Enhanced on-Die RC Characterization Methodology

This paper focuses on the power delivery network (PDN) characterization of high speed IC; particularly focusing on the on-die decoupling capacitance (Cdie) and on-die resistance and on die metal grid resistance (Rdie+Rgrid) characterization. For accurate modeling of Cdie, Rdie and Rgrid, two differe...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Fern Nee Tan, Li Chuang Quek
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Capacitance Electrical resistance measurement Frequency Impedance On die capacitance (Cdie) On die resistance (Rdie) Packaging Power delivery network (PDN) modeling and characterization Power Grid resistance (Rgrid) Power grids Power supplies Resonance Semiconductor device measurement Semiconductor device modeling
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