AccuBridge™ towards the development of a DC Current Comparator resistance ratio standard
Inherent ratio errors of 0.1 to 0.2 ppm in the Direct Current Comparator (DCC) have hindered its development as a standalone bridge. By improving the technologies described in the paper, the reduction of the inherent ratio error to
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| creator | Brown, Duane Wachowicz, Andrew Shiping Huang |
| description | Inherent ratio errors of 0.1 to 0.2 ppm in the Direct Current Comparator (DCC) have hindered its development as a standalone bridge. By improving the technologies described in the paper, the reduction of the inherent ratio error to |
| doi_str_mv | 10.1109/CPEM.2010.5544229 |
| format | Conference Proceeding |
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By improving the technologies described in the paper, the reduction of the inherent ratio error to <; 0.02 ppm can be achieved. Verification of the ratio accuracy can now be performed from a ratio of 0.07:1 to 14:1 with a resolution of 0.001 ppm. Automatic balancing facilitates the operation of the bridge for more accurate resistance measurements over the range of 0.1Ω to 100 kΩ.</description><identifier>ISSN: 0589-1485</identifier><identifier>ISBN: 9781424467952</identifier><identifier>ISBN: 1424467950</identifier><identifier>EISSN: 2160-0171</identifier><identifier>EISBN: 9781424467976</identifier><identifier>EISBN: 1424467977</identifier><identifier>EISBN: 9781424467969</identifier><identifier>EISBN: 1424467969</identifier><identifier>DOI: 10.1109/CPEM.2010.5544229</identifier><language>eng</language><publisher>IEEE</publisher><subject>AccuBridge ; ampere turns ; Bridges ; Calibration ; Current measurement ; Detectors ; Direct Current Comparator (DCC) ; Electrical resistance measurement ; Electromagnetic measurements ; improved partial turn technology ; Master-slave ; ratio error ; Resistors ; turns calibration ; variable slave turns ; Voltage ; Wounds</subject><ispartof>CPEM 2010, 2010, p.639-640</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5544229$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5544229$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Brown, Duane</creatorcontrib><creatorcontrib>Wachowicz, Andrew</creatorcontrib><creatorcontrib>Shiping Huang</creatorcontrib><title>AccuBridge™ towards the development of a DC Current Comparator resistance ratio standard</title><title>CPEM 2010</title><addtitle>CPEM</addtitle><description>Inherent ratio errors of 0.1 to 0.2 ppm in the Direct Current Comparator (DCC) have hindered its development as a standalone bridge. By improving the technologies described in the paper, the reduction of the inherent ratio error to <; 0.02 ppm can be achieved. Verification of the ratio accuracy can now be performed from a ratio of 0.07:1 to 14:1 with a resolution of 0.001 ppm. Automatic balancing facilitates the operation of the bridge for more accurate resistance measurements over the range of 0.1Ω to 100 kΩ.</description><subject>AccuBridge</subject><subject>ampere turns</subject><subject>Bridges</subject><subject>Calibration</subject><subject>Current measurement</subject><subject>Detectors</subject><subject>Direct Current Comparator (DCC)</subject><subject>Electrical resistance measurement</subject><subject>Electromagnetic measurements</subject><subject>improved partial turn technology</subject><subject>Master-slave</subject><subject>ratio error</subject><subject>Resistors</subject><subject>turns calibration</subject><subject>variable slave turns</subject><subject>Voltage</subject><subject>Wounds</subject><issn>0589-1485</issn><issn>2160-0171</issn><isbn>9781424467952</isbn><isbn>1424467950</isbn><isbn>9781424467976</isbn><isbn>1424467977</isbn><isbn>9781424467969</isbn><isbn>1424467969</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2010</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpVkDtOw0AYhJeXhBV8AESzF3DY96MMJjykIChS0UTr3d9gFMfWegOi5yQcjZPgiDRMM_pmpCkGoXNKppQSe1k-zR-mjIwopRCM2QOUW22oYEIobbU6RBmjihSEanr0r5PsGGVEGltQYeQpyofhjYwSklFNMvQ88357FZvwAj9f3zh1Hy6GAadXwAHeYd31LWwS7mrs8HWJy22MOy67tnfRpS7iCEMzJLfxgMeg6fAOwrhyhk5qtx4g3_sELW_my_KuWDze3pezRdFYkoqKVSFUVU21llIzVRvFPedEGOK5oEywyqggtautt8FKD6CCl66SEKytFZ-gi7_ZBgBWfWxaFz9X-6P4L_djWWw</recordid><startdate>201006</startdate><enddate>201006</enddate><creator>Brown, Duane</creator><creator>Wachowicz, Andrew</creator><creator>Shiping Huang</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>201006</creationdate><title>AccuBridge™ towards the development of a DC Current Comparator resistance ratio standard</title><author>Brown, Duane ; Wachowicz, Andrew ; Shiping Huang</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-b2bddbbf17755726f863c330480c341242b86d57af9c9d95cee6dc5ab5ed99f63</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2010</creationdate><topic>AccuBridge</topic><topic>ampere turns</topic><topic>Bridges</topic><topic>Calibration</topic><topic>Current measurement</topic><topic>Detectors</topic><topic>Direct Current Comparator (DCC)</topic><topic>Electrical resistance measurement</topic><topic>Electromagnetic measurements</topic><topic>improved partial turn technology</topic><topic>Master-slave</topic><topic>ratio error</topic><topic>Resistors</topic><topic>turns calibration</topic><topic>variable slave turns</topic><topic>Voltage</topic><topic>Wounds</topic><toplevel>online_resources</toplevel><creatorcontrib>Brown, Duane</creatorcontrib><creatorcontrib>Wachowicz, Andrew</creatorcontrib><creatorcontrib>Shiping Huang</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Brown, Duane</au><au>Wachowicz, Andrew</au><au>Shiping Huang</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>AccuBridge™ towards the development of a DC Current Comparator resistance ratio standard</atitle><btitle>CPEM 2010</btitle><stitle>CPEM</stitle><date>2010-06</date><risdate>2010</risdate><spage>639</spage><epage>640</epage><pages>639-640</pages><issn>0589-1485</issn><eissn>2160-0171</eissn><isbn>9781424467952</isbn><isbn>1424467950</isbn><eisbn>9781424467976</eisbn><eisbn>1424467977</eisbn><eisbn>9781424467969</eisbn><eisbn>1424467969</eisbn><abstract>Inherent ratio errors of 0.1 to 0.2 ppm in the Direct Current Comparator (DCC) have hindered its development as a standalone bridge. By improving the technologies described in the paper, the reduction of the inherent ratio error to <; 0.02 ppm can be achieved. Verification of the ratio accuracy can now be performed from a ratio of 0.07:1 to 14:1 with a resolution of 0.001 ppm. Automatic balancing facilitates the operation of the bridge for more accurate resistance measurements over the range of 0.1Ω to 100 kΩ.</abstract><pub>IEEE</pub><doi>10.1109/CPEM.2010.5544229</doi><tpages>2</tpages></addata></record> |
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| ispartof | CPEM 2010, 2010, p.639-640 |
| issn | 0589-1485 2160-0171 |
| language | eng |
| recordid | cdi_ieee_primary_5544229 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | AccuBridge ampere turns Bridges Calibration Current measurement Detectors Direct Current Comparator (DCC) Electrical resistance measurement Electromagnetic measurements improved partial turn technology Master-slave ratio error Resistors turns calibration variable slave turns Voltage Wounds |
| title | AccuBridge™ towards the development of a DC Current Comparator resistance ratio standard |
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