Near-field resonances in diagnostics of multilayered media

Near-field resonances in diagnostics of multilayered media

A method of the coherent near-field sounding of multilayered dielectric structures is studied. It is based on field measurements with subwavelength probes (emitting and receiving) that are spaced in the near-field zone above the upper layer of the studied structure. It makes possible to achieve a su...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Gaikovich, K P, Gaikovich, P K
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Current measurement
Dielectric measurements
Dielectrics
Impedance
Nonhomogeneous media
Permittivity
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 31
container_issue
container_start_page 30
container_title
container_volume
creator Gaikovich, K P
Gaikovich, P K
description A method of the coherent near-field sounding of multilayered dielectric structures is studied. It is based on field measurements with subwavelength probes (emitting and receiving) that are spaced in the near-field zone above the upper layer of the studied structure. It makes possible to achieve a subwavelength resolution at the control of the layers' depth. Especially high resolution can be achieved using the resonant response. The developed approach can be used, for instance, for the monitoring of epitaxy of multilayered heterostructures using SNOM techniques.
doi_str_mv 10.1109/LFNM.2010.5624180
format Conference Proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_5624180</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5624180</ieee_id><sourcerecordid>5624180</sourcerecordid><originalsourceid>FETCH-LOGICAL-i90t-ea13e35e595b427bdbe3580c39e5872642d13afbfc88df162f4c2b6dd010fed23</originalsourceid><addsrcrecordid>eNo1j8tKAzEYhSMiqHUeQNzkBaYmfy6TuJNiqzDWTfclmfyRyFxkMi769gasZ3P4OHDgI-SeszXnzD622_37GlhBpUFywy7ILZcgpbZW80tS2cb8s7TXpMr5i5VIBWDFDXnao5vrmLAPdMY8jW7sMNM00pDc5zjlJXWZTpEOP_2SenfCGQMdsKx35Cq6PmN17hU5bF8Om9e6_di9bZ7bOlm21Oi4QKFQWeUlND74QoZ1wqIyDWgJgQsXfeyMCZFriLIDr0MoThEDiBV5-LtNiHj8ntPg5tPxbCt-AalrSJw</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Near-field resonances in diagnostics of multilayered media</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Gaikovich, K P ; Gaikovich, P K</creator><creatorcontrib>Gaikovich, K P ; Gaikovich, P K</creatorcontrib><description>A method of the coherent near-field sounding of multilayered dielectric structures is studied. It is based on field measurements with subwavelength probes (emitting and receiving) that are spaced in the near-field zone above the upper layer of the studied structure. It makes possible to achieve a subwavelength resolution at the control of the layers' depth. Especially high resolution can be achieved using the resonant response. The developed approach can be used, for instance, for the monitoring of epitaxy of multilayered heterostructures using SNOM techniques.</description><identifier>ISBN: 9781424469949</identifier><identifier>ISBN: 1424469945</identifier><identifier>EISBN: 1424469961</identifier><identifier>EISBN: 9781424469970</identifier><identifier>EISBN: 142446997X</identifier><identifier>EISBN: 9781424469963</identifier><identifier>DOI: 10.1109/LFNM.2010.5624180</identifier><language>eng</language><publisher>IEEE</publisher><subject>Current measurement ; Dielectric measurements ; Dielectrics ; Impedance ; Nonhomogeneous media ; Permittivity</subject><ispartof>2010 10th International Conference on Laser and Fiber-Optical Networks Modeling, 2010, p.30-31</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5624180$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5624180$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Gaikovich, K P</creatorcontrib><creatorcontrib>Gaikovich, P K</creatorcontrib><title>Near-field resonances in diagnostics of multilayered media</title><title>2010 10th International Conference on Laser and Fiber-Optical Networks Modeling</title><addtitle>LFNM</addtitle><description>A method of the coherent near-field sounding of multilayered dielectric structures is studied. It is based on field measurements with subwavelength probes (emitting and receiving) that are spaced in the near-field zone above the upper layer of the studied structure. It makes possible to achieve a subwavelength resolution at the control of the layers' depth. Especially high resolution can be achieved using the resonant response. The developed approach can be used, for instance, for the monitoring of epitaxy of multilayered heterostructures using SNOM techniques.