A Robust and Reconfigurable Multi-mode Power Gating Architecture

Multi-threshold CMOS is a very effective technique for reducing standby leakage power during long periods of inactivity. Recently, a power-gating scheme was presented to support multiple power-off modes and reduce the leakage power during short periods of inactivity. However, this scheme suffers fro...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Zhang, Z, Kavousianos, X, Chakrabarty, K, Tsiatouhas, Y
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 285
container_issue
container_start_page 280
container_title
container_volume
creator Zhang, Z
Kavousianos, X
Chakrabarty, K
Tsiatouhas, Y
description Multi-threshold CMOS is a very effective technique for reducing standby leakage power during long periods of inactivity. Recently, a power-gating scheme was presented to support multiple power-off modes and reduce the leakage power during short periods of inactivity. However, this scheme suffers from high sensitivity to process variations, which impedes manufacturability and also limits its applicability to at most two intermediate power-off modes. We propose a new power-gating technique that is tolerant to process variations and scalable to more than two intermediate power-off modes. In addition, the proposed design requires minimum design effort and offers greater power reduction and smaller area cost than the previous method. Analysis and extensive simulation results demonstrate the effectiveness of the proposed design.
doi_str_mv 10.1109/VLSID.2011.29
format Conference Proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_5718815</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5718815</ieee_id><sourcerecordid>5718815</sourcerecordid><originalsourceid>FETCH-LOGICAL-i90t-23c359a0f42c4293d3b7df04f1913b36b073d1fd0a9127193c1aae37b8ce2ebc3</originalsourceid><addsrcrecordid>eNotzstOAjEUgOF6SwRk6cpNX2DwnJ6ZXnYSUCTBaJC4JW3nDNYAY-YS49troqt_9-UX4hphggju9m31upxPFCBOlDsRY2csGO2KnHKrTsVAkYVMO0VnYogalc1JGTwXAwRNmdPaXIph234AgC3ADMTdVK7r0Led9MdSrjnWxyrt-saHPcunft-l7FCXLF_qL27kwnfpuJPTJr6njmPXN3wlLiq_b3n835HYPNxvZo_Z6nmxnE1XWXLQZYoiFc5DlauYK0clBVNWkFfokALpAIZKrErwDn-HHUX0nskEG1lxiDQSN39sYubtZ5MOvvneFgatxYJ-AOSxTD0</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>A Robust and Reconfigurable Multi-mode Power Gating Architecture</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Zhang, Z ; Kavousianos, X ; Chakrabarty, K ; Tsiatouhas, Y</creator><creatorcontrib>Zhang, Z ; Kavousianos, X ; Chakrabarty, K ; Tsiatouhas, Y</creatorcontrib><description>Multi-threshold CMOS is a very effective technique for reducing standby leakage power during long periods of inactivity. Recently, a power-gating scheme was presented to support multiple power-off modes and reduce the leakage power during short periods of inactivity. However, this scheme suffers from high sensitivity to process variations, which impedes manufacturability and also limits its applicability to at most two intermediate power-off modes. We propose a new power-gating technique that is tolerant to process variations and scalable to more than two intermediate power-off modes. In addition, the proposed design requires minimum design effort and offers greater power reduction and smaller area cost than the previous method. Analysis and extensive simulation results demonstrate the effectiveness of the proposed design.</description><identifier>ISSN: 1063-9667</identifier><identifier>ISBN: 1612843271</identifier><identifier>ISBN: 9781612843278</identifier><identifier>EISSN: 2380-6923</identifier><identifier>EISBN: 9780769543482</identifier><identifier>EISBN: 0769543480</identifier><identifier>DOI: 10.1109/VLSID.2011.29</identifier><language>eng</language><publisher>IEEE</publisher><subject>Generators ; Leakage current ; Logic gates ; Mathematical model ; Power demand ; Threshold voltage ; Transistors</subject><ispartof>2011 24th Internatioal Conference on VLSI Design, 2011, p.280-285</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5718815$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,777,781,786,787,2052,27906,54901</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5718815$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Zhang, Z</creatorcontrib><creatorcontrib>Kavousianos, X</creatorcontrib><creatorcontrib>Chakrabarty, K</creatorcontrib><creatorcontrib>Tsiatouhas, Y</creatorcontrib><title>A Robust and Reconfigurable Multi-mode Power Gating Architecture</title><title>2011 24th Internatioal Conference on VLSI Design</title><addtitle>VLSI Design</addtitle><description>Multi-threshold CMOS is a very effective technique for reducing standby leakage power during long periods of inactivity. Recently, a power-gating scheme was presented to support multiple power-off modes and reduce the leakage power during short periods of inactivity. However, this scheme suffers from high sensitivity to process variations, which impedes manufacturability and also limits its applicability to at most two intermediate power-off modes. We propose a new power-gating technique that is tolerant to process variations and scalable to more than two intermediate power-off modes. In addition, the proposed design requires minimum design effort and offers greater power reduction and smaller area cost than the previous method. Analysis and extensive simulation results demonstrate the effectiveness of the proposed design.