Iddq test: sensitivity analysis of scaling
While technology is changing the face of the world, it itself is changing by leaps and bounds; there is a continuing trend to put more functionality on the same piece of silicon. Without major changes in the CMOS technology, it has been shown that the scaling of devices has significant impact on the...
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| creator | Williams, T.W. Dennard, R.H. Kapur, R. Mercer, M.R. Maly, M. |
| description | While technology is changing the face of the world, it itself is changing by leaps and bounds; there is a continuing trend to put more functionality on the same piece of silicon. Without major changes in the CMOS technology, it has been shown that the scaling of devices has significant impact on the effectiveness of Iddq testing. The sensitivity of Iddq testing to individual device parameters is studied. It is explained how Iddq testing becomes increasingly ineffective in the scaled product with respect to most parameters and can be improved with others. |
| doi_str_mv | 10.1109/TEST.1996.557138 |
| format | Conference Proceeding |
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| ispartof | Proceedings International Test Conference 1996. Test and Design Validity, 1996, p.786-792 |
| issn | 1089-3539 2378-2250 |
| language | eng |
| recordid | cdi_ieee_primary_557138 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | CMOS technology Doping Geometry Leakage current Monitoring Pulp manufacturing Sensitivity analysis Silicon Testing Voltage |
| title | Iddq test: sensitivity analysis of scaling |
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