Influence of lateral currents on capacitance spectra of organic metal-insulator-semiconductor structures with a ferroelectric insulator

The capacitance spectra of a metal-insulator-semiconductor (MIS) structure are discussed in terms of parasitic effects, caused by lateral currents along the insulator/ semiconductor interface. The organic materials Poly(vinylidene fluoride-trifluoroethylene) (P(VDF-TrFE)) and poly(3-hexylthiophene)...

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Bibliographische Detailangaben

Hauptverfasser:	Kalbitz, René, Frübing, Peter, Gerhard, Reimund, Taylor, D Martin
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Capacitance Electrodes Frequency measurement Insulators MIS devices Resistance Semiconductor device measurement
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