Modeling and metrology of metallic nanowires with application to microwave interconnects

Broadband characterization of individual metallic nanowires for microwave interconnect applications is discussed. Circuit and method of moments (MoM) modeling are benchmarked using a set of coplanar waveguide (CPW) test devices with Au microwire (MW) interconnect and air gaps in the middle of the CP...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Kichul Kim, Wallis, T Mitch, Rice, Paul, Chiang, Chin-Jen, Imtiaz, Atif, Kabos, Pavel, Filipovic, Dejan S
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Benchmark testing Circuit testing Conductivity contact impedance Contact resistance Coplanar waveguides Integrated circuit interconnections Interconnects measurement Metrology Microwave devices modeling Moment methods Nanowires
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!