Automated optical inspection method for MEMS fabrication

This paper presents a new optic inspection method for detection of defects in the layer of Micro Electro Mechanical Systems (MEMS) after the bonding process. In testing MEMS, a piezo driven vibrator is used to vibrate the MEMS device at its natural resonance frequency in vacuum environment. The ampl...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Yang, M, Castellani, M, Landot, R, Beyeler, F, Wang, Z, Pham, D T
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:This paper presents a new optic inspection method for detection of defects in the layer of Micro Electro Mechanical Systems (MEMS) after the bonding process. In testing MEMS, a piezo driven vibrator is used to vibrate the MEMS device at its natural resonance frequency in vacuum environment. The amplitude of the vibrated movement of the device is visually recorded and frame of the video is processed by the developed image processing algorithm. When excited by resonant frequency generator, the variance of deflection of the tested device can be the indicator of defectiveness of the MEMS.
ISSN:2152-7431
2152-744X
DOI:10.1109/ICMA.2010.5589223