Active simultaneous harmonic source and load pull assisted by local polyharmonic distortion models
The efficiency of a power amplifier is a strong function of the core transistor technology and the circuitry that is wrapped around it. There are many theoretical approaches to obtaining full DC-to-RF conversion from an ideal transistor, however real-world technologies do not perform equally well wi...
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creator | Leoni, Robert E Harris, Scott A Ries, David G |
description | The efficiency of a power amplifier is a strong function of the core transistor technology and the circuitry that is wrapped around it. There are many theoretical approaches to obtaining full DC-to-RF conversion from an ideal transistor, however real-world technologies do not perform equally well with each. The parasitic reactances and non-ideal DC characteristics of a transistor technology result in matching and bias requirements that can deviate significantly from those of ideal theory. In this paper we describe the use of an active simultaneous source and load pull system that quickly ascertains the conditions required to achieve a transistor technology's peak efficiency performance. The speed with which the system is able to achieve these results is facilitated by local polyharmonic distortion models that provide a quick and reliable method for finding the path of steepest ascent. |
doi_str_mv | 10.1109/MWSYM.2010.5515961 |
format | Conference Proceeding |
fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_5515961</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5515961</ieee_id><sourcerecordid>5515961</sourcerecordid><originalsourceid>FETCH-LOGICAL-i175t-546eda8d0674e255bee32cfc253e664feaf592984dbff6c1d85b896ebacc19143</originalsourceid><addsrcrecordid>eNpFUM1OwzAYC38SY-wF4JIX6EjSfGlznCb-pE0cAAGnKU2-iqC0qZoWaW9PJSbwxbIt-2BCrjhbcs70zfbt-WO7FGzSABy04kfkgkshpWJQ8mMyE1CorBBcnfwHCk7JjHGpMyXh_ZwsUvpiEyQIKPWMVCs7-G-kyTdjGEyLcUz00_RNbL2lKY69RWpaR0M0jnZjCNSk5NOAjlb7ybUm0C6G_V_HTWHsBx9b2kSHIV2Ss9qEhIsDz8nr3e3L-iHbPN0_rlebzPMChgykQmdKx1QhUQBUiLmwtRWQo1KyRlODFrqUrqprZbkroSq1wspYyzWX-Zxc_-56RNx1vW9Mv98dvsp_ANAyXIo</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Active simultaneous harmonic source and load pull assisted by local polyharmonic distortion models</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Leoni, Robert E ; Harris, Scott A ; Ries, David G</creator><creatorcontrib>Leoni, Robert E ; Harris, Scott A ; Ries, David G</creatorcontrib><description>The efficiency of a power amplifier is a strong function of the core transistor technology and the circuitry that is wrapped around it. There are many theoretical approaches to obtaining full DC-to-RF conversion from an ideal transistor, however real-world technologies do not perform equally well with each. The parasitic reactances and non-ideal DC characteristics of a transistor technology result in matching and bias requirements that can deviate significantly from those of ideal theory. In this paper we describe the use of an active simultaneous source and load pull system that quickly ascertains the conditions required to achieve a transistor technology's peak efficiency performance. The speed with which the system is able to achieve these results is facilitated by local polyharmonic distortion models that provide a quick and reliable method for finding the path of steepest ascent.</description><identifier>ISSN: 0149-645X</identifier><identifier>ISBN: 1424460565</identifier><identifier>ISBN: 9781424460564</identifier><identifier>EISSN: 2576-7216</identifier><identifier>EISBN: 1424460581</identifier><identifier>EISBN: 1424477328</identifier><identifier>EISBN: 9781424460588</identifier><identifier>EISBN: 9781424477326</identifier><identifier>EISBN: 9781424460571</identifier><identifier>EISBN: 1424460573</identifier><identifier>DOI: 10.1109/MWSYM.2010.5515961</identifier><language>eng</language><publisher>IEEE</publisher><subject>Behavioral modeling ; Distortion measurement ; Harmonic distortion ; high efficiency power amplifiers ; Impedance ; large-signal measurement ; nonlinear systems ; Particle measurements ; Phase measurement ; polyharmonic distortion models ; Power amplifiers ; Power measurement ; Power system harmonics ; Power system modeling ; transistor characterization ; Voltage</subject><ispartof>2010 IEEE MTT-S International Microwave Symposium, 2010, p.1166-1169</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5515961$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2056,27923,54918</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5515961$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Leoni, Robert E</creatorcontrib><creatorcontrib>Harris, Scott A</creatorcontrib><creatorcontrib>Ries, David G</creatorcontrib><title>Active simultaneous harmonic source and load pull assisted by local polyharmonic distortion models</title><title>2010 IEEE MTT-S International Microwave Symposium</title><addtitle>MWSYM</addtitle><description>The efficiency of a power amplifier is a strong function of the core transistor technology and the circuitry that is wrapped around it. There are many theoretical approaches to obtaining full DC-to-RF conversion from an ideal transistor, however real-world technologies do not perform equally well with each. The parasitic reactances and non-ideal DC characteristics of a transistor technology result in matching and bias requirements that can deviate significantly from those of ideal theory. In this paper we describe the use of an active simultaneous source and load pull system that quickly ascertains the conditions required to achieve a transistor technology's peak efficiency performance. The speed with which the system is able to achieve these results is facilitated by local polyharmonic distortion models that provide a quick and reliable method for finding the path of steepest ascent.