Iddq test: sensitivity analysis of scaling

While technology is changing the face of the world, it itself is changing by leaps and bounds; there is a continuing trend to put more functionality on the same piece of silicon. Without major changes in the CMOS technology, it has been shown that the scaling of devices has significant impact on the...

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Bibliographische Detailangaben

Hauptverfasser:	Williams, T.W., Dennard, R.H., Kapur, R., Mercer, M.R., Maly, M.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	CMOS technology Doping Geometry Leakage current Monitoring Pulp manufacturing Sensitivity analysis Silicon Testing Voltage
Online-Zugang:	Volltext bestellen
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