Digital PVT calibration of a Frequency-to-Voltage converter
A digital process, voltage, and temperature (PVT) calibration loop for a Frequency-to-Voltage converter (FVC) is presented. The FVC needs a precisely controlled delay element, but delay in CMOS is highly dependent on the PVT condition making it neccessary to calibrate the delay line. The system is d...
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creator | Michaelsen, Jorgen Andreas Wisland, Dag T. |
description | A digital process, voltage, and temperature (PVT) calibration loop for a Frequency-to-Voltage converter (FVC) is presented. The FVC needs a precisely controlled delay element, but delay in CMOS is highly dependent on the PVT condition making it neccessary to calibrate the delay line. The system is designed to calibrate against an external reference frequency which is already present in the intended application. This is advantageous, as it is not neccesary to generate additional bandgap or other reference on chip. Results from transistor level simulations using a 90 nm CMOS process are presented, showing good regulation accross PVT corners and ability to track changes in the PVT condition. The calibration loop is digital and therefore a good fit for CMOS technology. |
doi_str_mv | 10.1109/NORCHIP.2010.5669455 |
format | Conference Proceeding |
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The FVC needs a precisely controlled delay element, but delay in CMOS is highly dependent on the PVT condition making it neccessary to calibrate the delay line. The system is designed to calibrate against an external reference frequency which is already present in the intended application. This is advantageous, as it is not neccesary to generate additional bandgap or other reference on chip. Results from transistor level simulations using a 90 nm CMOS process are presented, showing good regulation accross PVT corners and ability to track changes in the PVT condition. The calibration loop is digital and therefore a good fit for CMOS technology.</description><identifier>ISBN: 1424489725</identifier><identifier>ISBN: 9781424489725</identifier><identifier>EISBN: 1424489717</identifier><identifier>EISBN: 9781424489718</identifier><identifier>EISBN: 1424489733</identifier><identifier>EISBN: 9781424489732</identifier><identifier>DOI: 10.1109/NORCHIP.2010.5669455</identifier><language>eng</language><publisher>IEEE</publisher><subject>Capacitance ; CMOS integrated circuits ; CMOS technology ; Gain ; Impedance ; Low power electronics ; Semiconductor device measurement</subject><ispartof>NORCHIP 2010, 2010, p.1-4</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5669455$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5669455$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Michaelsen, Jorgen Andreas</creatorcontrib><creatorcontrib>Wisland, Dag T.</creatorcontrib><title>Digital PVT calibration of a Frequency-to-Voltage converter</title><title>NORCHIP 2010</title><addtitle>NORCHIP</addtitle><description>A digital process, voltage, and temperature (PVT) calibration loop for a Frequency-to-Voltage converter (FVC) is presented. The FVC needs a precisely controlled delay element, but delay in CMOS is highly dependent on the PVT condition making it neccessary to calibrate the delay line. The system is designed to calibrate against an external reference frequency which is already present in the intended application. This is advantageous, as it is not neccesary to generate additional bandgap or other reference on chip. Results from transistor level simulations using a 90 nm CMOS process are presented, showing good regulation accross PVT corners and ability to track changes in the PVT condition. The calibration loop is digital and therefore a good fit for CMOS technology.</description><subject>Capacitance</subject><subject>CMOS integrated circuits</subject><subject>CMOS technology</subject><subject>Gain</subject><subject>Impedance</subject><subject>Low power electronics</subject><subject>Semiconductor device measurement</subject><isbn>1424489725</isbn><isbn>9781424489725</isbn><isbn>1424489717</isbn><isbn>9781424489718</isbn><isbn>1424489733</isbn><isbn>9781424489732</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2010</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpjYJAxNNAzNDSw1PfzD3L28AzQMzIAipiamVmamJoyMnAZmhiZmFhYmhuaMyM4RqYcDLzFxVkGQGBqamFqYc7JYO2SmZ5ZkpijEBAWopCcmJOZVJRYkpmfp5CfppCo4FaUWliampdcqVuSrxuWn1OSmJ6qkJyfV5ZaVJJaxMPAmpaYU5zKC6W5GaTdXEOcPXQzU1NT4wuKMnMTiyrjoY4yxi8LAL_dOcA</recordid><startdate>201011</startdate><enddate>201011</enddate><creator>Michaelsen, Jorgen Andreas</creator><creator>Wisland, Dag T.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201011</creationdate><title>Digital PVT calibration of a Frequency-to-Voltage converter</title><author>Michaelsen, Jorgen Andreas ; Wisland, Dag T.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-ieee_primary_56694553</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Capacitance</topic><topic>CMOS integrated circuits</topic><topic>CMOS technology</topic><topic>Gain</topic><topic>Impedance</topic><topic>Low power electronics</topic><topic>Semiconductor device measurement</topic><toplevel>online_resources</toplevel><creatorcontrib>Michaelsen, Jorgen Andreas</creatorcontrib><creatorcontrib>Wisland, Dag T.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Michaelsen, Jorgen Andreas</au><au>Wisland, Dag T.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Digital PVT calibration of a Frequency-to-Voltage converter</atitle><btitle>NORCHIP 2010</btitle><stitle>NORCHIP</stitle><date>2010-11</date><risdate>2010</risdate><spage>1</spage><epage>4</epage><pages>1-4</pages><isbn>1424489725</isbn><isbn>9781424489725</isbn><eisbn>1424489717</eisbn><eisbn>9781424489718</eisbn><eisbn>1424489733</eisbn><eisbn>9781424489732</eisbn><abstract>A digital process, voltage, and temperature (PVT) calibration loop for a Frequency-to-Voltage converter (FVC) is presented. The FVC needs a precisely controlled delay element, but delay in CMOS is highly dependent on the PVT condition making it neccessary to calibrate the delay line. The system is designed to calibrate against an external reference frequency which is already present in the intended application. This is advantageous, as it is not neccesary to generate additional bandgap or other reference on chip. Results from transistor level simulations using a 90 nm CMOS process are presented, showing good regulation accross PVT corners and ability to track changes in the PVT condition. The calibration loop is digital and therefore a good fit for CMOS technology.</abstract><pub>IEEE</pub><doi>10.1109/NORCHIP.2010.5669455</doi></addata></record> |
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subjects | Capacitance CMOS integrated circuits CMOS technology Gain Impedance Low power electronics Semiconductor device measurement |
title | Digital PVT calibration of a Frequency-to-Voltage converter |
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