Compact Expressions for Supply Noise Induced Period Jitter of Global Binary Clock Trees
Period jitter plays a critical role in global clock distribution design, because it directly impacts the time available for logic operations between sequential elements. Moreover, time-varying supply noise injected in global clock drivers can worsen the timing margin of critical paths by modulating...
Gespeichert in:
Veröffentlicht in: | IEEE transactions on very large scale integration (VLSI) systems 2012-01, Vol.20 (1), p.66-79 |
---|---|
Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 79 |
---|---|
container_issue | 1 |
container_start_page | 66 |
container_title | IEEE transactions on very large scale integration (VLSI) systems |
container_volume | 20 |
creator | Jinwook Jang Franza, O. Burleson, W. |
description | Period jitter plays a critical role in global clock distribution design, because it directly impacts the time available for logic operations between sequential elements. Moreover, time-varying supply noise injected in global clock drivers can worsen the timing margin of critical paths by modulating period jitter. In the planning stage of global clock distribution for a high-end microprocessor, it is very critical to differentiate and understand the impacts of different design parameters on period jitter. However, it is hard to achieve due to complex relationship among different independent/dependent design parameters: supply noise amplitude, supply noise frequency, clock driver size, physical structures of interconnects, number of clock stages, temperature, process corners, etc. In this paper, we propose sets of analytical expressions which accurately model the behavior of supply noise induced period jitter of global binary clock trees without losing the details of clock distribution design parameters. These accurate expressions and their derivation process are used to provide detailed insight into the relationships between period jitter of binary clock distribution and distribution design parameters with several examples. Also detailed design guidelines for binary clock trees are presented. |
doi_str_mv | 10.1109/TVLSI.2010.2089706 |
format | Article |
fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_ieee_primary_5674124</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5674124</ieee_id><sourcerecordid>2554236301</sourcerecordid><originalsourceid>FETCH-LOGICAL-c423t-4c2364eff51f40e8bf87bf8121297b0b248b501c13685dc3324768e98f042ce63</originalsourceid><addsrcrecordid>eNpdkF1LwzAUhosoOKd_QG-CIHjTmc82vdQy52SosKmXpc1OILNratKC-_dmbuzCwCE55DkvyRNFlwSPCMHZ3eJjNp-OKA49xTJLcXIUDYgQaZyFdRzOOGGxpASfRmferzAmnGd4EH3mdt2WqkPjn9aB98Y2Hmnr0Lxv23qDXqzxgKbNslewRG_gjF2iZ9N14JDVaFLbqqzRg2lKt0F5bdUXWjgAfx6d6LL2cLHfh9H743iRP8Wz18k0v5_FilPWxVxRlnDQWhDNMchKyzQUoYRmaYUrymUlMFGEJVIsFWOUp4mETGrMqYKEDaPbXW7r7HcPvivWxiuo67IB2_uCBCVScilwQK__oSvbuya8rsgIZ1gIyQNEd5By1nsHumidWYfPhaRiq7r4U11sVRd71WHoZp9celXW2pWNMv4wSQVPWcJE4K52nAGAw7VIUk4oZ7_iV4Wh</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>914305584</pqid></control><display><type>article</type><title>Compact Expressions for Supply Noise Induced Period Jitter of Global Binary Clock Trees</title><source>IEEE Electronic Library (IEL)</source><creator>Jinwook Jang ; Franza, O. ; Burleson, W.</creator><creatorcontrib>Jinwook Jang ; Franza, O. ; Burleson, W.</creatorcontrib><description>Period jitter plays a critical role in global clock distribution design, because it directly impacts the time available for logic operations between sequential elements. Moreover, time-varying supply noise injected in global clock drivers can worsen the timing margin of critical paths by modulating period jitter. In the planning stage of global clock distribution for a high-end microprocessor, it is very critical to differentiate and understand the impacts of different design parameters on period jitter. However, it is hard to achieve due to complex relationship among different independent/dependent design parameters: supply noise amplitude, supply noise frequency, clock driver size, physical structures of interconnects, number of clock stages, temperature, process corners, etc. In this paper, we propose sets of analytical expressions which accurately model the behavior of supply noise induced period jitter of global binary clock trees without losing the details of clock distribution design parameters. These accurate expressions and their derivation process are used to provide detailed insight into the relationships between period jitter of binary clock distribution and distribution design parameters with several examples. Also detailed design guidelines for binary clock trees are presented.