Chipping free process for combination of narrow saw street (60um) and thick wafer (600um) sawing process

Chipping free is a dream for wafer sawing process. With current high complexity of wafer technology plus the drive for cost reduction by narrowing the saw street width, it is a challenge which requires huge effort for wafer sawing process to achieve chipping free process. Higher density of metalliza...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Amri, Mohd Syahrin, Liew, David, Harun, Fuaida
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 5
container_issue
container_start_page 1
container_title
container_volume
creator Amri, Mohd Syahrin
Liew, David
Harun, Fuaida
description Chipping free is a dream for wafer sawing process. With current high complexity of wafer technology plus the drive for cost reduction by narrowing the saw street width, it is a challenge which requires huge effort for wafer sawing process to achieve chipping free process. Higher density of metallization causing higher blade loading during mechanical sawing. This leads to chipping penetrating under the guard ring and damaging the active area. This paper will share all the activities towards chipping free process on a device involving optimization through mechanical sawing, infra red camera and laser grooving process. Blade selection involving various diamond grit size, different concentration, slit design and low k types only able to minimize the occurrence but not totally eliminate it. Finally by performing laser grooving, significant results were achieved with zero chipping occurrences. In addition, suitable laser frequency selection is also important to ensure the best performance. In this case higher frequency laser grooving in combination with mechanical sawing process found to be able to meet the requirement.
doi_str_mv 10.1109/IEMT.2010.5746667
format Conference Proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_5746667</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5746667</ieee_id><sourcerecordid>5746667</sourcerecordid><originalsourceid>FETCH-LOGICAL-i90t-429fd6fb1aeedb3472058b77f8edd6ede49920fcdc3213db8e2ca85b9c8722a73</originalsourceid><addsrcrecordid>eNo1kEtPwzAQhM1Loi39AYiLj3BIWTuOH0dUFahUxKX3yrHXxEAecoIq_j0plMNqtDOj7zCEXDNYMAbmfr162S44jG-hhJRSnZApE1wIrbnKT8mEF0pmRnJ5RuZG6f-sEOdkwkCbTDMDl2Ta9-8AHECoCamWVey62LzRkBBpl1qHfU9Dm6hr6zI2dohtQ9tAG5tSu6e9HW8YuwO9lfBV31HbeDpU0X3QvQ2YDvavPzYP3CPyilwE-9nj_Kgzsn1cbZfP2eb1ab182GTRwJAJboKXoWQW0Ze5UBwKXSoVNHov0aMwhkNw3uWc5b7UyJ3VRWmcVpxblc_IzR82IuKuS7G26Xt3HCz_AbwzW5o</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Chipping free process for combination of narrow saw street (60um) and thick wafer (600um) sawing process</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Amri, Mohd Syahrin ; Liew, David ; Harun, Fuaida</creator><creatorcontrib>Amri, Mohd Syahrin ; Liew, David ; Harun, Fuaida</creatorcontrib><description>Chipping free is a dream for wafer sawing process. With current high complexity of wafer technology plus the drive for cost reduction by narrowing the saw street width, it is a challenge which requires huge effort for wafer sawing process to achieve chipping free process. Higher density of metallization causing higher blade loading during mechanical sawing. This leads to chipping penetrating under the guard ring and damaging the active area. This paper will share all the activities towards chipping free process on a device involving optimization through mechanical sawing, infra red camera and laser grooving process. Blade selection involving various diamond grit size, different concentration, slit design and low k types only able to minimize the occurrence but not totally eliminate it. Finally by performing laser grooving, significant results were achieved with zero chipping occurrences. In addition, suitable laser frequency selection is also important to ensure the best performance. In this case higher frequency laser grooving in combination with mechanical sawing process found to be able to meet the requirement.</description><identifier>ISSN: 1089-8190</identifier><identifier>ISBN: 9781424488254</identifier><identifier>ISBN: 1424488257</identifier><identifier>EISSN: 2576-9626</identifier><identifier>EISBN: 1424488273</identifier><identifier>EISBN: 9781424488278</identifier><identifier>EISBN: 9781424488261</identifier><identifier>EISBN: 1424488265</identifier><identifier>DOI: 10.1109/IEMT.2010.5746667</identifier><language>eng</language><publisher>IEEE</publisher><subject>Aluminum ; Blades ; chipping/peeling free ; Diamond-like carbon ; Laser applications ; laser grooving ; Optimization ; Sawing ; seal ring</subject><ispartof>2010 34th IEEE/CPMT International Electronic Manufacturing Technology Symposium (IEMT), 2010, p.1-5</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5746667$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5746667$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Amri, Mohd Syahrin</creatorcontrib><creatorcontrib>Liew, David</creatorcontrib><creatorcontrib>Harun, Fuaida</creatorcontrib><title>Chipping free process for combination of narrow saw street (60um) and thick wafer (600um) sawing process</title><title>2010 34th IEEE/CPMT International Electronic Manufacturing Technology Symposium (IEMT)</title><addtitle>IEMT</addtitle><description>Chipping free is a dream for wafer sawing process. With current high complexity of wafer technology plus the drive for cost reduction by narrowing the saw street width, it is a challenge which requires huge effort for wafer sawing process to achieve chipping free process. Higher density of metallization causing higher blade loading during mechanical sawing. This leads to chipping penetrating under the guard ring and damaging the active area. This paper will share all the activities towards chipping free process on a device involving optimization through mechanical sawing, infra red camera and laser grooving process. Blade selection involving various diamond grit size, different concentration, slit design and low k types only able to minimize the occurrence but not totally eliminate it. Finally by performing laser grooving, significant results were achieved with zero chipping occurrences. In addition, suitable laser frequency selection is also important to ensure the best performance. In this case higher frequency laser grooving in combination with mechanical sawing process found to be able to meet the requirement.