Stressed jitter analysis for physical link characterization
A link-path analysis approach is introduced in this paper based on the frequency-domain S-parameters of the link path. Different jitter components are also modelled and can be injected into the analysis to characterize the link responses to different types of jitter input. Stressed link path analysi...
Gespeichert in:
Hauptverfasser: | , , , |
---|---|
Format: | Tagungsbericht |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 572 |
---|---|
container_issue | |
container_start_page | 568 |
container_title | |
container_volume | |
creator | Radhakrishnan, N Achkir, B Jun Fan Drewniak, J L |
description | A link-path analysis approach is introduced in this paper based on the frequency-domain S-parameters of the link path. Different jitter components are also modelled and can be injected into the analysis to characterize the link responses to different types of jitter input. Stressed link path analysis can be very useful in practical engineering designs in terms of link path optimization, device selection and qualification, etc. |
doi_str_mv | 10.1109/ISEMC.2010.5711339 |
format | Conference Proceeding |
fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_5711339</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5711339</ieee_id><sourcerecordid>5711339</sourcerecordid><originalsourceid>FETCH-LOGICAL-i175t-e9af74ec111d1c7f8e111ac7a44eaca4e5a6b5b5271e0b548dad3ecf9af9cbda3</originalsourceid><addsrcrecordid>eNpVUMtOwzAQNI9KRCU_ABf_QIo3tuNYnFBVoFIRh4LErdo4G9UlpJWdS_l6LFEhsZeZ1cyORsvYDYgZgLB3y_XiZT4rRdq1AZDSnrHcmhpUqVQlhTHnLCtB1wUA1Bf_NC0v_zTxMWFZLYtKaaXsFctj3Ik0ujQSIGP36zFQjNTynR9HChwH7I_RR97tAz9sE3XY894Pn9xtMaBLJv-No98P12zSYR8pP-GUvT8u3ubPxer1aTl_WBUejB4LstgZRS4VbcGZrqbE0BlUitChIo1Vo5vUCEg0WtUttpJcl86sa1qUU3b7m-uJaHMI_gvDcXN6i_wBcQVRlw</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Stressed jitter analysis for physical link characterization</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Radhakrishnan, N ; Achkir, B ; Jun Fan ; Drewniak, J L</creator><creatorcontrib>Radhakrishnan, N ; Achkir, B ; Jun Fan ; Drewniak, J L</creatorcontrib><description>A link-path analysis approach is introduced in this paper based on the frequency-domain S-parameters of the link path. Different jitter components are also modelled and can be injected into the analysis to characterize the link responses to different types of jitter input. Stressed link path analysis can be very useful in practical engineering designs in terms of link path optimization, device selection and qualification, etc.</description><identifier>ISSN: 2158-110X</identifier><identifier>ISBN: 9781424463053</identifier><identifier>ISBN: 142446305X</identifier><identifier>EISSN: 2158-1118</identifier><identifier>EISBN: 9781424463077</identifier><identifier>EISBN: 1424463084</identifier><identifier>EISBN: 1424463076</identifier><identifier>EISBN: 9781424463084</identifier><identifier>DOI: 10.1109/ISEMC.2010.5711339</identifier><identifier>LCCN: 83-645449</identifier><language>eng</language><publisher>IEEE</publisher><subject>Bit error rate ; Histograms ; Jitter ; Mathematical model ; Noise ; Receivers ; Signal analysis</subject><ispartof>2010 IEEE International Symposium on Electromagnetic Compatibility, 2010, p.568-572</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5711339$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5711339$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Radhakrishnan, N</creatorcontrib><creatorcontrib>Achkir, B</creatorcontrib><creatorcontrib>Jun Fan</creatorcontrib><creatorcontrib>Drewniak, J L</creatorcontrib><title>Stressed jitter analysis for physical link characterization</title><title>2010 IEEE International Symposium on Electromagnetic Compatibility</title><addtitle>ISEMC</addtitle><description>A link-path analysis approach is introduced in this paper based on the frequency-domain S-parameters of the link path. Different jitter components are also modelled and can be injected into the analysis to characterize the link responses to different types of jitter input. Stressed link path analysis can be very useful in practical engineering designs in terms of link path optimization, device selection and qualification, etc.