AVF Stressmark: Towards an Automated Methodology for Bounding the Worst-Case Vulnerability to Soft Errors

Soft error reliability is increasingly becoming a first-order design concern for microprocessors, as a result of higher transistor counts, shrinking device geometries and lowering of operating voltages. It is important for designers to be able to validate whether the Soft Error Rate (SER) targets of...

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Hauptverfasser:	Nair, Arun Arvind, John, Lizy Kurian, Eeckhout, Lieven
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	AVF stressmark Circuit faults Computer systems organization > Dependable and fault-tolerant systems and networks General and reference > Cross-computing tools and techniques > Performance Generators Genetic algorithms Hardware > Hardware test Hardware > Robustness Microarchitecture Networks > Network performance evaluation Registers Reliability Safety soft errors
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