Evaluation of emitter profiles and lateral uniformity on crystalline silicon photovoltaic cells using scanning capacitance microscopy

Scanning capacitance microscopy (SCM) has been used to generate two dimensional images of emitters formed using various doping techniques on polished and textured silicon photovoltaic cells. SCM has the advantage of high spatial resolution and sensitivity to carrier concentrations in the range of 10...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Kosbar, L, Nxumalo, J, Nalaskowski, J, Hupka, L, Molella, C, Liu, J, Totir, G, Fisher, K, Cotte, J, Hopstaken, M
Format:	Tagungsbericht
Sprache:	eng
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!