Stress relaxation behaviour of connectors- development of simulation techniques

The stress relaxation behaviour of a connector has been simulated using the Finite Element Method. Material data from stress relaxation tests (four-point-bending) are utilized as input data to derive the relaxation behaviour of a connector subjected to a steady state temperature field. The model com...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Schedin, E., Thuvander, A., Henderson, P., Sandberg, P., Kamf, A.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 150
container_issue
container_start_page 142
container_title
container_volume
creator Schedin, E.
Thuvander, A.
Henderson, P.
Sandberg, P.
Kamf, A.
description The stress relaxation behaviour of a connector has been simulated using the Finite Element Method. Material data from stress relaxation tests (four-point-bending) are utilized as input data to derive the relaxation behaviour of a connector subjected to a steady state temperature field. The model comprises forming of the connector to a specified geometry and loading to a specified contact force. Relaxation data from four-point-bending tests are fitted to a power law expression for creep by setting a linear stress distribution through the sheet thickness. Other, more complex stress distributions were also used, but the result did not deviate much from the simple case. The creep data are used as input data for connector relaxation simulations. If relaxation data for the as-received material are utilized the rate of relaxation of the connector is underestimated compared to experiments. It is suggested that it is necessary to perform relaxation tests on cold worked material in order to correctly describe the relaxation behaviour of the bent portions of the connector. The effect of this approach is demonstrated and found successful. However, it is necessary to develop more reliable experimental methods to produce relaxation data on cold worked material.
doi_str_mv 10.1109/HOLM.1996.557191
format Conference Proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_557191</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>557191</ieee_id><sourcerecordid>557191</sourcerecordid><originalsourceid>FETCH-LOGICAL-c661-78777a45757407a84977da27d23b94174c1133e3f547849ed51661cd5fe35ae73</originalsourceid><addsrcrecordid>eNotj0FLxDAUhAMiKGvv4ql_oLWvSfqaoyzqCpUe3PuSTV_ZSNusSbrov7dSh4E5fMzAMHYPRQ5QqMdd27znoFSVS4mg4IolCutiMecSa37DkhA-i0VS1qWAW9Z-RE8hpJ4G_a2jdVN6pJO-WDf71PWpcdNEJjofsrSjCw3uPNIU_1Cw4zyslUjmNNmvmcIdu-71ECj5zw3bvzzvt7usaV_ftk9NZqoKMqwRUQuJEkWBuhYKsdMldiU_KgEoDADnxHspcIHUSVhqppM9cakJ-YY9rLOWiA5nb0ftfw7raf4LT5xNBw</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Stress relaxation behaviour of connectors- development of simulation techniques</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Schedin, E. ; Thuvander, A. ; Henderson, P. ; Sandberg, P. ; Kamf, A.</creator><creatorcontrib>Schedin, E. ; Thuvander, A. ; Henderson, P. ; Sandberg, P. ; Kamf, A.</creatorcontrib><description>The stress relaxation behaviour of a connector has been simulated using the Finite Element Method. Material data from stress relaxation tests (four-point-bending) are utilized as input data to derive the relaxation behaviour of a connector subjected to a steady state temperature field. The model comprises forming of the connector to a specified geometry and loading to a specified contact force. Relaxation data from four-point-bending tests are fitted to a power law expression for creep by setting a linear stress distribution through the sheet thickness. Other, more complex stress distributions were also used, but the result did not deviate much from the simple case. The creep data are used as input data for connector relaxation simulations. If relaxation data for the as-received material are utilized the rate of relaxation of the connector is underestimated compared to experiments. It is suggested that it is necessary to perform relaxation tests on cold worked material in order to correctly describe the relaxation behaviour of the bent portions of the connector. The effect of this approach is demonstrated and found successful. However, it is necessary to develop more reliable experimental methods to produce relaxation data on cold worked material.</description><identifier>ISBN: 9780780335783</identifier><identifier>ISBN: 0780335783</identifier><identifier>DOI: 10.1109/HOLM.1996.557191</identifier><language>eng</language><publisher>IEEE</publisher><subject>Connectors ; Contacts ; Creep ; Finite element methods ; Geometry ; Materials testing ; Solid modeling ; Steady-state ; Stress ; Temperature</subject><ispartof>Electrical Contacts - 1996. Proceedings of the Forty-Second IEEE Holm Conference on Electrical Contacts. Joint with the 18th International Conference on Electrical Contacts, 1996, p.142-150</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c661-78777a45757407a84977da27d23b94174c1133e3f547849ed51661cd5fe35ae73</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/557191$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,4050,4051,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/557191$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Schedin, E.</creatorcontrib><creatorcontrib>Thuvander, A.</creatorcontrib><creatorcontrib>Henderson, P.</creatorcontrib><creatorcontrib>Sandberg, P.</creatorcontrib><creatorcontrib>Kamf, A.