Bridging pre-silicon verification and post-silicon validation
Post-silicon validation is a necessary step in a design's verification process. Pre-silicon techniques such as simulation and emulation are limited in scope and volume as compared to what can be achieved on the silicon itself. Some parts of the verification, such as full-system functional verif...
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creator | Nahir, Amir Ziv, Avi Galivanche, Rajesh Hu, Alan Abramovici, Miron Camilleri, Albert Bentley, Bob Foster, Harry Bertacco, Valeria Kapoor, Shakti |
description | Post-silicon validation is a necessary step in a design's verification process. Pre-silicon techniques such as simulation and emulation are limited in scope and volume as compared to what can be achieved on the silicon itself. Some parts of the verification, such as full-system functional verification, cannot be practically covered with current pre-silicon technologies. This panel brings together experts from industry, academia, and EDA to review the differences and similarities between pre- and post-silicon, discuss how the fundamental aspects of verification are affected by these differences, and explore how the gaps between the two worlds can be bridged. |
doi_str_mv | 10.1145/1837274.1837300 |
format | Conference Proceeding |
fullrecord | <record><control><sourceid>acm_6IE</sourceid><recordid>TN_cdi_ieee_primary_5523529</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5523529</ieee_id><sourcerecordid>acm_books_10_1145_1837274_1837300</sourcerecordid><originalsourceid>FETCH-LOGICAL-a247t-bc0e78ae77d5de92e5afa300b40b741e46cf8df12faf4195bd786203d31efd5e3</originalsourceid><addsrcrecordid>eNqNkDtLxEAUhUd0wbCmtrBJaZN455WZFBa6-IIFGwW7YZK5s4xmk5AEwX_vrLsgWFkdDt_H5XIIOadQUCrkFdVcMSWKXXKAI5JWSkcAsQCTx3_6CUlAcZ1TgLcFSbTMSyEqJk5JOk3vUaGUgVQiIde3Y3Cb0G2yYcR8Cm1o-i77xDH40Ng5xGI7lw39NP9S2wb3w87Iwtt2wvSQS_J6f_eyeszXzw9Pq5t1bplQc143gEpbVMpJhxVDab2Nn9YCaiUoirLx2nnKvPWCVrJ2SpcMuOMUvZPIl-RifzcgohnGsLXjl5GSccmqSC_31DZbU_f9x2QomN1u5rCbOewW1eKfqqnHgJ5_A-qHZvc</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Bridging pre-silicon verification and post-silicon validation</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Nahir, Amir ; Ziv, Avi ; Galivanche, Rajesh ; Hu, Alan ; Abramovici, Miron ; Camilleri, Albert ; Bentley, Bob ; Foster, Harry ; Bertacco, Valeria ; Kapoor, Shakti</creator><creatorcontrib>Nahir, Amir ; Ziv, Avi ; Galivanche, Rajesh ; Hu, Alan ; Abramovici, Miron ; Camilleri, Albert ; Bentley, Bob ; Foster, Harry ; Bertacco, Valeria ; Kapoor, Shakti</creatorcontrib><description>Post-silicon validation is a necessary step in a design's verification process. Pre-silicon techniques such as simulation and emulation are limited in scope and volume as compared to what can be achieved on the silicon itself. Some parts of the verification, such as full-system functional verification, cannot be practically covered with current pre-silicon technologies. This panel brings together experts from industry, academia, and EDA to review the differences and similarities between pre- and post-silicon, discuss how the fundamental aspects of verification are affected by these differences, and explore how the gaps between the two worlds can be bridged.</description><identifier>ISSN: 0738-100X</identifier><identifier>ISBN: 9781450300025</identifier><identifier>ISBN: 1450300022</identifier><identifier>ISBN: 9781424466771</identifier><identifier>ISBN: 1424466776</identifier><identifier>EISBN: 9781450300025</identifier><identifier>EISBN: 1450300022</identifier><identifier>DOI: 10.1145/1837274.1837300</identifier><identifier>LCCN: 85-644924</identifier><language>eng</language><publisher>New York, NY, USA: ACM</publisher><subject>Computer bugs ; Controllability ; Costs ; Emulation ; Engines ; Hardware ; Hardware -- Integrated circuits -- Logic circuits ; Observability ; Post-Silicon ; Signal analysis ; Silicon ; Testing ; Validation. Pre-Silicon ; Verification</subject><ispartof>Design Automation Conference, 2010, p.94-95</ispartof><rights>2010 Copyright is held by the author/owner(s).