</description><subject>Aluminum</subject><subject>Blades</subject><subject>chipping/peeling free</subject><subject>Diamond-like carbon</subject><subject>Laser applications</subject><subject>laser grooving</subject><subject>Optimization</subject><subject>Sawing</subject><subject>seal ring</subject><issn>1089-8190</issn><issn>2576-9626</issn><isbn>9781424488254</isbn><isbn>1424488257</isbn><isbn>1424488273</isbn><isbn>9781424488278</isbn><isbn>9781424488261</isbn><isbn>1424488265</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2010</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo1kEtPwzAQhM1Loi39AYiLj3BIWTuOH0dUFahUxKX3yrHXxEAecoIq_j0plMNqtDOj7zCEXDNYMAbmfr162S44jG-hhJRSnZApE1wIrbnKT8mEF0pmRnJ5RuZG6f-sEOdkwkCbTDMDl2Ta9-8AHECoCamWVey62LzRkBBpl1qHfU9Dm6hr6zI2dohtQ9tAG5tSu6e9HW8YuwO9lfBV31HbeDpU0X3QvQ2YDvavPzYP3CPyilwE-9nj_Kgzsn1cbZfP2eb1ab182GTRwJAJboKXoWQW0Ze5UBwKXSoVNHov0aMwhkNw3uWc5b7UyJ3VRWmcVpxblc_IzR82IuKuS7G26Xt3HCz_AbwzW5o</recordid><startdate>201011</startdate><enddate>201011</enddate><creator>Amri, Mohd Syahrin</creator><creator>Liew, David</creator><creator>Harun, Fuaida</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>201011</creationdate><title>Chipping free process for combination of narrow saw street (60um) and thick wafer (600um) sawing process</title><author>Amri, Mohd Syahrin ; Liew, David ; Harun, Fuaida</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-429fd6fb1aeedb3472058b77f8edd6ede49920fcdc3213db8e2ca85b9c8722a73</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Aluminum</topic><topic>Blades</topic><topic>chipping/peeling free</topic><topic>Diamond-like carbon</topic><topic>Laser applications</topic><topic>laser grooving</topic><topic>Optimization</topic><topic>Sawing</topic><topic>seal ring</topic><toplevel>online_resources</toplevel><creatorcontrib>Amri, Mohd Syahrin</creatorcontrib><creatorcontrib>Liew, David</creatorcontrib><creatorcontrib>Harun, Fuaida</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Amri, Mohd Syahrin</au><au>Liew, David</au><au>Harun, Fuaida</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Chipping free process for combination of narrow saw street (60um) and thick wafer (600um) sawing process</atitle><btitle>2010 34th IEEE/CPMT International Electronic Manufacturing Technology Symposium (IEMT)</btitle><stitle>IEMT</stitle><date>2010-11</date><risdate>2010</risdate><spage>1</spage><epage>5</epage><pages>1-5</pages><issn>1089-8190</issn><eissn>2576-9626</eissn><isbn>9781424488254</isbn><isbn>1424488257</isbn><eisbn>1424488273</eisbn><eisbn>9781424488278</eisbn><eisbn>9781424488261</eisbn><eisbn>1424488265</eisbn><abstract>Chipping free is a dream for wafer sawing process. With current high complexity of wafer technology plus the drive for cost reduction by narrowing the saw street width, it is a challenge which requires huge effort for wafer sawing process to achieve chipping free process. Higher density of metallization causing higher blade loading during mechanical sawing. This leads to chipping penetrating under the guard ring and damaging the active area. This paper will share all the activities towards chipping free process on a device involving optimization through mechanical sawing, infra red camera and laser grooving process. Blade selection involving various diamond grit size, different concentration, slit design and low k types only able to minimize the occurrence but not totally eliminate it. Finally by performing laser grooving, significant results were achieved with zero chipping occurrences. In addition, suitable laser frequency selection is also important to ensure the best performance. In this case higher frequency laser grooving in combination with mechanical sawing process found to be able to meet the requirement.</abstract><pub>IEEE</pub><doi>10.1109/IEMT.2010.5746667</doi><tpages>5</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 1089-8190
ispartof 2010 34th IEEE/CPMT International Electronic Manufacturing Technology Symposium (IEMT), 2010, p.1-5
issn 1089-8190
2576-9626
language eng
recordid cdi_ieee_primary_5746667
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Aluminum
Blades
chipping/peeling free
Diamond-like carbon
Laser applications
laser grooving
Optimization
Sawing
seal ring
title Chipping free process for combination of narrow saw street (60um) and thick wafer (600um) sawing process
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-28T13%3A35%3A09IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Chipping%20free%20process%20for%20combination%20of%20narrow%20saw%20street%20(60um)%20and%20thick%20wafer%20(600um)%20sawing%20process&rft.btitle=2010%2034th%20IEEE/CPMT%20International%20Electronic%20Manufacturing%20Technology%20Symposium%20(IEMT)&rft.au=Amri,%20Mohd%20Syahrin&rft.date=2010-11&rft.spage=1&rft.epage=5&rft.pages=1-5&rft.issn=1089-8190&rft.eissn=2576-9626&rft.isbn=9781424488254&rft.isbn_list=1424488257&rft_id=info:doi/10.1109/IEMT.2010.5746667&rft_dat=%3Cieee_6IE%3E5746667%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&rft.eisbn=1424488273&rft.eisbn_list=9781424488278&rft.eisbn_list=9781424488261&rft.eisbn_list=1424488265&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=5746667&rfr_iscdi=true