State configuration controller for network centric organizational at-system level testing

Advanced diagnostic reasoners are being developed to make use of Bayesian fault probability distributions, experiential learning algorithms and actual net centric historical failure data to change dynamically or optimize the testing sequence. What is not covered is how also to reconfigure dynamicall...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Lospinuso, M, Marston, D, Gearhart, S
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 5
container_issue
container_start_page 1
container_title
container_volume
creator Lospinuso, M
Marston, D
Gearhart, S
description Advanced diagnostic reasoners are being developed to make use of Bayesian fault probability distributions, experiential learning algorithms and actual net centric historical failure data to change dynamically or optimize the testing sequence. What is not covered is how also to reconfigure dynamically the system or unit under test and the test equipment from its present state to the state required for the desired test. This issue is especially acute in organizational level at-system testing where there can be a large number of possible states for the system under test and test hook ups when compared to Intermediate or Depot level Line Replaceable Unit (LRU) and/or board testing. This paper describe the work performed by the U.S. Army Automated Test Systems Division (ATSD) to design and implement a model based State Configuration Controller. How this solution can be used with any or even multiple reasoners, provided the proper interface is implemented, will also be discussed.
doi_str_mv 10.1109/AUTEST.2010.5613589
format Conference Proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_5613589</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5613589</ieee_id><sourcerecordid>5613589</sourcerecordid><originalsourceid>FETCH-LOGICAL-i90t-4fdc905780fed7413b2b6cbccddcf05109664689c0cd6410588091f58cc5809d3</originalsourceid><addsrcrecordid>eNpVkM1OwzAQhM2fRCl9gl78AinrxOvYx6oqP1IlDg0HTpXrrCtDmiDHgMrTE6AXTrMz32qlHcamAmZCgLmZP1XLdTXLYQhQiQK1OWETU2ohcylLowScspFA1JlEhLN_DIrzgYHWWVnmeMmu-v4FIAdQOGLP62QTcde1Puzeo02ha39cil3TUOS-i7yl9NnFV-5oiIPjXdzZNnz97tqG25T1hz7Rnjf0QQ1P1KfQ7q7ZhbdNT5Ojjll1u6wW99nq8e5hMV9lwUDKpK-dASw1eKpLKYptvlVu61xdOw84PK-UVNo4cLWSAlBrMMKjdg6HqS7GbPp3NhDR5i2GvY2HzbGk4hsQt1k3</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>State configuration controller for network centric organizational at-system level testing</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Lospinuso, M ; Marston, D ; Gearhart, S</creator><creatorcontrib>Lospinuso, M ; Marston, D ; Gearhart, S</creatorcontrib><description>Advanced diagnostic reasoners are being developed to make use of Bayesian fault probability distributions, experiential learning algorithms and actual net centric historical failure data to change dynamically or optimize the testing sequence. What is not covered is how also to reconfigure dynamically the system or unit under test and the test equipment from its present state to the state required for the desired test. This issue is especially acute in organizational level at-system testing where there can be a large number of possible states for the system under test and test hook ups when compared to Intermediate or Depot level Line Replaceable Unit (LRU) and/or board testing. This paper describe the work performed by the U.S. Army Automated Test Systems Division (ATSD) to design and implement a model based State Configuration Controller. How this solution can be used with any or even multiple reasoners, provided the proper interface is implemented, will also be discussed.</description><identifier>ISSN: 1088-7725</identifier><identifier>ISBN: 9781424479603</identifier><identifier>ISBN: 1424479606</identifier><identifier>EISSN: 1558-4550</identifier><identifier>EISBN: 9781424479610</identifier><identifier>EISBN: 1424479614</identifier><identifier>EISBN: 9781424479597</identifier><identifier>EISBN: 1424479592</identifier><identifier>DOI: 10.1109/AUTEST.2010.5613589</identifier><language>eng</language><publisher>IEEE</publisher><subject>Connectors ; Fault trees ; Switches ; Test equipment ; Weapons</subject><ispartof>2010 IEEE AUTOTESTCON, 2010, p.1-5</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5613589$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,27902,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5613589$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Lospinuso, M</creatorcontrib><creatorcontrib>Marston, D</creatorcontrib><creatorcontrib>Gearhart, S</creatorcontrib><title>State configuration controller for network centric organizational at-system level testing</title><title>2010 IEEE AUTOTESTCON</title><addtitle>AUTEST</addtitle><description>Advanced diagnostic reasoners are being developed to make use of Bayesian fault probability distributions, experiential learning algorithms and actual net centric historical failure data to change dynamically or optimize the testing sequence. What is not covered is how also to reconfigure dynamically the system or unit under test and the test equipment from its present state to the state required for the desired test. This issue is especially acute in organizational level at-system testing where there can be a large number of possible states for the system under test and test hook ups when compared to Intermediate or Depot level Line Replaceable Unit (LRU) and/or board testing. This paper describe the work performed by the U.S. Army Automated Test Systems Division (ATSD) to design and implement a model based State Configuration Controller. How this solution can be used with any or even multiple reasoners, provided the proper interface is implemented, will also be discussed.