Industrial Approach for Dependability

This presentation introduces author's and (his affiliation's) industrial approach for dependability. The author's affiliation has long history of dependable system technology starting with railway and nuclear power generation fields. The author proposed self-checking techniques and op...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: Kanekawa, Nobuyasu
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 299
container_issue
container_start_page 299
container_title
container_volume
creator Kanekawa, Nobuyasu
description This presentation introduces author's and (his affiliation's) industrial approach for dependability. The author's affiliation has long history of dependable system technology starting with railway and nuclear power generation fields. The author proposed self-checking techniques and optimal time diversity method to maximize fault detection and recovery coverage to realize ultimate high-reliability at the middle of 1990's. The technology established thus was applied to the railway control system such as electronic railroad crossing controllers starting with LSI (Large -Scale Integration Circuit) for ATP (Automatic Train Protection). The authors applied the ultimate high-reliable technologies to on-chip redundancy, which has redundant cores within one chip in 2000's when multi-core processors which have plural processor cores within one chip appear as a result of development of high-density integration by the Moore's Law. At the end of the presentation the author introduces X-by-Wire technology which challenges to control automotives with computer assistance as the latest application and the most prospective application of dependable LSI technology.
doi_str_mv 10.1109/DFT.2010.43
format Conference Proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_5634919</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5634919</ieee_id><sourcerecordid>5634919</sourcerecordid><originalsourceid>FETCH-LOGICAL-i105t-3a7afab9b0ce3c51ceb22f5135c19e2376f2dcf9259195a5903de686fe0c1eb53</originalsourceid><addsrcrecordid>eNotjj1vwjAURa1-SE0pU8cuWToa_Gw_G48ISouExEJnZDvPqqsUoiQd-Pe1VO5ydIdzdRl7BjEDEG6-3hxmUpSm1Q2rpLKWW2fMLXsELbVeaG3lHasAUXC0Vj-w6TB8ixKNxTMVe92emt9h7LNv62XX9Wcfv-p07us1dXRqfMhtHi9P7D75dqDplRP2uXk7rD74bv--XS13PIPAkStvffLBBRFJRYRIQcqEoDCCo3LPJNnE5CQ6cOjRCdWQWZhEIgIFVBP28r-biejY9fnH95cjGqWLoP4A8ZJAiw</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Industrial Approach for Dependability</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Kanekawa, Nobuyasu</creator><creatorcontrib>Kanekawa, Nobuyasu</creatorcontrib><description>This presentation introduces author's and (his affiliation's) industrial approach for dependability. The author's affiliation has long history of dependable system technology starting with railway and nuclear power generation fields. The author proposed self-checking techniques and optimal time diversity method to maximize fault detection and recovery coverage to realize ultimate high-reliability at the middle of 1990's. The technology established thus was applied to the railway control system such as electronic railroad crossing controllers starting with LSI (Large -Scale Integration Circuit) for ATP (Automatic Train Protection). The authors applied the ultimate high-reliable technologies to on-chip redundancy, which has redundant cores within one chip in 2000's when multi-core processors which have plural processor cores within one chip appear as a result of development of high-density integration by the Moore's Law. At the end of the presentation the author introduces X-by-Wire technology which challenges to control automotives with computer assistance as the latest application and the most prospective application of dependable LSI technology.</description><identifier>ISSN: 1550-5774</identifier><identifier>ISBN: 1424484472</identifier><identifier>ISBN: 9781424484478</identifier><identifier>EISSN: 2377-7966</identifier><identifier>DOI: 10.1109/DFT.2010.43</identifier><language>eng</language><publisher>IEEE</publisher><subject>Diversity methods ; Electrical fault detection ; Fault detection ; fault detection coverage ; History ; Large scale integration ; LSI ; Moore's Law ; Multicore processing ; optimal time diversity ; Rail transportation ; recovery coverage ; self-checking ; X-by-Wire</subject><ispartof>2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems, 2010, p.299-299</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5634919$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,27902,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5634919$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Kanekawa, Nobuyasu</creatorcontrib><title>Industrial Approach for Dependability</title><title>2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems</title><addtitle>dft</addtitle><description>This presentation introduces author's and (his affiliation's) industrial approach for dependability. The author's affiliation has long history of dependable system technology starting with railway and nuclear power generation fields. The author proposed self-checking techniques and optimal time diversity method to maximize fault detection and recovery coverage to realize ultimate high-reliability at the middle of 1990's. The technology established thus was applied to the railway control system such as electronic railroad crossing controllers starting with LSI (Large -Scale Integration Circuit) for ATP (Automatic Train Protection). The authors applied the ultimate high-reliable technologies to on-chip redundancy, which has redundant cores within one chip in 2000's when multi-core processors which have plural processor cores within one chip appear as a result of development of high-density integration by the Moore's Law. At the end of the presentation the author introduces X-by-Wire technology which challenges to control automotives with computer assistance as the latest application and the most prospective application of dependable LSI technology.