</description><subject>Current measurement</subject><subject>Dielectric measurements</subject><subject>Dielectrics</subject><subject>Impedance</subject><subject>Nonhomogeneous media</subject><subject>Permittivity</subject><isbn>9781424469949</isbn><isbn>1424469945</isbn><isbn>1424469961</isbn><isbn>9781424469970</isbn><isbn>142446997X</isbn><isbn>9781424469963</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2010</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo1j8tKAzEYhSMiqHUeQNzkBaYmfy6TuJNiqzDWTfclmfyRyFxkMi769gasZ3P4OHDgI-SeszXnzD622_37GlhBpUFywy7ILZcgpbZW80tS2cb8s7TXpMr5i5VIBWDFDXnao5vrmLAPdMY8jW7sMNM00pDc5zjlJXWZTpEOP_2SenfCGQMdsKx35Cq6PmN17hU5bF8Om9e6_di9bZ7bOlm21Oi4QKFQWeUlND74QoZ1wqIyDWgJgQsXfeyMCZFriLIDr0MoThEDiBV5-LtNiHj8ntPg5tPxbCt-AalrSJw</recordid><startdate>201009</startdate><enddate>201009</enddate><creator>Gaikovich, K P</creator><creator>Gaikovich, P K</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201009</creationdate><title>Near-field resonances in diagnostics of multilayered media</title><author>Gaikovich, K P ; Gaikovich, P K</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-ea13e35e595b427bdbe3580c39e5872642d13afbfc88df162f4c2b6dd010fed23</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Current measurement</topic><topic>Dielectric measurements</topic><topic>Dielectrics</topic><topic>Impedance</topic><topic>Nonhomogeneous media</topic><topic>Permittivity</topic><toplevel>online_resources</toplevel><creatorcontrib>Gaikovich, K P</creatorcontrib><creatorcontrib>Gaikovich, P K</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Gaikovich, K P</au><au>Gaikovich, P K</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Near-field resonances in diagnostics of multilayered media</atitle><btitle>2010 10th International Conference on Laser and Fiber-Optical Networks Modeling</btitle><stitle>LFNM</stitle><date>2010-09</date><risdate>2010</risdate><spage>30</spage><epage>31</epage><pages>30-31</pages><isbn>9781424469949</isbn><isbn>1424469945</isbn><eisbn>1424469961</eisbn><eisbn>9781424469970</eisbn><eisbn>142446997X</eisbn><eisbn>9781424469963</eisbn><abstract>A method of the coherent near-field sounding of multilayered dielectric structures is studied. It is based on field measurements with subwavelength probes (emitting and receiving) that are spaced in the near-field zone above the upper layer of the studied structure. It makes possible to achieve a subwavelength resolution at the control of the layers' depth. Especially high resolution can be achieved using the resonant response. The developed approach can be used, for instance, for the monitoring of epitaxy of multilayered heterostructures using SNOM techniques.</abstract><pub>IEEE</pub><doi>10.1109/LFNM.2010.5624180</doi><tpages>2</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISBN: 9781424469949
ispartof 2010 10th International Conference on Laser and Fiber-Optical Networks Modeling, 2010, p.30-31
issn
language eng
recordid cdi_ieee_primary_5624180
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Current measurement
Dielectric measurements
Dielectrics
Impedance
Nonhomogeneous media
Permittivity
title Near-field resonances in diagnostics of multilayered media
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-22T17%3A04%3A35IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Near-field%20resonances%20in%20diagnostics%20of%20multilayered%20media&rft.btitle=2010%2010th%20International%20Conference%20on%20Laser%20and%20Fiber-Optical%20Networks%20Modeling&rft.au=Gaikovich,%20K%20P&rft.date=2010-09&rft.spage=30&rft.epage=31&rft.pages=30-31&rft.isbn=9781424469949&rft.isbn_list=1424469945&rft_id=info:doi/10.1109/LFNM.2010.5624180&rft_dat=%3Cieee_6IE%3E5624180%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&rft.eisbn=1424469961&rft.eisbn_list=9781424469970&rft.eisbn_list=142446997X&rft.eisbn_list=9781424469963&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=5624180&rfr_iscdi=true