Derivation of Optimal Test Set for Detection of Multiple Missing-Gate Faults in Reversible Circuits

Logic synthesis of reversible circuits has received considerable attention in the light of advances recently made in quantum computation. Implementation of a reversible circuit is envisaged by deploying several special types of quantum gates, such as k-CNOT. Although the classical stuck-at fault mod...

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Bibliographische Detailangaben

Hauptverfasser:	Kole, D K, Rahaman, H, Das, D K, Bhattacharya, B B
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Arrays Circuit faults Integrated circuit modeling Logic gates Missing-gate faults Quantum computing reversible logic Semiconductor device modeling testable design Testing universal test set
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