</creatorcontrib><title>Stress relaxation behaviour of connectors- development of simulation techniques</title><title>Electrical Contacts - 1996. Proceedings of the Forty-Second IEEE Holm Conference on Electrical Contacts. Joint with the 18th International Conference on Electrical Contacts</title><addtitle>HOLM</addtitle><description>The stress relaxation behaviour of a connector has been simulated using the Finite Element Method. Material data from stress relaxation tests (four-point-bending) are utilized as input data to derive the relaxation behaviour of a connector subjected to a steady state temperature field. The model comprises forming of the connector to a specified geometry and loading to a specified contact force. Relaxation data from four-point-bending tests are fitted to a power law expression for creep by setting a linear stress distribution through the sheet thickness. Other, more complex stress distributions were also used, but the result did not deviate much from the simple case. The creep data are used as input data for connector relaxation simulations. If relaxation data for the as-received material are utilized the rate of relaxation of the connector is underestimated compared to experiments. It is suggested that it is necessary to perform relaxation tests on cold worked material in order to correctly describe the relaxation behaviour of the bent portions of the connector. The effect of this approach is demonstrated and found successful. However, it is necessary to develop more reliable experimental methods to produce relaxation data on cold worked material.</description><subject>Connectors</subject><subject>Contacts</subject><subject>Creep</subject><subject>Finite element methods</subject><subject>Geometry</subject><subject>Materials testing</subject><subject>Solid modeling</subject><subject>Steady-state</subject><subject>Stress</subject><subject>Temperature</subject><isbn>9780780335783</isbn><isbn>0780335783</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1996</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj0FLxDAUhAMiKGvv4ql_oLWvSfqaoyzqCpUe3PuSTV_ZSNusSbrov7dSh4E5fMzAMHYPRQ5QqMdd27znoFSVS4mg4IolCutiMecSa37DkhA-i0VS1qWAW9Z-RE8hpJ4G_a2jdVN6pJO-WDf71PWpcdNEJjofsrSjCw3uPNIU_1Cw4zyslUjmNNmvmcIdu-71ECj5zw3bvzzvt7usaV_ftk9NZqoKMqwRUQuJEkWBuhYKsdMldiU_KgEoDADnxHspcIHUSVhqppM9cakJ-YY9rLOWiA5nb0ftfw7raf4LT5xNBw</recordid><startdate>1996</startdate><enddate>1996</enddate><creator>Schedin, E.</creator><creator>Thuvander, A.</creator><creator>Henderson, P.</creator><creator>Sandberg, P.</creator><creator>Kamf, A.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1996</creationdate><title>Stress relaxation behaviour of connectors- development of simulation techniques</title><author>Schedin, E. ; Thuvander, A. ; Henderson, P. ; Sandberg, P. ; Kamf, A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c661-78777a45757407a84977da27d23b94174c1133e3f547849ed51661cd5fe35ae73</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1996</creationdate><topic>Connectors</topic><topic>Contacts</topic><topic>Creep</topic><topic>Finite element methods</topic><topic>Geometry</topic><topic>Materials testing</topic><topic>Solid modeling</topic><topic>Steady-state</topic><topic>Stress</topic><topic>Temperature</topic><toplevel>online_resources</toplevel><creatorcontrib>Schedin, E.</creatorcontrib><creatorcontrib>Thuvander, A.</creatorcontrib><creatorcontrib>Henderson, P.</creatorcontrib><creatorcontrib>Sandberg, P.</creatorcontrib><creatorcontrib>Kamf, A.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Schedin, E.</au><au>Thuvander, A.</au><au>Henderson, P.</au><au>Sandberg, P.</au><au>Kamf, A.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Stress relaxation behaviour of connectors- development of simulation techniques</atitle><btitle>Electrical Contacts - 1996. Proceedings of the Forty-Second IEEE Holm Conference on Electrical Contacts. Joint with the 18th International Conference on Electrical Contacts</btitle><stitle>HOLM</stitle><date>1996</date><risdate>1996</risdate><spage>142</spage><epage>150</epage><pages>142-150</pages><isbn>9780780335783</isbn><isbn>0780335783</isbn><abstract>The stress relaxation behaviour of a connector has been simulated using the Finite Element Method. Material data from stress relaxation tests (four-point-bending) are utilized as input data to derive the relaxation behaviour of a connector subjected to a steady state temperature field. The model comprises forming of the connector to a specified geometry and loading to a specified contact force. Relaxation data from four-point-bending tests are fitted to a power law expression for creep by setting a linear stress distribution through the sheet thickness. Other, more complex stress distributions were also used, but the result did not deviate much from the simple case. The creep data are used as input data for connector relaxation simulations. If relaxation data for the as-received material are utilized the rate of relaxation of the connector is underestimated compared to experiments. It is suggested that it is necessary to perform relaxation tests on cold worked material in order to correctly describe the relaxation behaviour of the bent portions of the connector. The effect of this approach is demonstrated and found successful. However, it is necessary to develop more reliable experimental methods to produce relaxation data on cold worked material.</abstract><pub>IEEE</pub><doi>10.1109/HOLM.1996.557191</doi><tpages>9</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISBN: 9780780335783
ispartof Electrical Contacts - 1996. Proceedings of the Forty-Second IEEE Holm Conference on Electrical Contacts. Joint with the 18th International Conference on Electrical Contacts, 1996, p.142-150
issn
language eng
recordid cdi_ieee_primary_557191
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Connectors
Contacts
Creep
Finite element methods
Geometry
Materials testing
Solid modeling
Steady-state
Stress
Temperature
title Stress relaxation behaviour of connectors- development of simulation techniques
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-01T05%3A12%3A41IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Stress%20relaxation%20behaviour%20of%20connectors-%20development%20of%20simulation%20techniques&rft.btitle=Electrical%20Contacts%20-%201996.%20Proceedings%20of%20the%20Forty-Second%20IEEE%20Holm%20Conference%20on%20Electrical%20Contacts.%20Joint%20with%20the%2018th%20International%20Conference%20on%20Electrical%20Contacts&rft.au=Schedin,%20E.&rft.date=1996&rft.spage=142&rft.epage=150&rft.pages=142-150&rft.isbn=9780780335783&rft.isbn_list=0780335783&rft_id=info:doi/10.1109/HOLM.1996.557191&rft_dat=%3Cieee_6IE%3E557191%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=557191&rfr_iscdi=true