</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5523529$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,796,2056,27923,54756,54918</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5523529$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Nahir, Amir</creatorcontrib><creatorcontrib>Ziv, Avi</creatorcontrib><creatorcontrib>Galivanche, Rajesh</creatorcontrib><creatorcontrib>Hu, Alan</creatorcontrib><creatorcontrib>Abramovici, Miron</creatorcontrib><creatorcontrib>Camilleri, Albert</creatorcontrib><creatorcontrib>Bentley, Bob</creatorcontrib><creatorcontrib>Foster, Harry</creatorcontrib><creatorcontrib>Bertacco, Valeria</creatorcontrib><creatorcontrib>Kapoor, Shakti</creatorcontrib><title>Bridging pre-silicon verification and post-silicon validation</title><title>Design Automation Conference</title><addtitle>DAC</addtitle><description>Post-silicon validation is a necessary step in a design's verification process. Pre-silicon techniques such as simulation and emulation are limited in scope and volume as compared to what can be achieved on the silicon itself. Some parts of the verification, such as full-system functional verification, cannot be practically covered with current pre-silicon technologies. This panel brings together experts from industry, academia, and EDA to review the differences and similarities between pre- and post-silicon, discuss how the fundamental aspects of verification are affected by these differences, and explore how the gaps between the two worlds can be bridged.</description><subject>Computer bugs</subject><subject>Controllability</subject><subject>Costs</subject><subject>Emulation</subject><subject>Engines</subject><subject>Hardware</subject><subject>Hardware -- Integrated circuits -- Logic circuits</subject><subject>Observability</subject><subject>Post-Silicon</subject><subject>Signal analysis</subject><subject>Silicon</subject><subject>Testing</subject><subject>Validation. Pre-Silicon</subject><subject>Verification</subject><issn>0738-100X</issn><isbn>9781450300025</isbn><isbn>1450300022</isbn><isbn>9781424466771</isbn><isbn>1424466776</isbn><isbn>9781450300025</isbn><isbn>1450300022</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2010</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNqNkDtLxEAUhUd0wbCmtrBJaZN455WZFBa6-IIFGwW7YZK5s4xmk5AEwX_vrLsgWFkdDt_H5XIIOadQUCrkFdVcMSWKXXKAI5JWSkcAsQCTx3_6CUlAcZ1TgLcFSbTMSyEqJk5JOk3vUaGUgVQiIde3Y3Cb0G2yYcR8Cm1o-i77xDH40Ng5xGI7lw39NP9S2wb3w87Iwtt2wvSQS_J6f_eyeszXzw9Pq5t1bplQc143gEpbVMpJhxVDab2Nn9YCaiUoirLx2nnKvPWCVrJ2SpcMuOMUvZPIl-RifzcgohnGsLXjl5GSccmqSC_31DZbU_f9x2QomN1u5rCbOewW1eKfqqnHgJ5_A-qHZvc</recordid><startdate>20100613</startdate><enddate>20100613</enddate><creator>Nahir, Amir</creator><creator>Ziv, Avi</creator><creator>Galivanche, Rajesh</creator><creator>Hu, Alan</creator><creator>Abramovici, Miron</creator><creator>Camilleri, Albert</creator><creator>Bentley, Bob</creator><creator>Foster, Harry</creator><creator>Bertacco, Valeria</creator><creator>Kapoor, Shakti</creator><general>ACM</general><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>20100613</creationdate><title>Bridging pre-silicon verification and post-silicon validation</title><author>Nahir, Amir ; Ziv, Avi ; Galivanche, Rajesh ; Hu, Alan ; Abramovici, Miron ; Camilleri, Albert ; Bentley, Bob ; Foster, Harry ; Bertacco, Valeria ; Kapoor, Shakti</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a247t-bc0e78ae77d5de92e5afa300b40b741e46cf8df12faf4195bd786203d31efd5e3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Computer