Studying the Impact of Clones on Software Defects
There are numerous studies that examine whether or not cloned code is harmful to software systems. Yet, few of them study which characteristics of cloned code in particular lead to software defects. In our work, we use survival analysis to understand the impact of clones on software defects and to d...
Gespeichert in:
Hauptverfasser: | , , , , , |
---|---|
Format: | Tagungsbericht |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 21 |
---|---|
container_issue | |
container_start_page | 13 |
container_title | |
container_volume | |
creator | Selim, G M K Barbour, L Weiyi Shang Adams, B Hassan, A E Ying Zou |
description | There are numerous studies that examine whether or not cloned code is harmful to software systems. Yet, few of them study which characteristics of cloned code in particular lead to software defects. In our work, we use survival analysis to understand the impact of clones on software defects and to determine the characteristics of cloned code that have the highest impact on software defects. Our survival models express the risk of defects in terms of basic predictors inherent to the code (e.g., LOC) and cloning predictors (e.g., number of clone siblings). We perform a case study using two clone detection tools on two large, long-lived systems using survival analysis. We determine that the defect-proneness of cloned methods is specific to the system under study and that more resources should be directed towards methods with a longer 'commit history'. |
doi_str_mv | 10.1109/WCRE.2010.11 |
format | Conference Proceeding |
fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_5645480</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5645480</ieee_id><sourcerecordid>5645480</sourcerecordid><originalsourceid>FETCH-LOGICAL-i90t-372163b79fbf7c9aaae05ca87a9123f5a29f589d5f152cba1faf27d51729ac133</originalsourceid><addsrcrecordid>eNotjE1Lw0AQQBc_wLZ68-Zl_0Dqzm4mmzlKrFooCLbgsUw2Oxppk5KsSP-9op4eDx5PqWswcwBDt6_Vy2Juza-eqIl1HjN0BZ2qKeQ2z0sCcGdq8tNiBg7NhZqO44cx1jgyEwXr9Nkc2-5Np_eol_sDh6R70dWu7-Ko-06ve0lfPER9HyWGNF6qc-HdGK_-OVObh8WmespWz4_L6m6VtWRS5ryFwtWepBYfiJmjwcClZwLrBNmSYEkNCqANNYOwWN8geEscwLmZuvnbtjHG7WFo9zwct1jkmJfGfQOgtkOe</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Studying the Impact of Clones on Software Defects</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Selim, G M K ; Barbour, L ; Weiyi Shang ; Adams, B ; Hassan, A E ; Ying Zou</creator><creatorcontrib>Selim, G M K ; Barbour, L ; Weiyi Shang ; Adams, B ; Hassan, A E ; Ying Zou</creatorcontrib><description>There are numerous studies that examine whether or not cloned code is harmful to software systems. Yet, few of them study which characteristics of cloned code in particular lead to software defects. In our work, we use survival analysis to understand the impact of clones on software defects and to determine the characteristics of cloned code that have the highest impact on software defects. Our survival models express the risk of defects in terms of basic predictors inherent to the code (e.g., LOC) and cloning predictors (e.g., number of clone siblings). We perform a case study using two clone detection tools on two large, long-lived systems using survival analysis. We determine that the defect-proneness of cloned methods is specific to the system under study and that more resources should be directed towards methods with a longer 'commit history'.</description><identifier>ISSN: 1095-1350</identifier><identifier>ISBN: 1424489113</identifier><identifier>ISBN: 9781424489114</identifier><identifier>EISSN: 2375-5369</identifier><identifier>DOI: 10.1109/WCRE.2010.11</identifier><language>eng</language><publisher>IEEE</publisher><subject>Cloning ; Correlation ; Data models ; Hazards ; Mathematical model ; Predictive models ; Software</subject><ispartof>2010 17th Working Conference on Reverse Engineering, 2010, p.13-21</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5645480$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2051,27904,54898</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5645480$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Selim, G M K</creatorcontrib><creatorcontrib>Barbour, L</creatorcontrib><creatorcontrib>Weiyi Shang</creatorcontrib><creatorcontrib>Adams, B</creatorcontrib><creatorcontrib>Hassan, A E</creatorcontrib><creatorcontrib>Ying Zou</creatorcontrib><title>Studying the Impact of Clones on Software Defects</title><title>2010 17th Working Conference on Reverse Engineering</title><addtitle>wcre</addtitle><description>There are numerous studies that examine whether or not cloned code is harmful to software systems. Yet, few of them study which characteristics of cloned code in particular lead to software defects. In our work, we use survival analysis to understand the impact of clones on software defects and to determine the characteristics of cloned code that have the highest impact on software defects. Our survival models express the risk of defects in terms of basic predictors inherent to the code (e.g., LOC) and cloning predictors (e.g., number of clone siblings). We perform a case study using two clone detection tools on two large, long-lived systems using survival analysis. We determine that the defect-proneness of cloned methods is specific to the system under study and that more resources should be directed towards methods with a longer 'commit history'.