Status of the michelle code and applications

The MICHELLE code is a Finite-Element Electrostatic Particle in Cell code for application to 2D and 3D particle beam formation, transport, and collection. Although its initial development focus had been for DC electron guns and depressed collectors, other applications such as RF electron guns, ion t...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Petillo, John, Panagos, Dimitrios, Ovtchinnikov, Serguei, Burke, Alex, Kostas, Chris, Held, Ben, DeFord, John, Nelson, Eric, Nguyen, Khanh, Wright, Ed, Jensen, Kevin, Levush, Baruch
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 1
container_issue
container_start_page 1
container_title
container_volume
creator Petillo, John
Panagos, Dimitrios
Ovtchinnikov, Serguei
Burke, Alex
Kostas, Chris
Held, Ben
DeFord, John
Nelson, Eric
Nguyen, Khanh
Wright, Ed
Jensen, Kevin
Levush, Baruch
description The MICHELLE code is a Finite-Element Electrostatic Particle in Cell code for application to 2D and 3D particle beam formation, transport, and collection. Although its initial development focus had been for DC electron guns and depressed collectors, other applications such as RF electron guns, ion thrusters, photocathodes, etc. have become a recent focus. The MICHELLE code's ability to manage large mesh sizes and large particle counts in complex geometries requiring the resolution of disparate spatial scales in 2D and 3D on desktop computers has allowed it to be applied to devices that could not have been readily modeled in recent years. This presentation gives an overview of recent applications, capabilities, and the current status of MICHELLE. A gun optimization problem for a THz application will be presented. The effects of different modeling parameters and meshing techniques will be illustrated.
doi_str_mv 10.1109/PLASMA.2010.5533967
format Conference Proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_5533967</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5533967</ieee_id><sourcerecordid>5533967</sourcerecordid><originalsourceid>FETCH-ieee_primary_55339673</originalsourceid><addsrcrecordid>eNp9jrsOgjAYRn9viUR5ApY-gOBPaSmMxGgcNDHBnTRQQg23UBx8exlYXPyWk5yzfACOj57vY3x83JL0nngUJ8F5EMShWIAdi8hnlDHOBGdLsCgXoSsoRqufxsQaLBQBuvEktmAb88JpjFNEYcEhHeX4NqQryVgp0ui8UnWtSN4Visi2ILLva53LUXet2cOmlLVR9swdOJfz83R1tVIq6wfdyOGTzR-D__ULI5s44w</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Status of the michelle code and applications</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Petillo, John ; Panagos, Dimitrios ; Ovtchinnikov, Serguei ; Burke, Alex ; Kostas, Chris ; Held, Ben ; DeFord, John ; Nelson, Eric ; Nguyen, Khanh ; Wright, Ed ; Jensen, Kevin ; Levush, Baruch</creator><creatorcontrib>Petillo, John ; Panagos, Dimitrios ; Ovtchinnikov, Serguei ; Burke, Alex ; Kostas, Chris ; Held, Ben ; DeFord, John ; Nelson, Eric ; Nguyen, Khanh ; Wright, Ed ; Jensen, Kevin ; Levush, Baruch</creatorcontrib><description>The MICHELLE code is a Finite-Element Electrostatic Particle in Cell code for application to 2D and 3D particle beam formation, transport, and collection. Although its initial development focus had been for DC electron guns and depressed collectors, other applications such as RF electron guns, ion thrusters, photocathodes, etc. have become a recent focus. The MICHELLE code's ability to manage large mesh sizes and large particle counts in complex geometries requiring the resolution of disparate spatial scales in 2D and 3D on desktop computers has allowed it to be applied to devices that could not have been readily modeled in recent years. This presentation gives an overview of recent applications, capabilities, and the current status of MICHELLE. A gun optimization problem for a THz application will be presented. The effects of different modeling parameters and meshing techniques will be illustrated.