Measurement of Transient Voltages Induced by Disconnect Switch Operation
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Veröffentlicht in: | IEEE power engineering review 1985-01, Vol.PER-5 (1), p.41-42 |
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container_title | IEEE power engineering review |
container_volume | PER-5 |
creator | Murase, H. Ohshima, I. Aoyagi, H. Miwa, I. |
description | |
doi_str_mv | 10.1109/MPER.1985.5528562 |
format | Article |
fullrecord | <record><control><sourceid>crossref_RIE</sourceid><recordid>TN_cdi_ieee_primary_5528562</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5528562</ieee_id><sourcerecordid>10_1109_MPER_1985_5528562</sourcerecordid><originalsourceid>FETCH-LOGICAL-c180t-d9b5db5642344dc7966084d7f8ef3890d9fa048d6c3e7a448de0d70a365b90b23</originalsourceid><addsrcrecordid>eNo9kMtOwkAUhidGExF9AONmXqB4ZjrXpUEUEghG0W0znTnVGmjJTInh7aUBXZ3_5L8sPkJuGYwYA3u_eJm8jpg1ciQlN1LxMzJgUpqMaZDnZABc84Pm4pJcpfQNAFoZOSDTBbq0i7jBpqNtRVfRNanun4923blPTHTWhJ3HQMs9fayTb5sGfUfffurOf9HlFqPr6ra5JheVWye8Od0heX-arMbTbL58no0f5plnBros2FKGUirBcyGC11YpMCLoymCVGwvBVg6ECcrnqJ04KISgweVKlhZKng8JO-762KYUsSq2sd64uC8YFD2KokdR9CiKE4pD5-7YqRHxP__n_gLsaVsB</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Measurement of Transient Voltages Induced by Disconnect Switch Operation</title><source>IEEE Electronic Library (IEL)</source><creator>Murase, H. ; Ohshima, I. ; Aoyagi, H. ; Miwa, I.</creator><creatorcontrib>Murase, H. ; Ohshima, I. ; Aoyagi, H. ; Miwa, I.</creatorcontrib><identifier>ISSN: 0272-1724</identifier><identifier>EISSN: 1558-1705</identifier><identifier>DOI: 10.1109/MPER.1985.5528562</identifier><identifier>CODEN: IPERDV</identifier><language>eng</language><publisher>IEEE</publisher><subject>Circuit testing ; Electrodes ; EMTP ; Geographic Information Systems ; Light emitting diodes ; Power measurement ; Surges ; Switches ; Vacuum arcs ; Voltage</subject><ispartof>IEEE power engineering review, 1985-01, Vol.PER-5 (1), p.41-42</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c180t-d9b5db5642344dc7966084d7f8ef3890d9fa048d6c3e7a448de0d70a365b90b23</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5528562$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5528562$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Murase, H.</creatorcontrib><creatorcontrib>Ohshima, I.</creatorcontrib><creatorcontrib>Aoyagi, H.</creatorcontrib><creatorcontrib>Miwa, I.</creatorcontrib><title>Measurement of Transient Voltages Induced by Disconnect Switch Operation</title><title>IEEE power engineering review</title><addtitle>PER</addtitle><subject>Circuit testing</subject><subject>Electrodes</subject><subject>EMTP</subject><subject>Geographic Information Systems</subject><subject>Light emitting diodes</subject><subject>Power measurement</subject><subject>Surges</subject><subject>Switches</subject><subject>Vacuum arcs</subject><subject>Voltage</subject><issn>0272-1724</issn><issn>1558-1705</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1985</creationdate><recordtype>article</recordtype><recordid>eNo9kMtOwkAUhidGExF9AONmXqB4ZjrXpUEUEghG0W0znTnVGmjJTInh7aUBXZ3_5L8sPkJuGYwYA3u_eJm8jpg1ciQlN1LxMzJgUpqMaZDnZABc84Pm4pJcpfQNAFoZOSDTBbq0i7jBpqNtRVfRNanun4923blPTHTWhJ3HQMs9fayTb5sGfUfffurOf9HlFqPr6ra5JheVWye8Od0heX-arMbTbL58no0f5plnBros2FKGUirBcyGC11YpMCLoymCVGwvBVg6ECcrnqJ04KISgweVKlhZKng8JO-762KYUsSq2sd64uC8YFD2KokdR9CiKE4pD5-7YqRHxP__n_gLsaVsB</recordid><startdate>198501</startdate><enddate>198501</enddate><creator>Murase, H.</creator><creator>Ohshima, I.</creator><creator>Aoyagi, H.</creator><creator>Miwa, I.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>198501</creationdate><title>Measurement of Transient Voltages Induced by Disconnect Switch Operation</title><author>Murase, H. ; Ohshima, I. ; Aoyagi, H. ; Miwa, I.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c180t-d9b5db5642344dc7966084d7f8ef3890d9fa048d6c3e7a448de0d70a365b90b23</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1985</creationdate><topic>Circuit testing</topic><topic>Electrodes</topic><topic>EMTP</topic><topic>Geographic Information Systems</topic><topic>Light emitting diodes</topic><topic>Power measurement</topic><topic>Surges</topic><topic>Switches</topic><topic>Vacuum arcs</topic><topic>Voltage</topic><toplevel>online_resources</toplevel><creatorcontrib>Murase, H.</creatorcontrib><creatorcontrib>Ohshima, I.</creatorcontrib><creatorcontrib>Aoyagi, H.</creatorcontrib><creatorcontrib>Miwa, I.</creatorcontrib><collection>CrossRef</collection><jtitle>IEEE power engineering review</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Murase, H.</au><au>Ohshima, I.</au><au>Aoyagi, H.</au><au>Miwa, I.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Measurement of Transient Voltages Induced by Disconnect Switch Operation</atitle><jtitle>IEEE power engineering review</jtitle><stitle>PER</stitle><date>1985-01</date><risdate>1985</risdate><volume>PER-5</volume><issue>1</issue><spage>41</spage><epage>42</epage><pages>41-42</pages><issn>0272-1724</issn><eissn>1558-1705</eissn><coden>IPERDV</coden><pub>IEEE</pub><doi>10.1109/MPER.1985.5528562</doi><tpages>2</tpages></addata></record> |
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identifier | ISSN: 0272-1724 |
ispartof | IEEE power engineering review, 1985-01, Vol.PER-5 (1), p.41-42 |
issn | 0272-1724 1558-1705 |
language | eng |
recordid | cdi_ieee_primary_5528562 |
source | IEEE Electronic Library (IEL) |
subjects | Circuit testing Electrodes EMTP Geographic Information Systems Light emitting diodes Power measurement Surges Switches Vacuum arcs Voltage |
title | Measurement of Transient Voltages Induced by Disconnect Switch Operation |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-16T09%3A46%3A22IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Measurement%20of%20Transient%20Voltages%20Induced%20by%20Disconnect%20Switch%20Operation&rft.jtitle=IEEE%20power%20engineering%20review&rft.au=Murase,%20H.&rft.date=1985-01&rft.volume=PER-5&rft.issue=1&rft.spage=41&rft.epage=42&rft.pages=41-42&rft.issn=0272-1724&rft.eissn=1558-1705&rft.coden=IPERDV&rft_id=info:doi/10.1109/MPER.1985.5528562&rft_dat=%3Ccrossref_RIE%3E10_1109_MPER_1985_5528562%3C/crossref_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=5528562&rfr_iscdi=true |