Multiline material parameter extraction method performance analysis
This paper presents a performance analysis of a multiline material parameter extraction method. The multiline method is a newly developed technique for the characterization of printable electronics structures and integrated microwave structures, with dramatically improved accuracy of the extracted m...
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| creator | Rasku, A Sillanpää, Hannu Hiltunen, I Makinen, R |
| description | This paper presents a performance analysis of a multiline material parameter extraction method. The multiline method is a newly developed technique for the characterization of printable electronics structures and integrated microwave structures, with dramatically improved accuracy of the extracted material parameters. An analysis of the performance of three error-box models used with the multiline material parameter extraction method in characterizing printable electronics structures is presented. The effects of variations in the conductivity and dimensions of the transmission lines on the performance of the multiline extraction method are investigated. The characterization method is validated with the error-box models using fullwave simulation data, after which it is applied to the characterization of printed electronics structures. Compared to traditional characterization methods, greatly improved accuracy is achieved over a frequency range of 0-20 GHz. |
| format | Conference Proceeding |
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The multiline method is a newly developed technique for the characterization of printable electronics structures and integrated microwave structures, with dramatically improved accuracy of the extracted material parameters. An analysis of the performance of three error-box models used with the multiline material parameter extraction method in characterizing printable electronics structures is presented. The effects of variations in the conductivity and dimensions of the transmission lines on the performance of the multiline extraction method are investigated. The characterization method is validated with the error-box models using fullwave simulation data, after which it is applied to the characterization of printed electronics structures. Compared to traditional characterization methods, greatly improved accuracy is achieved over a frequency range of 0-20 GHz.</description><identifier>ISSN: 2165-4727</identifier><identifier>ISBN: 9781424475902</identifier><identifier>ISBN: 1424475902</identifier><identifier>EISSN: 2165-4743</identifier><identifier>EISBN: 9781902339222</identifier><identifier>EISBN: 9784902339215</identifier><identifier>EISBN: 4902339218</identifier><language>eng</language><publisher>IEEE</publisher><subject>Conductivity ; Data models ; Impedance ; Materials ; Microwave measurement ; Parameter extraction ; Power transmission lines ; Transmission line measurements ; transmission lines</subject><ispartof>2010 Asia-Pacific Microwave Conference, 2010, p.1905-1908</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5728340$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5728340$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Rasku, A</creatorcontrib><creatorcontrib>Sillanpää, Hannu</creatorcontrib><creatorcontrib>Hiltunen, I</creatorcontrib><creatorcontrib>Makinen, R</creatorcontrib><title>Multiline material parameter extraction method performance analysis</title><title>2010 Asia-Pacific Microwave Conference</title><addtitle>APMC</addtitle><description>This paper presents a performance analysis of a multiline material parameter extraction method. The multiline method is a newly developed technique for the characterization of printable electronics structures and integrated microwave structures, with dramatically improved accuracy of the extracted material parameters. An analysis of the performance of three error-box models used with the multiline material parameter extraction method in characterizing printable electronics structures is presented. The effects of variations in the conductivity and dimensions of the transmission lines on the performance of the multiline extraction method are investigated. The characterization method is validated with the error-box models using fullwave simulation data, after which it is applied to the characterization of printed electronics structures. Compared to traditional characterization methods, greatly improved accuracy is achieved over a frequency range of 0-20 GHz.</description><subject>Conductivity</subject><subject>Data models</subject><subject>Impedance</subject><subject>Materials</subject><subject>Microwave measurement</subject><subject>Parameter extraction</subject><subject>Power transmission lines</subject><subject>Transmission line measurements</subject><subject>transmission lines</subject><issn>2165-4727</issn><issn>2165-4743</issn><isbn>9781424475902</isbn><isbn>1424475902</isbn><isbn>9781902339222</isbn><isbn>9784902339215</isbn><isbn>4902339218</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2010</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNp9ys0KwjAQBOD4BxbtE3jJCxTSTWrac1G8ePMuS91iJGlLEsG-vQXFo6dh5psZSytd5pUAKSsAmLME8n2RKa3k4mMKlNLF9Fj-DPSapSE8hBAgRJ4rmbD6_LTRWNMRdxjJG7R8QI-OpsLpFT020fQdn4Z7f-MD-bb3DruGOHZox2DClq1atIHSb27Y7ni41KfMENF18MahH6-FhlIqIf_rG1uhPKg</recordid><startdate>201012</startdate><enddate>201012</enddate><creator>Rasku, A</creator><creator>Sillanpää, Hannu</creator><creator>Hiltunen, I</creator><creator>Makinen, R</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201012</creationdate><title>Multiline material parameter extraction method performance analysis</title><author>Rasku, A ; Sillanpää, Hannu ; Hiltunen, I ; Makinen, R</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-ieee_primary_57283403</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Conductivity</topic><topic>Data models</topic><topic>Impedance</topic><topic>Materials</topic><topic>Microwave measurement</topic><topic>Parameter extraction</topic><topic>Power transmission lines</topic><topic>Transmission line measurements</topic><topic>transmission lines</topic><toplevel>online_resources</toplevel><creatorcontrib>Rasku, A</creatorcontrib><creatorcontrib>Sillanpää, Hannu</creatorcontrib><creatorcontrib>Hiltunen, I</creatorcontrib><creatorcontrib>Makinen, R</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Rasku, A</au><au>Sillanpää, Hannu</au><au>Hiltunen, I</au><au>Makinen, R</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Multiline material parameter extraction method performance analysis</atitle><btitle>2010 Asia-Pacific Microwave Conference</btitle><stitle>APMC</stitle><date>2010-12</date><risdate>2010</risdate><spage>1905</spage><epage>1908</epage><pages>1905-1908</pages><issn>2165-4727</issn><eissn>2165-4743</eissn><isbn>9781424475902</isbn><isbn>1424475902</isbn><eisbn>9781902339222</eisbn><eisbn>9784902339215</eisbn><eisbn>4902339218</eisbn><abstract>This paper presents a performance analysis of a multiline material parameter extraction method. The multiline method is a newly developed technique for the characterization of printable electronics structures and integrated microwave structures, with dramatically improved accuracy of the extracted material parameters. An analysis of the performance of three error-box models used with the multiline material parameter extraction method in characterizing printable electronics structures is presented. The effects of variations in the conductivity and dimensions of the transmission lines on the performance of the multiline extraction method are investigated. The characterization method is validated with the error-box models using fullwave simulation data, after which it is applied to the characterization of printed electronics structures. Compared to traditional characterization methods, greatly improved accuracy is achieved over a frequency range of 0-20 GHz.</abstract><pub>IEEE</pub></addata></record> |
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| language | eng |
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| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Conductivity Data models Impedance Materials Microwave measurement Parameter extraction Power transmission lines Transmission line measurements transmission lines |
| title | Multiline material parameter extraction method performance analysis |
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