic><topic>Region 8</topic><topic>Shottky plot</topic><topic>work function</topic><toplevel>online_resources</toplevel><creatorcontrib>Kovalenko, Y A</creatorcontrib><creatorcontrib>Korolev, D S</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE/IET Electronic Library</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kovalenko, Y A</au><au>Korolev, D S</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>The problem of diagnostics of electronics and plasma units</atitle><btitle>2011 IEEE International Vacuum Electronics Conference (IVEC)</btitle><stitle>IVEC</stitle><date>2011-02</date><risdate>2011</risdate><spage>447</spage><epage>448</epage><pages>447-448</pages><isbn>9781424486625</isbn><isbn>1424486629</isbn><eisbn>9781424486601</eisbn><eisbn>1424486602</eisbn><eisbn>9781424486618</eisbn><eisbn>1424486610</eisbn><abstract>This is to propose a method for determining the heterogeneity emission based on the analysis of Schottky plot of saturation. It is shown that the problem of determining the emission heterogeneity is ill-posed problems and requires for its solution some prior information about the nature of the solution. Since the current emission equation is described by the Fredholm-1st kind of convolution type, the solution of the inverse problem described by the Tikhonov functional, whose solution for a fixed regularization parameter can be found in closed form by Fourier transformation.</abstract><pub>IEEE</pub><doi>10.1109/IVEC.2011.5747068</doi><tpages>2</tpages></addata></record>
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source	IEEE Electronic Library (IEL) Conference Proceedings
subjects	Accuracy Convolution distribution emission Equations Fredholm equation Inverse problems Plasmas Probes Region 8 Shottky plot work function
title	The problem of diagnostics of electronics and plasma units
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