Enhanced Implementations of Hamming Codes to Protect FIR Filters

Soft errors, especially those produced in harsh environments (as for example radiation), are a major concern for digital circuits. As technology shrinks, the failure probability of systems working in these environments is steadily growing. In order to tackle this issue, several design techniques are...

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Veröffentlicht in:	IEEE transactions on nuclear science 2010-08, Vol.57 (4), p.2112-2118
Hauptverfasser:	Shih-Fu Liu, Reviriego, Pedro, Maestro, Juan Antonio
Format:	Artikel
Sprache:	eng
Schlagworte:	Circuits Design engineering Design parameters Digital circuits Digital filters Finite impulse response filter Hamming codes IIR filters Impulse response Integrated circuit technology Mathematical analysis Protection Redundancy reliability Silicon Single event upset Single Event Upset (SEU) Soft errors Space missions
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