Switching Surge Test Circuits for High Voltage Shunt Reactors and Power Transformers

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Veröffentlicht in:	IEEE power engineering review 1981-06, Vol.PER-1 (6), p.66-67
1. Verfasser:	Train, D.
Format:	Artikel
Sprache:	eng
Schlagworte:	Circuit faults Circuit testing Inductance Surge protection Switching circuits Voltage measurement
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container_end_page	67
container_issue	6
container_start_page	66
container_title	IEEE power engineering review
container_volume	PER-1
creator	Train, D.
description
doi_str_mv	10.1109/MPER.1981.5511627
format	Article
fullrecord	<record><control><sourceid>crossref_RIE</sourceid><recordid>TN_cdi_ieee_primary_5511627</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5511627</ieee_id><sourcerecordid>10_1109_MPER_1981_5511627</sourcerecordid><originalsourceid>FETCH-LOGICAL-c1107-8731f9495f6ea20b142954c00257268dde34085f20d7fc9fea33c1cf42c7c0893</originalsourceid><addsrcrecordid>eNo9kFFLwzAUhYMoOKc_QHzJH-i8N22a5FHGdMLEsVVfS0yTLrK1knQM__1aNn06F845l8NHyD3CBBHU49tytpqgkjjhHDFn4oKMkHOZoAB-SUbABOtvll2Tmxi_AUDkko9IsT74zmx8U9P1PtSWFjZ2dOqD2fsuUtcGOvf1hn6220739nqzbzq6stp0bYhUNxVdtgcbaBF0E_v4zoZ4S66c3kZ7d9Yx-XieFdN5snh_eZ0-LRLTbxaJFCk6lSnucqsZfGHGFM8MAOOC5bKqbJqB5I5BJZxRzuo0NWhcxowwIFU6Jnj6a0IbY7Cu_Al-p8NviVAOWMoBSzlgKc9Y-s7DqeOttf_5P_cITJheVA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Switching Surge Test Circuits for High Voltage Shunt Reactors and Power Transformers</title><source>IEEE Xplore</source><creator>Train, D.</creator><creatorcontrib>Train, D.</creatorcontrib><identifier>ISSN: 0272-1724</identifier><identifier>EISSN: 1558-1705</identifier><identifier>DOI: 10.1109/MPER.1981.5511627</identifier><identifier>CODEN: IPERDV</identifier><language>eng</language><publisher>IEEE</publisher><subject>Circuit faults ; Circuit testing ; Inductance ; Surge protection ; Switching circuits ; Voltage measurement</subject><ispartof>IEEE power engineering review, 1981-06, Vol.PER-1 (6), p.66-67</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c1107-8731f9495f6ea20b142954c00257268dde34085f20d7fc9fea33c1cf42c7c0893</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5511627$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27903,27904,54736</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5511627$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Train, D.</creatorcontrib><title>Switching Surge Test Circuits for High Voltage Shunt Reactors and Power Transformers</title><title>IEEE power engineering review</title><addtitle>PER</addtitle><subject>Circuit faults</subject><subject>Circuit testing</subject><subject>Inductance</subject><subject>Surge protection</subject><subject>Switching circuits</subject><subject>Voltage measurement</subject><issn>0272-1724</issn><issn>1558-1705</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1981</creationdate><recordtype>article</recordtype><recordid>eNo9kFFLwzAUhYMoOKc_QHzJH-i8N22a5FHGdMLEsVVfS0yTLrK1knQM__1aNn06F845l8NHyD3CBBHU49tytpqgkjjhHDFn4oKMkHOZoAB-SUbABOtvll2Tmxi_AUDkko9IsT74zmx8U9P1PtSWFjZ2dOqD2fsuUtcGOvf1hn6220739nqzbzq6stp0bYhUNxVdtgcbaBF0E_v4zoZ4S66c3kZ7d9Yx-XieFdN5snh_eZ0-LRLTbxaJFCk6lSnucqsZfGHGFM8MAOOC5bKqbJqB5I5BJZxRzuo0NWhcxowwIFU6Jnj6a0IbY7Cu_Al-p8NviVAOWMoBSzlgKc9Y-s7DqeOttf_5P_cITJheVA</recordid><startdate>198106</startdate><enddate>198106</enddate><creator>Train, D.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>198106</creationdate><title>Switching Surge Test Circuits for High Voltage Shunt Reactors and Power Transformers</title><author>Train, D.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1107-8731f9495f6ea20b142954c00257268dde34085f20d7fc9fea33c1cf42c7c0893</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1981</creationdate><topic>Circuit faults</topic><topic>Circuit testing</topic><topic>Inductance</topic><topic>Surge protection</topic><topic>Switching circuits</topic><topic>Voltage measurement</topic><toplevel>online_resources</toplevel><creatorcontrib>Train, D.</creatorcontrib><collection>CrossRef</collection><jtitle>IEEE power engineering review</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Train, D.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Switching Surge Test Circuits for High Voltage Shunt Reactors and Power Transformers</atitle><jtitle>IEEE power engineering review</jtitle><stitle>PER</stitle><date>1981-06</date><risdate>1981</risdate><volume>PER-1</volume><issue>6</issue><spage>66</spage><epage>67</epage><pages>66-67</pages><issn>0272-1724</issn><eissn>1558-1705</eissn><coden>IPERDV</coden><pub>IEEE</pub><doi>10.1109/MPER.1981.5511627</doi><tpages>2</tpages></addata></record>
fulltext	fulltext_linktorsrc
identifier	ISSN: 0272-1724
ispartof	IEEE power engineering review, 1981-06, Vol.PER-1 (6), p.66-67
issn	0272-1724 1558-1705
language	eng
recordid	cdi_ieee_primary_5511627
source	IEEE Xplore
subjects	Circuit faults Circuit testing Inductance Surge protection Switching circuits Voltage measurement
title	Switching Surge Test Circuits for High Voltage Shunt Reactors and Power Transformers
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-24T18%3A04%3A01IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Switching%20Surge%20Test%20Circuits%20for%20High%20Voltage%20Shunt%20Reactors%20and%20Power%20Transformers&rft.jtitle=IEEE%20power%20engineering%20review&rft.au=Train,%20D.&rft.date=1981-06&rft.volume=PER-1&rft.issue=6&rft.spage=66&rft.epage=67&rft.pages=66-67&rft.issn=0272-1724&rft.eissn=1558-1705&rft.coden=IPERDV&rft_id=info:doi/10.1109/MPER.1981.5511627&rft_dat=%3Ccrossref_RIE%3E10_1109_MPER_1981_5511627%3C/crossref_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=5511627&rfr_iscdi=true