bugs</topic><topic>Controllability</topic><topic>Costs</topic><topic>Emulation</topic><topic>Engines</topic><topic>Hardware</topic><topic>Hardware -- Integrated circuits -- Logic circuits</topic><topic>Observability</topic><topic>Post-Silicon</topic><topic>Signal analysis</topic><topic>Silicon</topic><topic>Testing</topic><topic>Validation. Pre-Silicon</topic><topic>Verification</topic><toplevel>online_resources</toplevel><creatorcontrib>Nahir, Amir</creatorcontrib><creatorcontrib>Ziv, Avi</creatorcontrib><creatorcontrib>Galivanche, Rajesh</creatorcontrib><creatorcontrib>Hu, Alan</creatorcontrib><creatorcontrib>Abramovici, Miron</creatorcontrib><creatorcontrib>Camilleri, Albert</creatorcontrib><creatorcontrib>Bentley, Bob</creatorcontrib><creatorcontrib>Foster, Harry</creatorcontrib><creatorcontrib>Bertacco, Valeria</creatorcontrib><creatorcontrib>Kapoor, Shakti</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Nahir, Amir</au><au>Ziv, Avi</au><au>Galivanche, Rajesh</au><au>Hu, Alan</au><au>Abramovici, Miron</au><au>Camilleri, Albert</au><au>Bentley, Bob</au><au>Foster, Harry</au><au>Bertacco, Valeria</au><au>Kapoor, Shakti</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Bridging pre-silicon verification and post-silicon validation</atitle><btitle>Design Automation Conference</btitle><stitle>DAC</stitle><date>2010-06-13</date><risdate>2010</risdate><spage>94</spage><epage>95</epage><pages>94-95</pages><issn>0738-100X</issn><isbn>9781450300025</isbn><isbn>1450300022</isbn><isbn>9781424466771</isbn><isbn>1424466776</isbn><eisbn>9781450300025</eisbn><eisbn>1450300022</eisbn><abstract>Post-silicon validation is a necessary step in a design's verification process. Pre-silicon techniques such as simulation and emulation are limited in scope and volume as compared to what can be achieved on the silicon itself. Some parts of the verification, such as full-system functional verification, cannot be practically covered with current pre-silicon technologies. This panel brings together experts from industry, academia, and EDA to review the differences and similarities between pre- and post-silicon, discuss how the fundamental aspects of verification are affected by these differences, and explore how the gaps between the two worlds can be bridged.</abstract><cop>New York, NY, USA</cop><pub>ACM</pub><doi>10.1145/1837274.1837300</doi><tpages>2</tpages></addata></record> |
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identifier | ISSN: 0738-100X |
ispartof | Design Automation Conference, 2010, p.94-95 |
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language | eng |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Computer bugs Controllability Costs Emulation Engines Hardware Hardware -- Integrated circuits -- Logic circuits Observability Post-Silicon Signal analysis Silicon Testing Validation. Pre-Silicon Verification |
title | Bridging pre-silicon verification and post-silicon validation |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-09T16%3A18%3A55IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-acm_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Bridging%20pre-silicon%20verification%20and%20post-silicon%20validation&rft.btitle=Design%20Automation%20Conference&rft.au=Nahir,%20Amir&rft.date=2010-06-13&rft.spage=94&rft.epage=95&rft.pages=94-95&rft.issn=0738-100X&rft.isbn=9781450300025&rft.isbn_list=1450300022&rft.isbn_list=9781424466771&rft.isbn_list=1424466776&rft_id=info:doi/10.1145/1837274.1837300&rft_dat=%3Cacm_6IE%3Eacm_books_10_1145_1837274_1837300%3C/acm_6IE%3E%3Curl%3E%3C/url%3E&rft.eisbn=9781450300025&rft.eisbn_list=1450300022&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=5523529&rfr_iscdi=true |