</description><identifier>ISSN: 0730-9244</identifier><identifier>ISBN: 9781424454747</identifier><identifier>ISBN: 1424454743</identifier><identifier>EISSN: 2576-7208</identifier><identifier>EISBN: 9781424454754</identifier><identifier>EISBN: 1424454751</identifier><identifier>EISBN: 142445476X</identifier><identifier>EISBN: 9781424454761</identifier><identifier>DOI: 10.1109/PLASMA.2010.5533967</identifier><language>eng</language><publisher>IEEE</publisher><subject>Application software ; Cathodes ; Computational geometry ; Electron guns ; Electrostatics ; Finite element methods ; Particle beams ; Radio frequency ; Solid modeling ; Spatial resolution</subject><ispartof>2010 Abstracts IEEE International Conference on Plasma Science, 2010, p.1-1</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5533967$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5533967$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Petillo, John</creatorcontrib><creatorcontrib>Panagos, Dimitrios</creatorcontrib><creatorcontrib>Ovtchinnikov, Serguei</creatorcontrib><creatorcontrib>Burke, Alex</creatorcontrib><creatorcontrib>Kostas, Chris</creatorcontrib><creatorcontrib>Held, Ben</creatorcontrib><creatorcontrib>DeFord, John</creatorcontrib><creatorcontrib>Nelson, Eric</creatorcontrib><creatorcontrib>Nguyen, Khanh</creatorcontrib><creatorcontrib>Wright, Ed</creatorcontrib><creatorcontrib>Jensen, Kevin</creatorcontrib><creatorcontrib>Levush, Baruch</creatorcontrib><title>Status of the michelle code and applications</title><title>2010 Abstracts IEEE International Conference on Plasma Science</title><addtitle>PLASMA</addtitle><description>The MICHELLE code is a Finite-Element Electrostatic Particle in Cell code for application to 2D and 3D particle beam formation, transport, and collection. Although its initial development focus had been for DC electron guns and depressed collectors, other applications such as RF electron guns, ion thrusters, photocathodes, etc. have become a recent focus. The MICHELLE code's ability to manage large mesh sizes and large particle counts in complex geometries requiring the resolution of disparate spatial scales in 2D and 3D on desktop computers has allowed it to be applied to devices that could not have been readily modeled in recent years. This presentation gives an overview of recent applications, capabilities, and the current status of MICHELLE. A gun optimization problem for a THz application will be presented. The effects of different modeling parameters and meshing techniques will be illustrated.</description><subject>Application software</subject><subject>Cathodes</subject><subject>Computational geometry</subject><subject>Electron guns</subject><subject>Electrostatics</subject><subject>Finite element methods</subject><subject>Particle beams</subject><subject>Radio frequency</subject><subject>Solid modeling</subject><subject>Spatial resolution</subject><issn>0730-9244</issn><issn>2576-7208</issn><isbn>9781424454747</isbn><isbn>1424454743</isbn><isbn>9781424454754</isbn><isbn>1424454751</isbn><isbn>142445476X</isbn><isbn>9781424454761</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2010</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNp9jrsOgjAYRn9viUR5ApY-gOBPaSmMxGgcNDHBnTRQQg23UBx8exlYXPyWk5yzfACOj57vY3x83JL0nngUJ8F5EMShWIAdi8hnlDHOBGdLsCgXoSsoRqufxsQaLBQBuvEktmAb88JpjFNEYcEhHeX4NqQryVgp0ui8UnWtSN4Visi2ILLva53LUXet2cOmlLVR9swdOJfz83R1tVIq6wfdyOGTzR-D__ULI5s44w</recordid><startdate>201006</startdate><enddate>201006</enddate><creator>Petillo, John</creator><creator>Panagos, Dimitrios</creator><creator>Ovtchinnikov, Serguei</creator><creator>Burke, Alex</creator><creator>Kostas, Chris</creator><creator>Held, Ben</creator><creator>DeFord, John</creator><creator>Nelson, Eric</creator><creator>Nguyen, Khanh</creator><creator>Wright, Ed</creator><creator>Jensen, Kevin</creator><creator>Levush, Baruch</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>201006</creationdate><title>Status of the michelle code and applications</title><author>Petillo, John ; Panagos, Dimitrios ; Ovtchinnikov, Serguei ; Burke, Alex ; Kostas, Chris ; Held, Ben ; DeFord, John ; Nelson, Eric ; Nguyen, Khanh ; Wright, Ed ; Jensen, Kevin ; Levush, Baruch</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-ieee_primary_55339673</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Application software</topic><topic>Cathodes</topic><topic>Computational geometry</topic><topic>Electron guns</topic><topic>Electrostatics</topic><topic>Finite element methods</topic><topic>Particle beams</topic><topic>Radio frequency</topic><topic>Solid modeling</topic><topic>Spatial resolution</topic><toplevel>online_resources</toplevel><creatorcontrib>Petillo, John</creatorcontrib><creatorcontrib>Panagos, Dimitrios</creatorcontrib><creatorcontrib>Ovtchinnikov, Serguei</creatorcontrib><creatorcontrib>Burke, Alex</creatorcontrib><creatorcontrib>Kostas, Chris</creatorcontrib><creatorcontrib>Held, Ben</creatorcontrib><creatorcontrib>DeFord, John</creatorcontrib><creatorcontrib>Nelson, Eric</creatorcontrib><creatorcontrib>Nguyen, Khanh</creatorcontrib><creatorcontrib>Wright, Ed</creatorcontrib><creatorcontrib>Jensen, Kevin</creatorcontrib><creatorcontrib>Levush, Baruch</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Petillo, John</au><au>Panagos, Dimitrios</au><au>Ovtchinnikov, Serguei</au><au>Burke, Alex</au><au>Kostas, Chris</au><au>Held, Ben</au><au>DeFord, John</au><au>Nelson, Eric</au><au>Nguyen, Khanh</au><au>Wright, Ed</au><au>Jensen, Kevin</au><au>Levush, Baruch</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Status of the michelle code and applications</atitle><btitle>2010 Abstracts IEEE International Conference on Plasma Science</btitle><stitle>PLASMA</stitle><date>2010-06</date><risdate>2010</risdate><spage>1</spage><epage>1</epage><pages>1-1</pages><issn>0730-9244</issn><eissn>2576-7208</eissn><isbn>9781424454747</isbn><isbn>1424454743</isbn><eisbn>9781424454754</eisbn><eisbn>1424454751</eisbn><eisbn>142445476X</eisbn><eisbn>9781424454761</eisbn><abstract>The MICHELLE code is a Finite-Element Electrostatic Particle in Cell code for application to 2D and 3D particle beam formation, transport, and collection. Although its initial development focus had been for DC electron guns and depressed collectors, other applications such as RF electron guns, ion thrusters, photocathodes, etc. have become a recent focus. The MICHELLE code's ability to manage large mesh sizes and large particle counts in complex geometries requiring the resolution of disparate spatial scales in 2D and 3D on desktop computers has allowed it to be applied to devices that could not have been readily modeled in recent years. This presentation gives an overview of recent applications, capabilities, and the current status of MICHELLE. A gun optimization problem for a THz application will be presented. The effects of different modeling parameters and meshing techniques will be illustrated.</abstract><pub>IEEE</pub><doi>10.1109/PLASMA.2010.5533967</doi></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0730-9244
ispartof 2010 Abstracts IEEE International Conference on Plasma Science, 2010, p.1-1
issn 0730-9244
2576-7208
language eng
recordid cdi_ieee_primary_5533967
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Application software
Cathodes
Computational geometry
Electron guns
Electrostatics
Finite element methods
Particle beams
Radio frequency
Solid modeling
Spatial resolution
title Status of the michelle code and applications
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-21T16%3A51%3A09IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Status%20of%20the%20michelle%20code%20and%20applications&rft.btitle=2010%20Abstracts%20IEEE%20International%20Conference%20on%20Plasma%20Science&rft.au=Petillo,%20John&rft.date=2010-06&rft.spage=1&rft.epage=1&rft.pages=1-1&rft.issn=0730-9244&rft.eissn=2576-7208&rft.isbn=9781424454747&rft.isbn_list=1424454743&rft_id=info:doi/10.1109/PLASMA.2010.5533967&rft_dat=%3Cieee_6IE%3E5533967%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&rft.eisbn=9781424454754&rft.eisbn_list=1424454751&rft.eisbn_list=142445476X&rft.eisbn_list=9781424454761&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=5533967&rfr_iscdi=true