Critical search delay measurement in embedded content addressable memories with BIST

Embedded content addressable memories are very useful in many applications such as network switch, IP filters and longest prefix match search engine, where high speed search is essential. This makes it a necessity to find an efficient self-test methodology in order to measure its internal worst case...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Manikandan, P, Larsen, Bjorn B, Aas, Einar J
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Built-in self-test Circuit faults Computer aided manufacturing Computer architecture critical path Delay match Microprocessors mismatch pseudo CMOS logic search delay speed TCAM Transistors
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