</description><subject>Cloning</subject><subject>Correlation</subject><subject>Data models</subject><subject>Hazards</subject><subject>Mathematical model</subject><subject>Predictive models</subject><subject>Software</subject><issn>1095-1350</issn><issn>2375-5369</issn><isbn>1424489113</isbn><isbn>9781424489114</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2010</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotjE1Lw0AQQBc_wLZ68-Zl_0Dqzm4mmzlKrFooCLbgsUw2Oxppk5KsSP-9op4eDx5PqWswcwBDt6_Vy2Juza-eqIl1HjN0BZ2qKeQ2z0sCcGdq8tNiBg7NhZqO44cx1jgyEwXr9Nkc2-5Np_eol_sDh6R70dWu7-Ko-06ve0lfPER9HyWGNF6qc-HdGK_-OVObh8WmespWz4_L6m6VtWRS5ryFwtWepBYfiJmjwcClZwLrBNmSYEkNCqANNYOwWN8geEscwLmZuvnbtjHG7WFo9zwct1jkmJfGfQOgtkOe</recordid><startdate>201010</startdate><enddate>201010</enddate><creator>Selim, G M K</creator><creator>Barbour, L</creator><creator>Weiyi Shang</creator><creator>Adams, B</creator><creator>Hassan, A E</creator><creator>Ying Zou</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201010</creationdate><title>Studying the Impact of Clones on Software Defects</title><author>Selim, G M K ; Barbour, L ; Weiyi Shang ; Adams, B ; Hassan, A E ; Ying Zou</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-372163b79fbf7c9aaae05ca87a9123f5a29f589d5f152cba1faf27d51729ac133</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Cloning</topic><topic>Correlation</topic><topic>Data models</topic><topic>Hazards</topic><topic>Mathematical model</topic><topic>Predictive models</topic><topic>Software</topic><toplevel>online_resources</toplevel><creatorcontrib>Selim, G M K</creatorcontrib><creatorcontrib>Barbour, L</creatorcontrib><creatorcontrib>Weiyi Shang</creatorcontrib><creatorcontrib>Adams, B</creatorcontrib><creatorcontrib>Hassan, A E</creatorcontrib><creatorcontrib>Ying Zou</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Selim, G M K</au><au>Barbour, L</au><au>Weiyi Shang</au><au>Adams, B</au><au>Hassan, A E</au><au>Ying Zou</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Studying the Impact of Clones on Software Defects</atitle><btitle>2010 17th Working Conference on Reverse Engineering</btitle><stitle>wcre</stitle><date>2010-10</date><risdate>2010</risdate><spage>13</spage><epage>21</epage><pages>13-21</pages><issn>1095-1350</issn><eissn>2375-5369</eissn><isbn>1424489113</isbn><isbn>9781424489114</isbn><abstract>There are numerous studies that examine whether or not cloned code is harmful to software systems. Yet, few of them study which characteristics of cloned code in particular lead to software defects. In our work, we use survival analysis to understand the impact of clones on software defects and to determine the characteristics of cloned code that have the highest impact on software defects. Our survival models express the risk of defects in terms of basic predictors inherent to the code (e.g., LOC) and cloning predictors (e.g., number of clone siblings). We perform a case study using two clone detection tools on two large, long-lived systems using survival analysis. We determine that the defect-proneness of cloned methods is specific to the system under study and that more resources should be directed towards methods with a longer 'commit history'.</abstract><pub>IEEE</pub><doi>10.1109/WCRE.2010.11</doi><tpages>9</tpages></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 1095-1350 |
ispartof | 2010 17th Working Conference on Reverse Engineering, 2010, p.13-21 |
issn | 1095-1350 2375-5369 |
language | eng |
recordid | cdi_ieee_primary_5645480 |
source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Cloning Correlation Data models Hazards Mathematical model Predictive models Software |
title | Studying the Impact of Clones on Software Defects |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-23T20%3A52%3A19IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Studying%20the%20Impact%20of%20Clones%20on%20Software%20Defects&rft.btitle=2010%2017th%20Working%20Conference%20on%20Reverse%20Engineering&rft.au=Selim,%20G%20M%20K&rft.date=2010-10&rft.spage=13&rft.epage=21&rft.pages=13-21&rft.issn=1095-1350&rft.eissn=2375-5369&rft.isbn=1424489113&rft.isbn_list=9781424489114&rft_id=info:doi/10.1109/WCRE.2010.11&rft_dat=%3Cieee_6IE%3E5645480%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=5645480&rfr_iscdi=true |