</description><subject>Generators</subject><subject>Leakage current</subject><subject>Logic gates</subject><subject>Mathematical model</subject><subject>Power demand</subject><subject>Threshold voltage</subject><subject>Transistors</subject><issn>1063-9667</issn><issn>2380-6923</issn><isbn>1612843271</isbn><isbn>9781612843278</isbn><isbn>9780769543482</isbn><isbn>0769543480</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2011</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotzstOAjEUgOF6SwRk6cpNX2DwnJ6ZXnYSUCTBaJC4JW3nDNYAY-YS49troqt_9-UX4hphggju9m31upxPFCBOlDsRY2csGO2KnHKrTsVAkYVMO0VnYogalc1JGTwXAwRNmdPaXIph234AgC3ADMTdVK7r0Led9MdSrjnWxyrt-saHPcunft-l7FCXLF_qL27kwnfpuJPTJr6njmPXN3wlLiq_b3n835HYPNxvZo_Z6nmxnE1XWXLQZYoiFc5DlauYK0clBVNWkFfokALpAIZKrErwDn-HHUX0nskEG1lxiDQSN39sYubtZ5MOvvneFgatxYJ-AOSxTD0</recordid><startdate>201101</startdate><enddate>201101</enddate><creator>Zhang, Z</creator><creator>Kavousianos, X</creator><creator>Chakrabarty, K</creator><creator>Tsiatouhas, Y</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201101</creationdate><title>A Robust and Reconfigurable Multi-mode Power Gating Architecture</title><author>Zhang, Z ; Kavousianos, X ; Chakrabarty, K ; Tsiatouhas, Y</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-23c359a0f42c4293d3b7df04f1913b36b073d1fd0a9127193c1aae37b8ce2ebc3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Generators</topic><topic>Leakage current</topic><topic>Logic gates</topic><topic>Mathematical model</topic><topic>Power demand</topic><topic>Threshold voltage</topic><topic>Transistors</topic><toplevel>online_resources</toplevel><creatorcontrib>Zhang, Z</creatorcontrib><creatorcontrib>Kavousianos, X</creatorcontrib><creatorcontrib>Chakrabarty, K</creatorcontrib><creatorcontrib>Tsiatouhas, Y</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Zhang, Z</au><au>Kavousianos, X</au><au>Chakrabarty, K</au><au>Tsiatouhas, Y</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>A Robust and Reconfigurable Multi-mode Power Gating Architecture</atitle><btitle>2011 24th Internatioal Conference on VLSI Design</btitle><stitle>VLSI Design</stitle><date>2011-01</date><risdate>2011</risdate><spage>280</spage><epage>285</epage><pages>280-285</pages><issn>1063-9667</issn><eissn>2380-6923</eissn><isbn>1612843271</isbn><isbn>9781612843278</isbn><eisbn>9780769543482</eisbn><eisbn>0769543480</eisbn><abstract>Multi-threshold CMOS is a very effective technique for reducing standby leakage power during long periods of inactivity. Recently, a power-gating scheme was presented to support multiple power-off modes and reduce the leakage power during short periods of inactivity. However, this scheme suffers from high sensitivity to process variations, which impedes manufacturability and also limits its applicability to at most two intermediate power-off modes. We propose a new power-gating technique that is tolerant to process variations and scalable to more than two intermediate power-off modes. In addition, the proposed design requires minimum design effort and offers greater power reduction and smaller area cost than the previous method. Analysis and extensive simulation results demonstrate the effectiveness of the proposed design.</abstract><pub>IEEE</pub><doi>10.1109/VLSID.2011.29</doi><tpages>6</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 1063-9667
ispartof 2011 24th Internatioal Conference on VLSI Design, 2011, p.280-285
issn 1063-9667
2380-6923
language eng
recordid cdi_ieee_primary_5718815
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Generators
Leakage current
Logic gates
Mathematical model
Power demand
Threshold voltage
Transistors
title A Robust and Reconfigurable Multi-mode Power Gating Architecture
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-17T13%3A28%3A22IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=A%20Robust%20and%20Reconfigurable%20Multi-mode%20Power%20Gating%20Architecture&rft.btitle=2011%2024th%20Internatioal%20Conference%20on%20VLSI%20Design&rft.au=Zhang,%20Z&rft.date=2011-01&rft.spage=280&rft.epage=285&rft.pages=280-285&rft.issn=1063-9667&rft.eissn=2380-6923&rft.isbn=1612843271&rft.isbn_list=9781612843278&rft_id=info:doi/10.1109/VLSID.2011.29&rft_dat=%3Cieee_6IE%3E5718815%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&rft.eisbn=9780769543482&rft.eisbn_list=0769543480&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=5718815&rfr_iscdi=true