</description><subject>Behavioral modeling</subject><subject>Distortion measurement</subject><subject>Harmonic distortion</subject><subject>high efficiency power amplifiers</subject><subject>Impedance</subject><subject>large-signal measurement</subject><subject>nonlinear systems</subject><subject>Particle measurements</subject><subject>Phase measurement</subject><subject>polyharmonic distortion models</subject><subject>Power amplifiers</subject><subject>Power measurement</subject><subject>Power system harmonics</subject><subject>Power system modeling</subject><subject>transistor characterization</subject><subject>Voltage</subject><issn>0149-645X</issn><issn>2576-7216</issn><isbn>1424460565</isbn><isbn>9781424460564</isbn><isbn>1424460581</isbn><isbn>1424477328</isbn><isbn>9781424460588</isbn><isbn>9781424477326</isbn><isbn>9781424460571</isbn><isbn>1424460573</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2010</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpFUM1OwzAYC38SY-wF4JIX6EjSfGlznCb-pE0cAAGnKU2-iqC0qZoWaW9PJSbwxbIt-2BCrjhbcs70zfbt-WO7FGzSABy04kfkgkshpWJQ8mMyE1CorBBcnfwHCk7JjHGpMyXh_ZwsUvpiEyQIKPWMVCs7-G-kyTdjGEyLcUz00_RNbL2lKY69RWpaR0M0jnZjCNSk5NOAjlb7ybUm0C6G_V_HTWHsBx9b2kSHIV2Ss9qEhIsDz8nr3e3L-iHbPN0_rlebzPMChgykQmdKx1QhUQBUiLmwtRWQo1KyRlODFrqUrqprZbkroSq1wspYyzWX-Zxc_-56RNx1vW9Mv98dvsp_ANAyXIo</recordid><startdate>201005</startdate><enddate>201005</enddate><creator>Leoni, Robert E</creator><creator>Harris, Scott A</creator><creator>Ries, David G</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>201005</creationdate><title>Active simultaneous harmonic source and load pull assisted by local polyharmonic distortion models</title><author>Leoni, Robert E ; Harris, Scott A ; Ries, David G</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-546eda8d0674e255bee32cfc253e664feaf592984dbff6c1d85b896ebacc19143</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Behavioral modeling</topic><topic>Distortion measurement</topic><topic>Harmonic distortion</topic><topic>high efficiency power amplifiers</topic><topic>Impedance</topic><topic>large-signal measurement</topic><topic>nonlinear systems</topic><topic>Particle measurements</topic><topic>Phase measurement</topic><topic>polyharmonic distortion models</topic><topic>Power amplifiers</topic><topic>Power measurement</topic><topic>Power system harmonics</topic><topic>Power system modeling</topic><topic>transistor characterization</topic><topic>Voltage</topic><toplevel>online_resources</toplevel><creatorcontrib>Leoni, Robert E</creatorcontrib><creatorcontrib>Harris, Scott A</creatorcontrib><creatorcontrib>Ries, David G</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Leoni, Robert E</au><au>Harris, Scott A</au><au>Ries, David G</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Active simultaneous harmonic source and load pull assisted by local polyharmonic distortion models</atitle><btitle>2010 IEEE MTT-S International Microwave Symposium</btitle><stitle>MWSYM</stitle><date>2010-05</date><risdate>2010</risdate><spage>1166</spage><epage>1169</epage><pages>1166-1169</pages><issn>0149-645X</issn><eissn>2576-7216</eissn><isbn>1424460565</isbn><isbn>9781424460564</isbn><eisbn>1424460581</eisbn><eisbn>1424477328</eisbn><eisbn>9781424460588</eisbn><eisbn>9781424477326</eisbn><eisbn>9781424460571</eisbn><eisbn>1424460573</eisbn><abstract>The efficiency of a power amplifier is a strong function of the core transistor technology and the circuitry that is wrapped around it. There are many theoretical approaches to obtaining full DC-to-RF conversion from an ideal transistor, however real-world technologies do not perform equally well with each. The parasitic reactances and non-ideal DC characteristics of a transistor technology result in matching and bias requirements that can deviate significantly from those of ideal theory. In this paper we describe the use of an active simultaneous source and load pull system that quickly ascertains the conditions required to achieve a transistor technology's peak efficiency performance. The speed with which the system is able to achieve these results is facilitated by local polyharmonic distortion models that provide a quick and reliable method for finding the path of steepest ascent.</abstract><pub>IEEE</pub><doi>10.1109/MWSYM.2010.5515961</doi><tpages>4</tpages></addata></record> |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Behavioral modeling Distortion measurement Harmonic distortion high efficiency power amplifiers Impedance large-signal measurement nonlinear systems Particle measurements Phase measurement polyharmonic distortion models Power amplifiers Power measurement Power system harmonics Power system modeling transistor characterization Voltage |
title | Active simultaneous harmonic source and load pull assisted by local polyharmonic distortion models |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-13T20%3A59%3A28IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Active%20simultaneous%20harmonic%20source%20and%20load%20pull%20assisted%20by%20local%20polyharmonic%20distortion%20models&rft.btitle=2010%20IEEE%20MTT-S%20International%20Microwave%20Symposium&rft.au=Leoni,%20Robert%20E&rft.date=2010-05&rft.spage=1166&rft.epage=1169&rft.pages=1166-1169&rft.issn=0149-645X&rft.eissn=2576-7216&rft.isbn=1424460565&rft.isbn_list=9781424460564&rft_id=info:doi/10.1109/MWSYM.2010.5515961&rft_dat=%3Cieee_6IE%3E5515961%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&rft.eisbn=1424460581&rft.eisbn_list=1424477328&rft.eisbn_list=9781424460588&rft.eisbn_list=9781424477326&rft.eisbn_list=9781424460571&rft.eisbn_list=1424460573&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=5515961&rfr_iscdi=true |