A partitioning approach to improve reconfigurable neuron-inspired online BIST

Two of the most challenging issues in online testing are deriving a general tester scheme for various circuits and reducing the area overhead. This paper presents a novel reconfigurable online tester using artificial neural networks to test combinational hardware. Our proposed BIST architecture has...

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Bibliographische Detailangaben

Hauptverfasser:	Shahabi, A, Hosseini, S B, Sohofi, H, Navabi, Z
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Artificial neural networks Built-in self-test Circuit faults Digital Logic Modeling Digital Neural Networks Hardware Neurons On-line Testing Partitioning Self-Checking Training
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