</description><identifier>ISSN: 1063-8210</identifier><identifier>EISSN: 1557-9999</identifier><identifier>DOI: 10.1109/TVLSI.2010.2089706</identifier><identifier>CODEN: IEVSE9</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Binary clock tree ; Circuit properties ; clock data compensation ; Clock drivers ; clock jitter ; Clocks ; Corners ; Design parameters ; Design. Technologies. Operation analysis. Testing ; Driver circuits ; Electric, optical and optoelectronic circuits ; Electronic circuits ; Electronics ; Exact sciences and technology ; Integrated circuit modeling ; Integrated circuits ; Integrated circuits by function (including memories and processors) ; Jitter ; Microprocessors ; Noise ; Oscillators, resonators, synthetizers ; period jitter ; Power supplies ; Propagation delay ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Very large scale integration ; worst case period jitter</subject><ispartof>IEEE transactions on very large scale integration (VLSI) systems, 2012-01, Vol.20 (1), p.66-79</ispartof><rights>2015 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Jan 2012</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c423t-4c2364eff51f40e8bf87bf8121297b0b248b501c13685dc3324768e98f042ce63</citedby><cites>FETCH-LOGICAL-c423t-4c2364eff51f40e8bf87bf8121297b0b248b501c13685dc3324768e98f042ce63</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5674124$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,777,781,793,4010,27904,27905,27906,54739</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5674124$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=25473635$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Jinwook Jang</creatorcontrib><creatorcontrib>Franza, O.</creatorcontrib><creatorcontrib>Burleson, W.</creatorcontrib><title>Compact Expressions for Supply Noise Induced Period Jitter of Global Binary Clock Trees</title><title>IEEE transactions on very large scale integration (VLSI) systems</title><addtitle>TVLSI</addtitle><description>Period jitter plays a critical role in global clock distribution design, because it directly impacts the time available for logic operations between sequential elements. Moreover, time-varying supply noise injected in global clock drivers can worsen the timing margin of critical paths by modulating period jitter. In the planning stage of global clock distribution for a high-end microprocessor, it is very critical to differentiate and understand the impacts of different design parameters on period jitter. However, it is hard to achieve due to complex relationship among different independent/dependent design parameters: supply noise amplitude, supply noise frequency, clock driver size, physical structures of interconnects, number of clock stages, temperature, process corners, etc. In this paper, we propose sets of analytical expressions which accurately model the behavior of supply noise induced period jitter of global binary clock trees without losing the details of clock distribution design parameters. These accurate expressions and their derivation process are used to provide detailed insight into the relationships between period jitter of binary clock distribution and distribution design parameters with several examples. Also detailed design guidelines for binary clock trees are presented.</description><subject>Applied sciences</subject><subject>Binary clock tree</subject><subject>Circuit properties</subject><subject>clock data compensation</subject><subject>Clock drivers</subject><subject>clock jitter</subject><subject>Clocks</subject><subject>Corners</subject><subject>Design parameters</subject><subject>Design. Technologies. Operation analysis. Testing</subject><subject>Driver circuits</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>Electronic circuits</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Integrated circuit modeling</subject><subject>Integrated circuits</subject><subject>Integrated circuits by function (including memories and processors)</subject><subject>Jitter</subject><subject>Microprocessors</subject><subject>Noise</subject><subject>Oscillators, resonators, synthetizers</subject><subject>period jitter</subject><subject>Power supplies</subject><subject>Propagation delay</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Very large scale integration</subject><subject>worst case period jitter</subject><issn>1063-8210</issn><issn>1557-9999</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkF1LwzAUhosoOKd_QG-CIHjTmc82vdQy52SosKmXpc1OILNratKC-_dmbuzCwCE55DkvyRNFlwSPCMHZ3eJjNp-OKA49xTJLcXIUDYgQaZyFdRzOOGGxpASfRmferzAmnGd4EH3mdt2WqkPjn9aB98Y2Hmnr0Lxv23qDXqzxgKbNslewRG_gjF2iZ9N14JDVaFLbqqzRg2lKt0F5bdUXWjgAfx6d6LL2cLHfh9H743iRP8Wz18k0v5_FilPWxVxRlnDQWhDNMchKyzQUoYRmaYUrymUlMFGEJVIsFWOUp4mETGrMqYKEDaPbXW7r7HcPvivWxiuo67IB2_uCBCVScilwQK__oSvbuya8rsgIZ1gIyQNEd5By1nsHumidWYfPhaRiq7r4U11sVRd71WHoZp9celXW2pWNMv4wSQVPWcJE4K52nAGAw7VIUk4oZ7_iV4Wh</recordid><startdate>201201</startdate><enddate>201201</enddate><creator>Jinwook Jang</creator><creator>Franza, O.</creator><creator>Burleson, W.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>201201</creationdate><title>Compact Expressions for Supply Noise Induced Period Jitter of Global Binary Clock Trees</title><author>Jinwook Jang ; Franza, O. ; Burleson, W.