The test generation for pulse-induced crosstalk faults

It is considered some approach to pulse-induced crosstalk faults test generation which is based on multi-valued logic and genetic algorithm application. Experimental results for combinational circuits showed an effectiveness of suggested solution in the sense of high fault coverage.

Bibliographische Detailangaben

Hauptverfasser:	Skobtsov, Y A, Skobtsov, V Y, Nasser, I K M
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Circuit faults Crosstalk Crosstalk fault Delay Genetic algorithms Integrated circuit modeling test generation Testing Very large scale integration
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