</description><subject>Bit error rate</subject><subject>Histograms</subject><subject>Jitter</subject><subject>Mathematical model</subject><subject>Noise</subject><subject>Receivers</subject><subject>Signal analysis</subject><issn>2158-110X</issn><issn>2158-1118</issn><isbn>9781424463053</isbn><isbn>142446305X</isbn><isbn>9781424463077</isbn><isbn>1424463084</isbn><isbn>1424463076</isbn><isbn>9781424463084</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2010</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpVUMtOwzAQNI9KRCU_ABf_QIo3tuNYnFBVoFIRh4LErdo4G9UlpJWdS_l6LFEhsZeZ1cyORsvYDYgZgLB3y_XiZT4rRdq1AZDSnrHcmhpUqVQlhTHnLCtB1wUA1Bf_NC0v_zTxMWFZLYtKaaXsFctj3Ik0ujQSIGP36zFQjNTynR9HChwH7I_RR97tAz9sE3XY894Pn9xtMaBLJv-No98P12zSYR8pP-GUvT8u3ubPxer1aTl_WBUejB4LstgZRS4VbcGZrqbE0BlUitChIo1Vo5vUCEg0WtUttpJcl86sa1qUU3b7m-uJaHMI_gvDcXN6i_wBcQVRlw</recordid><startdate>201007</startdate><enddate>201007</enddate><creator>Radhakrishnan, N</creator><creator>Achkir, B</creator><creator>Jun Fan</creator><creator>Drewniak, J L</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>201007</creationdate><title>Stressed jitter analysis for physical link characterization</title><author>Radhakrishnan, N ; Achkir, B ; Jun Fan ; Drewniak, J L</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-e9af74ec111d1c7f8e111ac7a44eaca4e5a6b5b5271e0b548dad3ecf9af9cbda3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Bit error rate</topic><topic>Histograms</topic><topic>Jitter</topic><topic>Mathematical model</topic><topic>Noise</topic><topic>Receivers</topic><topic>Signal analysis</topic><toplevel>online_resources</toplevel><creatorcontrib>Radhakrishnan, N</creatorcontrib><creatorcontrib>Achkir, B</creatorcontrib><creatorcontrib>Jun Fan</creatorcontrib><creatorcontrib>Drewniak, J L</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Radhakrishnan, N</au><au>Achkir, B</au><au>Jun Fan</au><au>Drewniak, J L</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Stressed jitter analysis for physical link characterization</atitle><btitle>2010 IEEE International Symposium on Electromagnetic Compatibility</btitle><stitle>ISEMC</stitle><date>2010-07</date><risdate>2010</risdate><spage>568</spage><epage>572</epage><pages>568-572</pages><issn>2158-110X</issn><eissn>2158-1118</eissn><isbn>9781424463053</isbn><isbn>142446305X</isbn><eisbn>9781424463077</eisbn><eisbn>1424463084</eisbn><eisbn>1424463076</eisbn><eisbn>9781424463084</eisbn><abstract>A link-path analysis approach is introduced in this paper based on the frequency-domain S-parameters of the link path. Different jitter components are also modelled and can be injected into the analysis to characterize the link responses to different types of jitter input. Stressed link path analysis can be very useful in practical engineering designs in terms of link path optimization, device selection and qualification, etc.</abstract><pub>IEEE</pub><doi>10.1109/ISEMC.2010.5711339</doi><tpages>5</tpages></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 2158-110X |
ispartof | 2010 IEEE International Symposium on Electromagnetic Compatibility, 2010, p.568-572 |
issn | 2158-110X 2158-1118 |
language | eng |
recordid | cdi_ieee_primary_5711339 |
source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Bit error rate Histograms Jitter Mathematical model Noise Receivers Signal analysis |
title | Stressed jitter analysis for physical link characterization |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-04T23%3A47%3A59IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Stressed%20jitter%20analysis%20for%20physical%20link%20characterization&rft.btitle=2010%20IEEE%20International%20Symposium%20on%20Electromagnetic%20Compatibility&rft.au=Radhakrishnan,%20N&rft.date=2010-07&rft.spage=568&rft.epage=572&rft.pages=568-572&rft.issn=2158-110X&rft.eissn=2158-1118&rft.isbn=9781424463053&rft.isbn_list=142446305X&rft_id=info:doi/10.1109/ISEMC.2010.5711339&rft_dat=%3Cieee_6IE%3E5711339%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&rft.eisbn=9781424463077&rft.eisbn_list=1424463084&rft.eisbn_list=1424463076&rft.eisbn_list=9781424463084&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=5711339&rfr_iscdi=true |