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c423t-4c2364eff51f40e8bf87bf8121297b0b248b501c13685dc3324768e98f042ce63</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Applied sciences</topic><topic>Binary clock tree</topic><topic>Circuit properties</topic><topic>clock data compensation</topic><topic>Clock drivers</topic><topic>clock jitter</topic><topic>Clocks</topic><topic>Corners</topic><topic>Design parameters</topic><topic>Design. Technologies. Operation analysis. Testing</topic><topic>Driver circuits</topic><topic>Electric, optical and optoelectronic circuits</topic><topic>Electronic circuits</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Integrated circuit modeling</topic><topic>Integrated circuits</topic><topic>Integrated circuits by function (including memories and processors)</topic><topic>Jitter</topic><topic>Microprocessors</topic><topic>Noise</topic><topic>Oscillators, resonators, synthetizers</topic><topic>period jitter</topic><topic>Power supplies</topic><topic>Propagation delay</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Very large scale integration</topic><topic>worst case period jitter</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Jinwook Jang</creatorcontrib><creatorcontrib>Franza, O.</creatorcontrib><creatorcontrib>Burleson, W.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on very large scale integration (VLSI) systems</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Jinwook Jang</au><au>Franza, O.</au><au>Burleson, W.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Compact Expressions for Supply Noise Induced Period Jitter of Global Binary Clock Trees</atitle><jtitle>IEEE transactions on very large scale integration (VLSI) systems</jtitle><stitle>TVLSI</stitle><date>2012-01</date><risdate>2012</risdate><volume>20</volume><issue>1</issue><spage>66</spage><epage>79</epage><pages>66-79</pages><issn>1063-8210</issn><eissn>1557-9999</eissn><coden>IEVSE9</coden><abstract>Period jitter plays a critical role in global clock distribution design, because it directly impacts the time available for logic operations between sequential elements. Moreover, time-varying supply noise injected in global clock drivers can worsen the timing margin of critical paths by modulating period jitter. In the planning stage of global clock distribution for a high-end microprocessor, it is very critical to differentiate and understand the impacts of different design parameters on period jitter. However, it is hard to achieve due to complex relationship among different independent/dependent design parameters: supply noise amplitude, supply noise frequency, clock driver size, physical structures of interconnects, number of clock stages, temperature, process corners, etc. In this paper, we propose sets of analytical expressions which accurately model the behavior of supply noise induced period jitter of global binary clock trees without losing the details of clock distribution design parameters. These accurate expressions and their derivation process are used to provide detailed insight into the relationships between period jitter of binary clock distribution and distribution design parameters with several examples. Also detailed design guidelines for binary clock trees are presented.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TVLSI.2010.2089706</doi><tpages>14</tpages></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 1063-8210 |
ispartof | IEEE transactions on very large scale integration (VLSI) systems, 2012-01, Vol.20 (1), p.66-79 |
issn | 1063-8210 1557-9999 |
language | eng |
recordid | cdi_ieee_primary_5674124 |
source | IEEE Electronic Library (IEL) |
subjects | Applied sciences Binary clock tree Circuit properties clock data compensation Clock drivers clock jitter Clocks Corners Design parameters Design. Technologies. Operation analysis. Testing Driver circuits Electric, optical and optoelectronic circuits Electronic circuits Electronics Exact sciences and technology Integrated circuit modeling Integrated circuits Integrated circuits by function (including memories and processors) Jitter Microprocessors Noise Oscillators, resonators, synthetizers period jitter Power supplies Propagation delay Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Very large scale integration worst case period jitter |
title | Compact Expressions for Supply Noise Induced Period Jitter of Global Binary Clock Trees |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-17T13%3A41%3A54IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Compact%20Expressions%20for%20Supply%20Noise%20Induced%20Period%20Jitter%20of%20Global%20Binary%20Clock%20Trees&rft.jtitle=IEEE%20transactions%20on%20very%20large%20scale%20integration%20(VLSI)%20systems&rft.au=Jinwook%20Jang&rft.date=2012-01&rft.volume=20&rft.issue=1&rft.spage=66&rft.epage=79&rft.pages=66-79&rft.issn=1063-8210&rft.eissn=1557-9999&rft.coden=IEVSE9&rft_id=info:doi/10.1109/TVLSI.2010.2089706&rft_dat=%3Cproquest_RIE%3E2554236301%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=914305584&rft_id=info:pmid/&rft_ieee_id=5674124&rfr_iscdi=true |