Industrial Approach for Dependability
This presentation introduces author's and (his affiliation's) industrial approach for dependability. The author's affiliation has long history of dependable system technology starting with railway and nuclear power generation fields. The author proposed self-checking techniques and op...
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creator | Kanekawa, Nobuyasu |
description | This presentation introduces author's and (his affiliation's) industrial approach for dependability. The author's affiliation has long history of dependable system technology starting with railway and nuclear power generation fields. The author proposed self-checking techniques and optimal time diversity method to maximize fault detection and recovery coverage to realize ultimate high-reliability at the middle of 1990's. The technology established thus was applied to the railway control system such as electronic railroad crossing controllers starting with LSI (Large -Scale Integration Circuit) for ATP (Automatic Train Protection). The authors applied the ultimate high-reliable technologies to on-chip redundancy, which has redundant cores within one chip in 2000's when multi-core processors which have plural processor cores within one chip appear as a result of development of high-density integration by the Moore's Law. At the end of the presentation the author introduces X-by-Wire technology which challenges to control automotives with computer assistance as the latest application and the most prospective application of dependable LSI technology. |
doi_str_mv | 10.1109/DFT.2010.43 |
format | Conference Proceeding |
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At the end of the presentation the author introduces X-by-Wire technology which challenges to control automotives with computer assistance as the latest application and the most prospective application of dependable LSI technology.</description><subject>Diversity methods</subject><subject>Electrical fault detection</subject><subject>Fault detection</subject><subject>fault detection coverage</subject><subject>History</subject><subject>Large scale integration</subject><subject>LSI</subject><subject>Moore's Law</subject><subject>Multicore processing</subject><subject>optimal time diversity</subject><subject>Rail transportation</subject><subject>recovery coverage</subject><subject>self-checking</subject><subject>X-by-Wire</subject><issn>1550-5774</issn><issn>2377-7966</issn><isbn>1424484472</isbn><isbn>9781424484478</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2010</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotjj1vwjAURa1-SE0pU8cuWToa_Gw_G48ISouExEJnZDvPqqsUoiQd-Pe1VO5ydIdzdRl7BjEDEG6-3hxmUpSm1Q2rpLKWW2fMLXsELbVeaG3lHasAUXC0Vj-w6TB8ixKNxTMVe92emt9h7LNv62XX9Wcfv-p07us1dXRqfMhtHi9P7D75dqDplRP2uXk7rD74bv--XS13PIPAkStvffLBBRFJRYRIQcqEoDCCo3LPJNnE5CQ6cOjRCdWQWZhEIgIFVBP28r-biejY9fnH95cjGqWLoP4A8ZJAiw</recordid><startdate>201010</startdate><enddate>201010</enddate><creator>Kanekawa, Nobuyasu</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201010</creationdate><title>Industrial Approach for Dependability</title><author>Kanekawa, Nobuyasu</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i105t-3a7afab9b0ce3c51ceb22f5135c19e2376f2dcf9259195a5903de686fe0c1eb53</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Diversity methods</topic><topic>Electrical fault detection</topic><topic>Fault detection</topic><topic>fault detection coverage</topic><topic>History</topic><topic>Large scale integration</topic><topic>LSI</topic><topic>Moore's Law</topic><topic>Multicore processing</topic><topic>optimal time diversity</topic><topic>Rail transportation</topic><topic>recovery coverage</topic><topic>self-checking</topic><topic>X-by-Wire</topic><toplevel>online_resources</toplevel><creatorcontrib>Kanekawa, Nobuyasu</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kanekawa, Nobuyasu</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Industrial Approach for Dependability</atitle><btitle>2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems</btitle><stitle>dft</stitle><date>2010-10</date><risdate>2010</risdate><spage>299</spage><epage>299</epage><pages>299-299</pages><issn>1550-5774</issn><eissn>2377-7966</eissn><isbn>1424484472</isbn><isbn>9781424484478</isbn><abstract>This presentation introduces author's and (his affiliation's) industrial approach for dependability. The author's affiliation has long history of dependable system technology starting with railway and nuclear power generation fields. The author proposed self-checking techniques and optimal time diversity method to maximize fault detection and recovery coverage to realize ultimate high-reliability at the middle of 1990's. The technology established thus was applied to the railway control system such as electronic railroad crossing controllers starting with LSI (Large -Scale Integration Circuit) for ATP (Automatic Train Protection). The authors applied the ultimate high-reliable technologies to on-chip redundancy, which has redundant cores within one chip in 2000's when multi-core processors which have plural processor cores within one chip appear as a result of development of high-density integration by the Moore's Law. 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identifier | ISSN: 1550-5774 |
ispartof | 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems, 2010, p.299-299 |
issn | 1550-5774 2377-7966 |
language | eng |
recordid | cdi_ieee_primary_5634919 |
source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Diversity methods Electrical fault detection Fault detection fault detection coverage History Large scale integration LSI Moore's Law Multicore processing optimal time diversity Rail transportation recovery coverage self-checking X-by-Wire |
title | Industrial Approach for Dependability |
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