Automated optical inspection method for MEMS fabrication
This paper presents a new optic inspection method for detection of defects in the layer of Micro Electro Mechanical Systems (MEMS) after the bonding process. In testing MEMS, a piezo driven vibrator is used to vibrate the MEMS device at its natural resonance frequency in vacuum environment. The ampl...
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creator | Yang, M Castellani, M Landot, R Beyeler, F Wang, Z Pham, D T |
description | This paper presents a new optic inspection method for detection of defects in the layer of Micro Electro Mechanical Systems (MEMS) after the bonding process. In testing MEMS, a piezo driven vibrator is used to vibrate the MEMS device at its natural resonance frequency in vacuum environment. The amplitude of the vibrated movement of the device is visually recorded and frame of the video is processed by the developed image processing algorithm. When excited by resonant frequency generator, the variance of deflection of the tested device can be the indicator of defectiveness of the MEMS. |
doi_str_mv | 10.1109/ICMA.2010.5589223 |
format | Conference Proceeding |
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In testing MEMS, a piezo driven vibrator is used to vibrate the MEMS device at its natural resonance frequency in vacuum environment. The amplitude of the vibrated movement of the device is visually recorded and frame of the video is processed by the developed image processing algorithm. When excited by resonant frequency generator, the variance of deflection of the tested device can be the indicator of defectiveness of the MEMS.</description><identifier>ISSN: 2152-7431</identifier><identifier>ISBN: 142445140X</identifier><identifier>ISBN: 9781424451401</identifier><identifier>EISSN: 2152-744X</identifier><identifier>EISBN: 1424451418</identifier><identifier>EISBN: 9781424451418</identifier><identifier>DOI: 10.1109/ICMA.2010.5589223</identifier><identifier>LCCN: 2009934325</identifier><language>eng</language><publisher>IEEE</publisher><subject>Grippers ; Inspection ; Micromechanical devices ; Pixel ; Resonant frequency ; Ultrafast optics ; Vibrations</subject><ispartof>2010 IEEE International Conference on Mechatronics and Automation, 2010, p.1923-1931</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5589223$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5589223$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Yang, M</creatorcontrib><creatorcontrib>Castellani, M</creatorcontrib><creatorcontrib>Landot, R</creatorcontrib><creatorcontrib>Beyeler, F</creatorcontrib><creatorcontrib>Wang, Z</creatorcontrib><creatorcontrib>Pham, D T</creatorcontrib><title>Automated optical inspection method for MEMS fabrication</title><title>2010 IEEE International Conference on Mechatronics and Automation</title><addtitle>ICMA</addtitle><description>This paper presents a new optic inspection method for detection of defects in the layer of Micro Electro Mechanical Systems (MEMS) after the bonding process. 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When excited by resonant frequency generator, the variance of deflection of the tested device can be the indicator of defectiveness of the MEMS.</description><subject>Grippers</subject><subject>Inspection</subject><subject>Micromechanical devices</subject><subject>Pixel</subject><subject>Resonant frequency</subject><subject>Ultrafast optics</subject><subject>Vibrations</subject><issn>2152-7431</issn><issn>2152-744X</issn><isbn>142445140X</isbn><isbn>9781424451401</isbn><isbn>1424451418</isbn><isbn>9781424451418</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2010</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpFkM1OwzAQhM1PJdrSB0Bc8gIp6_U6to9V1EKlRhzoobfKcWwR1DRRYg68PUFUMJfR6BvNYRh74LDkHMzTNi9WS4QxSqkNorhiM05IJDlxfc2myCWmiuhw8w_gcPsHBJ-wGQIYI0igvGOLYfiAUSSRazNlevUZ28ZGXyVtF2tnT0l9HjrvYt2ek8bH97ZKQtsnxbp4S4It-7Hzw-7ZJNjT4BcXn7P9Zr3PX9Ld6_M2X-3S2kBMvXbOcVcJIm81OipLBxlwhd6UmSyNUpm3UlEQCEJosGUgFYTzKCiAEnP2-Dtbe--PXV83tv86Xt4Q38fRTHg</recordid><startdate>201008</startdate><enddate>201008</enddate><creator>Yang, M</creator><creator>Castellani, M</creator><creator>Landot, R</creator><creator>Beyeler, F</creator><creator>Wang, Z</creator><creator>Pham, D T</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201008</creationdate><title>Automated optical inspection method for MEMS fabrication</title><author>Yang, M ; Castellani, M ; Landot, R ; Beyeler, F ; Wang, Z ; Pham, D T</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-e8ccc1cd344ea82c4bbc060172e9b65b9776ea574f3203380abf47f3ce234f073</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Grippers</topic><topic>Inspection</topic><topic>Micromechanical devices</topic><topic>Pixel</topic><topic>Resonant frequency</topic><topic>Ultrafast optics</topic><topic>Vibrations</topic><toplevel>online_resources</toplevel><creatorcontrib>Yang, M</creatorcontrib><creatorcontrib>Castellani, M</creatorcontrib><creatorcontrib>Landot, R</creatorcontrib><creatorcontrib>Beyeler, F</creatorcontrib><creatorcontrib>Wang, Z</creatorcontrib><creatorcontrib>Pham, D T</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Yang, M</au><au>Castellani, M</au><au>Landot, R</au><au>Beyeler, F</au><au>Wang, Z</au><au>Pham, D T</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Automated optical inspection method for MEMS fabrication</atitle><btitle>2010 IEEE International Conference on Mechatronics and Automation</btitle><stitle>ICMA</stitle><date>2010-08</date><risdate>2010</risdate><spage>1923</spage><epage>1931</epage><pages>1923-1931</pages><issn>2152-7431</issn><eissn>2152-744X</eissn><isbn>142445140X</isbn><isbn>9781424451401</isbn><eisbn>1424451418</eisbn><eisbn>9781424451418</eisbn><abstract>This paper presents a new optic inspection method for detection of defects in the layer of Micro Electro Mechanical Systems (MEMS) after the bonding process. In testing MEMS, a piezo driven vibrator is used to vibrate the MEMS device at its natural resonance frequency in vacuum environment. The amplitude of the vibrated movement of the device is visually recorded and frame of the video is processed by the developed image processing algorithm. When excited by resonant frequency generator, the variance of deflection of the tested device can be the indicator of defectiveness of the MEMS.</abstract><pub>IEEE</pub><doi>10.1109/ICMA.2010.5589223</doi><tpages>9</tpages></addata></record> |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Grippers Inspection Micromechanical devices Pixel Resonant frequency Ultrafast optics Vibrations |
title | Automated optical inspection method for MEMS fabrication |
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