Methods of investigation of the properties of the optoelectronic devices with use of atomic force microscopy

In the modern world, the influence the optoelectronic devices on the communications methods are still increasing. Therefore it is very important to And appropriate techniques for design, building, testing, measuring and packaging. The measurement techniques of these devices in nanometer scale help u...

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Bibliographische Detailangaben

Hauptverfasser:	Gajewski, Krzysztof, Wielgoszewski, Grzegorz
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Laser modes Measurement by laser beam Microscopy Surfaces
Online-Zugang:	Volltext bestellen
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