Development on surface defect holes inspection based on image recognition
A novel method of surface defect holes inspection was proposed based on both 2D and 3D image processing & recognition. In this method, the first step is to detect the holes in the binary image converted by the 3D image which is scanned by a 3D laser scanner, and the second step is to confirm the...
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| creator | Houkun Guo Guoliang Xiong Zhen Guo Xiaohui Hu |
| description | A novel method of surface defect holes inspection was proposed based on both 2D and 3D image processing & recognition. In this method, the first step is to detect the holes in the binary image converted by the 3D image which is scanned by a 3D laser scanner, and the second step is to confirm the defect holes by dimension calculation using the data of the scanned 3D image. The software is developed in MATLAB. |
| doi_str_mv | 10.1109/AIM.2010.5695748 |
| format | Conference Proceeding |
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In this method, the first step is to detect the holes in the binary image converted by the 3D image which is scanned by a 3D laser scanner, and the second step is to confirm the defect holes by dimension calculation using the data of the scanned 3D image. 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In this method, the first step is to detect the holes in the binary image converted by the 3D image which is scanned by a 3D laser scanner, and the second step is to confirm the defect holes by dimension calculation using the data of the scanned 3D image. The software is developed in MATLAB.</description><subject>3D image recognition</subject><subject>defect holes</subject><subject>Detectors</subject><subject>Image recognition</subject><subject>laser scanner</subject><subject>Measurement by laser beam</subject><subject>Surface emitting lasers</subject><subject>Three dimensional displays</subject><issn>2159-6247</issn><issn>2159-6255</issn><isbn>1424480310</isbn><isbn>9781424480319</isbn><isbn>1424480329</isbn><isbn>9781424480302</isbn><isbn>9781424480326</isbn><isbn>1424480302</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2010</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpFkEtPwzAQhM1LopTekbj4D6T4tX4cq1IgUhEXOFeOsylGaVLFAYl_jysq2Mtq5luNRkvIDWdzzpm7W5TPc8GyAu3AKHtCrrgSSlkmhTslE8HBFVoAnP0Dzs7_gDKXZJbSB8sDwihQE1Le4xe2_X6H3Uj7jqbPofEBaY0NhpG-9y0mGru0zypmXvmE9eEw7vwW6YCh33bxgK7JRePbhLPjnpK3h9Xr8qlYvzyWy8W6iNzAWBjnnK05ehaC9I2XArSE2kptAaxCGWyjq-w5xYzQYIQ0oDVqzn0F3Mkpuf3NjYi42Q-5yPC9Ob5E_gANQE9e</recordid><startdate>201007</startdate><enddate>201007</enddate><creator>Houkun Guo</creator><creator>Guoliang Xiong</creator><creator>Zhen Guo</creator><creator>Xiaohui Hu</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201007</creationdate><title>Development on surface defect holes inspection based on image recognition</title><author>Houkun Guo ; Guoliang Xiong ; Zhen Guo ; Xiaohui Hu</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-79998d1ea0cc3afa325635d83685584e3c8f6b56394072657237566e611ab5193</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2010</creationdate><topic>3D image recognition</topic><topic>defect holes</topic><topic>Detectors</topic><topic>Image recognition</topic><topic>laser scanner</topic><topic>Measurement by laser beam</topic><topic>Surface emitting lasers</topic><topic>Three dimensional displays</topic><toplevel>online_resources</toplevel><creatorcontrib>Houkun Guo</creatorcontrib><creatorcontrib>Guoliang Xiong</creatorcontrib><creatorcontrib>Zhen Guo</creatorcontrib><creatorcontrib>Xiaohui Hu</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Houkun Guo</au><au>Guoliang Xiong</au><au>Zhen Guo</au><au>Xiaohui Hu</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Development on surface defect holes inspection based on image recognition</atitle><btitle>2010 IEEE/ASME International Conference on Advanced Intelligent Mechatronics</btitle><stitle>AIM</stitle><date>2010-07</date><risdate>2010</risdate><spage>623</spage><epage>626</epage><pages>623-626</pages><issn>2159-6247</issn><eissn>2159-6255</eissn><isbn>1424480310</isbn><isbn>9781424480319</isbn><eisbn>1424480329</eisbn><eisbn>9781424480302</eisbn><eisbn>9781424480326</eisbn><eisbn>1424480302</eisbn><abstract>A novel method of surface defect holes inspection was proposed based on both 2D and 3D image processing & recognition. In this method, the first step is to detect the holes in the binary image converted by the 3D image which is scanned by a 3D laser scanner, and the second step is to confirm the defect holes by dimension calculation using the data of the scanned 3D image. The software is developed in MATLAB.</abstract><pub>IEEE</pub><doi>10.1109/AIM.2010.5695748</doi><tpages>4</tpages></addata></record> |
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| ispartof | 2010 IEEE/ASME International Conference on Advanced Intelligent Mechatronics, 2010, p.623-626 |
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| language | eng |
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| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | 3D image recognition defect holes Detectors Image recognition laser scanner Measurement by laser beam Surface emitting lasers Three dimensional displays |
| title | Development on surface defect holes inspection based on image recognition |
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