</description><subject>Diversity methods</subject><subject>Electrical fault detection</subject><subject>Fault detection</subject><subject>fault detection coverage</subject><subject>History</subject><subject>Large scale integration</subject><subject>LSI</subject><subject>Moore's Law</subject><subject>Multicore processing</subject><subject>optimal time diversity</subject><subject>Rail transportation</subject><subject>recovery coverage</subject><subject>self-checking</subject><subject>X-by-Wire</subject><issn>1550-5774</issn><issn>2377-7966</issn><isbn>1424484472</isbn><isbn>9781424484478</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2010</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotjj1vwjAURa1-SE0pU8cuWToa_Gw_G48ISouExEJnZDvPqqsUoiQd-Pe1VO5ydIdzdRl7BjEDEG6-3hxmUpSm1Q2rpLKWW2fMLXsELbVeaG3lHasAUXC0Vj-w6TB8ixKNxTMVe92emt9h7LNv62XX9Wcfv-p07us1dXRqfMhtHi9P7D75dqDplRP2uXk7rD74bv--XS13PIPAkStvffLBBRFJRYRIQcqEoDCCo3LPJNnE5CQ6cOjRCdWQWZhEIgIFVBP28r-biejY9fnH95cjGqWLoP4A8ZJAiw</recordid><startdate>201010</startdate><enddate>201010</enddate><creator>Kanekawa, Nobuyasu</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201010</creationdate><title>Industrial Approach for Dependability</title><author>Kanekawa, Nobuyasu</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i105t-3a7afab9b0ce3c51ceb22f5135c19e2376f2dcf9259195a5903de686fe0c1eb53</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Diversity methods</topic><topic>Electrical fault detection</topic><topic>Fault detection</topic><topic>fault detection coverage</topic><topic>History</topic><topic>Large scale integration</topic><topic>LSI</topic><topic>Moore's Law</topic><topic>Multicore processing</topic><topic>optimal time diversity</topic><topic>Rail transportation</topic><topic>recovery coverage</topic><topic>self-checking</topic><topic>X-by-Wire</topic><toplevel>online_resources</toplevel><creatorcontrib>Kanekawa, Nobuyasu</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kanekawa, Nobuyasu</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Industrial Approach for Dependability</atitle><btitle>2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems</btitle><stitle>dft</stitle><date>2010-10</date><risdate>2010</risdate><spage>299</spage><epage>299</epage><pages>299-299</pages><issn>1550-5774</issn><eissn>2377-7966</eissn><isbn>1424484472</isbn><isbn>9781424484478</isbn><abstract>This presentation introduces author's and (his affiliation's) industrial approach for dependability. The author's affiliation has long history of dependable system technology starting with railway and nuclear power generation fields. The author proposed self-checking techniques and optimal time diversity method to maximize fault detection and recovery coverage to realize ultimate high-reliability at the middle of 1990's. The technology established thus was applied to the railway control system such as electronic railroad crossing controllers starting with LSI (Large -Scale Integration Circuit) for ATP (Automatic Train Protection). The authors applied the ultimate high-reliable technologies to on-chip redundancy, which has redundant cores within one chip in 2000's when multi-core processors which have plural processor cores within one chip appear as a result of development of high-density integration by the Moore's Law. At the end of the presentation the author introduces X-by-Wire technology which challenges to control automotives with computer assistance as the latest application and the most prospective application of dependable LSI technology.</abstract><pub>IEEE</pub><doi>10.1109/DFT.2010.43</doi><tpages>1</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 1550-5774
ispartof 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems, 2010, p.299-299
issn 1550-5774
2377-7966
language eng
recordid cdi_ieee_primary_5634919
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Diversity methods
Electrical fault detection
Fault detection
fault detection coverage
History
Large scale integration
LSI
Moore's Law
Multicore processing
optimal time diversity
Rail transportation
recovery coverage
self-checking
X-by-Wire
title Industrial Approach for Dependability
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-02T13%3A58%3A02IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Industrial%20Approach%20for%20Dependability&rft.btitle=2010%20IEEE%2025th%20International%20Symposium%20on%20Defect%20and%20Fault%20Tolerance%20in%20VLSI%20Systems&rft.au=Kanekawa,%20Nobuyasu&rft.date=2010-10&rft.spage=299&rft.epage=299&rft.pages=299-299&rft.issn=1550-5774&rft.eissn=2377-7966&rft.isbn=1424484472&rft.isbn_list=9781424484478&rft_id=info:doi/10.1109/DFT.2010.43&rft_dat=%3Cieee_6IE%3E5634919%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=5634919&rfr_iscdi=true