Optical mapping of large area thin film solar cells

The mapping capability of multichannel spectro-scopic ellipsometry (SE) has been demonstrated with examples from hydrogenated amorphous silicon (a-Si:H) and CdTe thin film photovoltaics (PV) technologies on glass. Maps as large as 40 × 80 cm 2 have been obtained. For a-Si:H, maps of the bulk i-layer...

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Bibliographische Detailangaben

Hauptverfasser:	Zhiquan Huang, Jie Chen, Sestak, M N, Attygalle, Dinesh, Dahal, Lila Raj, Mapes, Meghan R, Strickler, David A, Kormanyos, Kenneth R, Salupo, Carl, Collins, R W
Format:	Tagungsbericht
Sprache:	eng
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