Measurement of Transient Voltages Induced by Disconnect Switch Operation

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE power engineering review 1985-01, Vol.PER-5 (1), p.41-42
Hauptverfasser: Murase, H., Ohshima, I., Aoyagi, H., Miwa, I.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 42
container_issue 1
container_start_page 41
container_title IEEE power engineering review
container_volume PER-5
creator Murase, H.
Ohshima, I.
Aoyagi, H.
Miwa, I.
description
doi_str_mv 10.1109/MPER.1985.5528562
format Article
fullrecord <record><control><sourceid>crossref_RIE</sourceid><recordid>TN_cdi_ieee_primary_5528562</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5528562</ieee_id><sourcerecordid>10_1109_MPER_1985_5528562</sourcerecordid><originalsourceid>FETCH-LOGICAL-c180t-d9b5db5642344dc7966084d7f8ef3890d9fa048d6c3e7a448de0d70a365b90b23</originalsourceid><addsrcrecordid>eNo9kMtOwkAUhidGExF9AONmXqB4ZjrXpUEUEghG0W0znTnVGmjJTInh7aUBXZ3_5L8sPkJuGYwYA3u_eJm8jpg1ciQlN1LxMzJgUpqMaZDnZABc84Pm4pJcpfQNAFoZOSDTBbq0i7jBpqNtRVfRNanun4923blPTHTWhJ3HQMs9fayTb5sGfUfffurOf9HlFqPr6ra5JheVWye8Od0heX-arMbTbL58no0f5plnBros2FKGUirBcyGC11YpMCLoymCVGwvBVg6ECcrnqJ04KISgweVKlhZKng8JO-762KYUsSq2sd64uC8YFD2KokdR9CiKE4pD5-7YqRHxP__n_gLsaVsB</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Measurement of Transient Voltages Induced by Disconnect Switch Operation</title><source>IEEE Electronic Library (IEL)</source><creator>Murase, H. ; Ohshima, I. ; Aoyagi, H. ; Miwa, I.</creator><creatorcontrib>Murase, H. ; Ohshima, I. ; Aoyagi, H. ; Miwa, I.</creatorcontrib><identifier>ISSN: 0272-1724</identifier><identifier>EISSN: 1558-1705</identifier><identifier>DOI: 10.1109/MPER.1985.5528562</identifier><identifier>CODEN: IPERDV</identifier><language>eng</language><publisher>IEEE</publisher><subject>Circuit testing ; Electrodes ; EMTP ; Geographic Information Systems ; Light emitting diodes ; Power measurement ; Surges ; Switches ; Vacuum arcs ; Voltage</subject><ispartof>IEEE power engineering review, 1985-01, Vol.PER-5 (1), p.41-42</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c180t-d9b5db5642344dc7966084d7f8ef3890d9fa048d6c3e7a448de0d70a365b90b23</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5528562$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5528562$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Murase, H.</creatorcontrib><creatorcontrib>Ohshima, I.</creatorcontrib><creatorcontrib>Aoyagi, H.</creatorcontrib><creatorcontrib>Miwa, I.</creatorcontrib><title>Measurement of Transient Voltages Induced by Disconnect Switch Operation</title><title>IEEE power engineering review</title><addtitle>PER</addtitle><subject>Circuit testing</subject><subject>Electrodes</subject><subject>EMTP</subject><subject>Geographic Information Systems</subject><subject>Light emitting diodes</subject><subject>Power measurement</subject><subject>Surges</subject><subject>Switches</subject><subject>Vacuum arcs</subject><subject>Voltage</subject><issn>0272-1724</issn><issn>1558-1705</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1985</creationdate><recordtype>article</recordtype><recordid>eNo9kMtOwkAUhidGExF9AONmXqB4ZjrXpUEUEghG0W0znTnVGmjJTInh7aUBXZ3_5L8sPkJuGYwYA3u_eJm8jpg1ciQlN1LxMzJgUpqMaZDnZABc84Pm4pJcpfQNAFoZOSDTBbq0i7jBpqNtRVfRNanun4923blPTHTWhJ3HQMs9fayTb5sGfUfffurOf9HlFqPr6ra5JheVWye8Od0heX-arMbTbL58no0f5plnBros2FKGUirBcyGC11YpMCLoymCVGwvBVg6ECcrnqJ04KISgweVKlhZKng8JO-762KYUsSq2sd64uC8YFD2KokdR9CiKE4pD5-7YqRHxP__n_gLsaVsB</recordid><startdate>198501</startdate><enddate>198501</enddate><creator>Murase, H.</creator><creator>Ohshima, I.</creator><creator>Aoyagi, H.</creator><creator>Miwa, I.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>198501</creationdate><title>Measurement of Transient Voltages Induced by Disconnect Switch Operation</title><author>Murase, H. ; Ohshima, I. ; Aoyagi, H. ; Miwa, I.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c180t-d9b5db5642344dc7966084d7f8ef3890d9fa048d6c3e7a448de0d70a365b90b23</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1985</creationdate><topic>Circuit testing</topic><topic>Electrodes</topic><topic>EMTP</topic><topic>Geographic Information Systems</topic><topic>Light emitting diodes</topic><topic>Power measurement</topic><topic>Surges</topic><topic>Switches</topic><topic>Vacuum arcs</topic><topic>Voltage</topic><toplevel>online_resources</toplevel><creatorcontrib>Murase, H.</creatorcontrib><creatorcontrib>Ohshima, I.</creatorcontrib><creatorcontrib>Aoyagi, H.</creatorcontrib><creatorcontrib>Miwa, I.</creatorcontrib><collection>CrossRef</collection><jtitle>IEEE power engineering review</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Murase, H.</au><au>Ohshima, I.</au><au>Aoyagi, H.</au><au>Miwa, I.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Measurement of Transient Voltages Induced by Disconnect Switch Operation</atitle><jtitle>IEEE power engineering review</jtitle><stitle>PER</stitle><date>1985-01</date><risdate>1985</risdate><volume>PER-5</volume><issue>1</issue><spage>41</spage><epage>42</epage><pages>41-42</pages><issn>0272-1724</issn><eissn>1558-1705</eissn><coden>IPERDV</coden><pub>IEEE</pub><doi>10.1109/MPER.1985.5528562</doi><tpages>2</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0272-1724
ispartof IEEE power engineering review, 1985-01, Vol.PER-5 (1), p.41-42
issn 0272-1724
1558-1705
language eng
recordid cdi_ieee_primary_5528562
source IEEE Electronic Library (IEL)
subjects Circuit testing
Electrodes
EMTP
Geographic Information Systems
Light emitting diodes
Power measurement
Surges
Switches
Vacuum arcs
Voltage
title Measurement of Transient Voltages Induced by Disconnect Switch Operation
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-16T09%3A46%3A22IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Measurement%20of%20Transient%20Voltages%20Induced%20by%20Disconnect%20Switch%20Operation&rft.jtitle=IEEE%20power%20engineering%20review&rft.au=Murase,%20H.&rft.date=1985-01&rft.volume=PER-5&rft.issue=1&rft.spage=41&rft.epage=42&rft.pages=41-42&rft.issn=0272-1724&rft.eissn=1558-1705&rft.coden=IPERDV&rft_id=info:doi/10.1109/MPER.1985.5528562&rft_dat=%3Ccrossref_RIE%3E10_1109_MPER_1985_5528562%3C/crossref_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=5528562&rfr_iscdi=true