Optimized digital compatible pulse sequences for testing of RF front end modules

Due to the escalating costs associated with testing of precision RF components, there is a pressing need for identifying novel test methods that allow RF circuits to be tested with low cost test instrumentation. Specifically, test costs can be lowered significantly if stimulus from a digital pattern...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Banerjee, Aritra, Kumar Devarakond, Shyam, Natarajan, Vishwanath, Sen, Shreyas, Chatterjee, Abhijit
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Circuit testing Costs Instruments Pressing Pulse circuits Pulse generation Radio frequency Radiofrequency identification RF signals Test pattern generators
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