</description><subject>Connectors</subject><subject>Fault trees</subject><subject>Switches</subject><subject>Test equipment</subject><subject>Weapons</subject><issn>1088-7725</issn><issn>1558-4550</issn><isbn>9781424479603</isbn><isbn>1424479606</isbn><isbn>9781424479610</isbn><isbn>1424479614</isbn><isbn>9781424479597</isbn><isbn>1424479592</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2010</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpVkM1OwzAQhM2fRCl9gl78AinrxOvYx6oqP1IlDg0HTpXrrCtDmiDHgMrTE6AXTrMz32qlHcamAmZCgLmZP1XLdTXLYQhQiQK1OWETU2ohcylLowScspFA1JlEhLN_DIrzgYHWWVnmeMmu-v4FIAdQOGLP62QTcde1Puzeo02ha39cil3TUOS-i7yl9NnFV-5oiIPjXdzZNnz97tqG25T1hz7Rnjf0QQ1P1KfQ7q7ZhbdNT5Ojjll1u6wW99nq8e5hMV9lwUDKpK-dASw1eKpLKYptvlVu61xdOw84PK-UVNo4cLWSAlBrMMKjdg6HqS7GbPp3NhDR5i2GvY2HzbGk4hsQt1k3</recordid><startdate>201009</startdate><enddate>201009</enddate><creator>Lospinuso, M</creator><creator>Marston, D</creator><creator>Gearhart, S</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>201009</creationdate><title>State configuration controller for network centric organizational at-system level testing</title><author>Lospinuso, M ; Marston, D ; Gearhart, S</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-4fdc905780fed7413b2b6cbccddcf05109664689c0cd6410588091f58cc5809d3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Connectors</topic><topic>Fault trees</topic><topic>Switches</topic><topic>Test equipment</topic><topic>Weapons</topic><toplevel>online_resources</toplevel><creatorcontrib>Lospinuso, M</creatorcontrib><creatorcontrib>Marston, D</creatorcontrib><creatorcontrib>Gearhart, S</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Lospinuso, M</au><au>Marston, D</au><au>Gearhart, S</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>State configuration controller for network centric organizational at-system level testing</atitle><btitle>2010 IEEE AUTOTESTCON</btitle><stitle>AUTEST</stitle><date>2010-09</date><risdate>2010</risdate><spage>1</spage><epage>5</epage><pages>1-5</pages><issn>1088-7725</issn><eissn>1558-4550</eissn><isbn>9781424479603</isbn><isbn>1424479606</isbn><eisbn>9781424479610</eisbn><eisbn>1424479614</eisbn><eisbn>9781424479597</eisbn><eisbn>1424479592</eisbn><abstract>Advanced diagnostic reasoners are being developed to make use of Bayesian fault probability distributions, experiential learning algorithms and actual net centric historical failure data to change dynamically or optimize the testing sequence. What is not covered is how also to reconfigure dynamically the system or unit under test and the test equipment from its present state to the state required for the desired test. This issue is especially acute in organizational level at-system testing where there can be a large number of possible states for the system under test and test hook ups when compared to Intermediate or Depot level Line Replaceable Unit (LRU) and/or board testing. This paper describe the work performed by the U.S. Army Automated Test Systems Division (ATSD) to design and implement a model based State Configuration Controller. How this solution can be used with any or even multiple reasoners, provided the proper interface is implemented, will also be discussed.</abstract><pub>IEEE</pub><doi>10.1109/AUTEST.2010.5613589</doi><tpages>5</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 1088-7725
ispartof 2010 IEEE AUTOTESTCON, 2010, p.1-5
issn 1088-7725
1558-4550
language eng
recordid cdi_ieee_primary_5613589
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Connectors
Fault trees
Switches
Test equipment
Weapons
title State configuration controller for network centric organizational at-system level testing
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-06T13%3A38%3A58IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=State%20configuration%20controller%20for%20network%20centric%20organizational%20at-system%20level%20testing&rft.btitle=2010%20IEEE%20AUTOTESTCON&rft.au=Lospinuso,%20M&rft.date=2010-09&rft.spage=1&rft.epage=5&rft.pages=1-5&rft.issn=1088-7725&rft.eissn=1558-4550&rft.isbn=9781424479603&rft.isbn_list=1424479606&rft_id=info:doi/10.1109/AUTEST.2010.5613589&rft_dat=%3Cieee_6IE%3E5613589%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&rft.eisbn=9781424479610&rft.eisbn_list=1424479614&rft.eisbn_list=9781424479597&rft.eisbn_list=1424479592&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=5613589&rfr_iscdi=true